用自旋极化扫描电子显微镜观察硬盘磁头的磁性

IF 1.8 4区工程技术

Microscopy Pub Date : 2021-10-01 DOI:10.1093/jmicro/dfab011

Teruo Kohashi;Kumi Motai;Hideo Matsuyama;Yohji Maruyama

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引用次数: 0

摘要

通过检测硬盘驱动器（HDD）写入头在操作过程中的磁化变化，已经证明了使用自旋极化扫描电子显微镜（spin-SEM）的操作观察。为在自旋SEM的样品阶段中使用而开发的电流施加系统使得能够在写入头被激活时对HDD的写入头中的磁化变化进行成像。聚焦离子束（FIB）技术用于制造头端子和样品支架电极之间的电接触。钨膜通过FIB技术沉积在写入头周围的绝缘体上，以防止在SEM测量过程中绝缘体中积聚静电荷。该系统非常适合于研究处于激活状态的HDD中的写入头的特性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Operando observation of magnetism in HDD writing heads by spin-polarized scanning electron microscopy

Operando observation using spin-polarized scanning electron microscopy (spin SEM) has been demonstrated by detecting changes in the magnetization in the writing head of a hard disk drive (HDD) during operation. A current-applying system developed for use in the sample stage of a spin SEM enables imaging of the magnetization changes in the writing head of an HDD while the writing head is activated. Focused ion beam (FIB) technology is used to fabricate electric contacts between the head terminals and the sample holder electrodes. Tungsten film is deposited by FIB technology on the insulator around the writing head to prevent electrostatic charge buildup in the insulators during SEM measurement. This system is well suited for studying the characteristics of writing heads in HDDs in an activated state.

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来源期刊

Microscopy 工程技术-显微镜技术

自引率

11.10%

发文量

审稿时长

>12 weeks

期刊介绍： Microscopy, previously Journal of Electron Microscopy, promotes research combined with any type of microscopy techniques, applied in life and material sciences. Microscopy is the official journal of the Japanese Society of Microscopy.