基于单双极性铁电Memcapacitor的高密度高精度距离函数计算时域内容可寻址存储器

IF 5.3 2区 材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY
Minjeong Ryu, Jae Seung Woo, Yeonwoo Kim, Joo Hyeon Jeon, Sung In Cho, Woo Young Choi
{"title":"基于单双极性铁电Memcapacitor的高密度高精度距离函数计算时域内容可寻址存储器","authors":"Minjeong Ryu, Jae Seung Woo, Yeonwoo Kim, Joo Hyeon Jeon, Sung In Cho, Woo Young Choi","doi":"10.1002/aelm.202500421","DOIUrl":null,"url":null,"abstract":"Single ambipolar ferroelectric memcapacitor-based time-domain (TD) content-addressable memory (CAM) is proposed and experimentally demonstrated. The proposed TD CAM design effectively resolves the critical challenges of limited integration density and computational reliability in conventional ferroelectric memcapacitor-based capacitive CAMs. The band-reject-filter-shaped and symmetric capacitance-voltage characteristics with high dynamic range of a gated p-i-n diode-structured ferroelectric memcapacitor are leveraged. This CAM performs dual-edge search operations, where the Hamming distance (HD) between entry and query vectors is computed based on the modulation of the variable capacitance of cells. The propagation delay of the TD CAM output signal is linearly correlated with the computed HD, enabling improved search accuracy and sensing margin. The error-free classification of previously unseen classes in a five-way one-shot learning task indicates the feasibility of the proposed TD CAM as an associative memory within memory-augmented neural networks toward real-world implementations. Moreover, modeling results confirm that the proposed operation scheme maintains robustness against process variations and interconnect parasitics in massive arrays of highly scaled devices. Overall, the proposed TD CAM array offers exceptional compactness, linearity, and in-memory search reliability, considerably outperforming the conventional ferroelectric CAMs for HD computation.","PeriodicalId":110,"journal":{"name":"Advanced Electronic Materials","volume":"26 1","pages":""},"PeriodicalIF":5.3000,"publicationDate":"2025-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Time-Domain Content-Addressable Memory Based on Single Ambipolar Ferroelectric Memcapacitor for High-Density and Highly-Precise Distance Function Computation\",\"authors\":\"Minjeong Ryu, Jae Seung Woo, Yeonwoo Kim, Joo Hyeon Jeon, Sung In Cho, Woo Young Choi\",\"doi\":\"10.1002/aelm.202500421\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Single ambipolar ferroelectric memcapacitor-based time-domain (TD) content-addressable memory (CAM) is proposed and experimentally demonstrated. The proposed TD CAM design effectively resolves the critical challenges of limited integration density and computational reliability in conventional ferroelectric memcapacitor-based capacitive CAMs. The band-reject-filter-shaped and symmetric capacitance-voltage characteristics with high dynamic range of a gated p-i-n diode-structured ferroelectric memcapacitor are leveraged. This CAM performs dual-edge search operations, where the Hamming distance (HD) between entry and query vectors is computed based on the modulation of the variable capacitance of cells. The propagation delay of the TD CAM output signal is linearly correlated with the computed HD, enabling improved search accuracy and sensing margin. The error-free classification of previously unseen classes in a five-way one-shot learning task indicates the feasibility of the proposed TD CAM as an associative memory within memory-augmented neural networks toward real-world implementations. Moreover, modeling results confirm that the proposed operation scheme maintains robustness against process variations and interconnect parasitics in massive arrays of highly scaled devices. Overall, the proposed TD CAM array offers exceptional compactness, linearity, and in-memory search reliability, considerably outperforming the conventional ferroelectric CAMs for HD computation.\",\"PeriodicalId\":110,\"journal\":{\"name\":\"Advanced Electronic Materials\",\"volume\":\"26 1\",\"pages\":\"\"},\"PeriodicalIF\":5.3000,\"publicationDate\":\"2025-10-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Advanced Electronic Materials\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://doi.org/10.1002/aelm.202500421\",\"RegionNum\":2,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Electronic Materials","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1002/aelm.202500421","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0

摘要

提出了一种基于双极性铁电记忆电容的时域内容可寻址存储器(CAM),并进行了实验验证。提出的TD CAM设计有效地解决了传统基于铁电记忆电容的电容CAM的集成密度和计算可靠性有限的关键挑战。利用了门控p-i-n二极管结构铁电memcapacitor的带阻滤波器形状和高动态范围的对称电容电压特性。该CAM执行双边搜索操作,其中输入向量和查询向量之间的汉明距离(HD)是基于单元可变电容的调制计算的。TD CAM输出信号的传播延迟与计算的HD呈线性相关,从而提高了搜索精度和感知裕度。在五向一次性学习任务中对先前未见过的类进行无错误分类表明,所提出的TD CAM作为记忆增强神经网络中的联想记忆在现实世界实现的可行性。此外,建模结果证实了所提出的操作方案在高规模设备的大规模阵列中保持对工艺变化和互连寄生的鲁棒性。总体而言,所提出的TD CAM阵列具有出色的紧凑性、线性性和内存搜索可靠性,在高清计算方面大大优于传统的铁电CAM。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Time-Domain Content-Addressable Memory Based on Single Ambipolar Ferroelectric Memcapacitor for High-Density and Highly-Precise Distance Function Computation

Time-Domain Content-Addressable Memory Based on Single Ambipolar Ferroelectric Memcapacitor for High-Density and Highly-Precise Distance Function Computation
Single ambipolar ferroelectric memcapacitor-based time-domain (TD) content-addressable memory (CAM) is proposed and experimentally demonstrated. The proposed TD CAM design effectively resolves the critical challenges of limited integration density and computational reliability in conventional ferroelectric memcapacitor-based capacitive CAMs. The band-reject-filter-shaped and symmetric capacitance-voltage characteristics with high dynamic range of a gated p-i-n diode-structured ferroelectric memcapacitor are leveraged. This CAM performs dual-edge search operations, where the Hamming distance (HD) between entry and query vectors is computed based on the modulation of the variable capacitance of cells. The propagation delay of the TD CAM output signal is linearly correlated with the computed HD, enabling improved search accuracy and sensing margin. The error-free classification of previously unseen classes in a five-way one-shot learning task indicates the feasibility of the proposed TD CAM as an associative memory within memory-augmented neural networks toward real-world implementations. Moreover, modeling results confirm that the proposed operation scheme maintains robustness against process variations and interconnect parasitics in massive arrays of highly scaled devices. Overall, the proposed TD CAM array offers exceptional compactness, linearity, and in-memory search reliability, considerably outperforming the conventional ferroelectric CAMs for HD computation.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Advanced Electronic Materials
Advanced Electronic Materials NANOSCIENCE & NANOTECHNOLOGYMATERIALS SCIE-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
11.00
自引率
3.20%
发文量
433
期刊介绍: Advanced Electronic Materials is an interdisciplinary forum for peer-reviewed, high-quality, high-impact research in the fields of materials science, physics, and engineering of electronic and magnetic materials. It includes research on physics and physical properties of electronic and magnetic materials, spintronics, electronics, device physics and engineering, micro- and nano-electromechanical systems, and organic electronics, in addition to fundamental research.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信