M.H. Rajabi Manshadi , A.M. Mozafarbeigi , S. Gholizadeh , Z. Shadrokh , Y. Abdi
{"title":"p-i-n钙钛矿太阳能电池双钝化的超薄金属有机骨架夹层策略","authors":"M.H. Rajabi Manshadi , A.M. Mozafarbeigi , S. Gholizadeh , Z. Shadrokh , Y. Abdi","doi":"10.1016/j.mssp.2025.110106","DOIUrl":null,"url":null,"abstract":"<div><div>This study explores the effects of both the concentration and structural integration of ultrathin metal–organic framework (MOF) layers that sandwich the perovskite active layer in inverted (p–i–n) perovskite solar cells (PSCs), employing NiO as the hole transport layer (HTL). The introduction of dual MOF interlayers significantly enhances the crystallinity, grain size, and environmental stability of the perovskite film. Devices with the dual-MOF configuration (NiO/MOF/Perovskite/MOF/PCBM/Ag) demonstrated a notable increase in power conversion efficiency (PCE), from 12.06 % (reference: NiO/Perovskite/PCBM/Ag) to 16.11 %. This ∼34 % absolute enhancement is primarily attributed to improved short-circuit current density (Jsc), which increased from 20.06 to 22.44 mA/cm<sup>2</sup>, owing to optimized light harvesting and superior film morphology. Electrochemical impedance spectroscopy (EIS) verified the decrease in charge transfer resistance and improved carrier transport in the dual-MOF devices, with values of 368.33 Ω for the reference device and 206.84 Ω for the dual-MOF device. In addition, dual-MOF devices maintained over 96 % of their initial power conversion efficiency (PCE) after a 30-day period in ambient conditions (25 °C, 45 ± 5 % relative humidity), which is in stark contrast to the significant degradation that was seen in the reference devices. These findings underscore the potential of MOF–perovskite heterostructures for achieving stable, high-performance PSCs.</div></div>","PeriodicalId":18240,"journal":{"name":"Materials Science in Semiconductor Processing","volume":"202 ","pages":"Article 110106"},"PeriodicalIF":4.6000,"publicationDate":"2025-10-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Ultrathin metal-organic framework sandwiching strategy for dual-passivation in p-i-n perovskite solar cells\",\"authors\":\"M.H. Rajabi Manshadi , A.M. Mozafarbeigi , S. Gholizadeh , Z. Shadrokh , Y. Abdi\",\"doi\":\"10.1016/j.mssp.2025.110106\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>This study explores the effects of both the concentration and structural integration of ultrathin metal–organic framework (MOF) layers that sandwich the perovskite active layer in inverted (p–i–n) perovskite solar cells (PSCs), employing NiO as the hole transport layer (HTL). The introduction of dual MOF interlayers significantly enhances the crystallinity, grain size, and environmental stability of the perovskite film. Devices with the dual-MOF configuration (NiO/MOF/Perovskite/MOF/PCBM/Ag) demonstrated a notable increase in power conversion efficiency (PCE), from 12.06 % (reference: NiO/Perovskite/PCBM/Ag) to 16.11 %. This ∼34 % absolute enhancement is primarily attributed to improved short-circuit current density (Jsc), which increased from 20.06 to 22.44 mA/cm<sup>2</sup>, owing to optimized light harvesting and superior film morphology. Electrochemical impedance spectroscopy (EIS) verified the decrease in charge transfer resistance and improved carrier transport in the dual-MOF devices, with values of 368.33 Ω for the reference device and 206.84 Ω for the dual-MOF device. In addition, dual-MOF devices maintained over 96 % of their initial power conversion efficiency (PCE) after a 30-day period in ambient conditions (25 °C, 45 ± 5 % relative humidity), which is in stark contrast to the significant degradation that was seen in the reference devices. These findings underscore the potential of MOF–perovskite heterostructures for achieving stable, high-performance PSCs.</div></div>\",\"PeriodicalId\":18240,\"journal\":{\"name\":\"Materials Science in Semiconductor Processing\",\"volume\":\"202 \",\"pages\":\"Article 110106\"},\"PeriodicalIF\":4.6000,\"publicationDate\":\"2025-10-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Materials Science in Semiconductor Processing\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S1369800125008443\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Materials Science in Semiconductor Processing","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1369800125008443","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Ultrathin metal-organic framework sandwiching strategy for dual-passivation in p-i-n perovskite solar cells
This study explores the effects of both the concentration and structural integration of ultrathin metal–organic framework (MOF) layers that sandwich the perovskite active layer in inverted (p–i–n) perovskite solar cells (PSCs), employing NiO as the hole transport layer (HTL). The introduction of dual MOF interlayers significantly enhances the crystallinity, grain size, and environmental stability of the perovskite film. Devices with the dual-MOF configuration (NiO/MOF/Perovskite/MOF/PCBM/Ag) demonstrated a notable increase in power conversion efficiency (PCE), from 12.06 % (reference: NiO/Perovskite/PCBM/Ag) to 16.11 %. This ∼34 % absolute enhancement is primarily attributed to improved short-circuit current density (Jsc), which increased from 20.06 to 22.44 mA/cm2, owing to optimized light harvesting and superior film morphology. Electrochemical impedance spectroscopy (EIS) verified the decrease in charge transfer resistance and improved carrier transport in the dual-MOF devices, with values of 368.33 Ω for the reference device and 206.84 Ω for the dual-MOF device. In addition, dual-MOF devices maintained over 96 % of their initial power conversion efficiency (PCE) after a 30-day period in ambient conditions (25 °C, 45 ± 5 % relative humidity), which is in stark contrast to the significant degradation that was seen in the reference devices. These findings underscore the potential of MOF–perovskite heterostructures for achieving stable, high-performance PSCs.
期刊介绍:
Materials Science in Semiconductor Processing provides a unique forum for the discussion of novel processing, applications and theoretical studies of functional materials and devices for (opto)electronics, sensors, detectors, biotechnology and green energy.
Each issue will aim to provide a snapshot of current insights, new achievements, breakthroughs and future trends in such diverse fields as microelectronics, energy conversion and storage, communications, biotechnology, (photo)catalysis, nano- and thin-film technology, hybrid and composite materials, chemical processing, vapor-phase deposition, device fabrication, and modelling, which are the backbone of advanced semiconductor processing and applications.
Coverage will include: advanced lithography for submicron devices; etching and related topics; ion implantation; damage evolution and related issues; plasma and thermal CVD; rapid thermal processing; advanced metallization and interconnect schemes; thin dielectric layers, oxidation; sol-gel processing; chemical bath and (electro)chemical deposition; compound semiconductor processing; new non-oxide materials and their applications; (macro)molecular and hybrid materials; molecular dynamics, ab-initio methods, Monte Carlo, etc.; new materials and processes for discrete and integrated circuits; magnetic materials and spintronics; heterostructures and quantum devices; engineering of the electrical and optical properties of semiconductors; crystal growth mechanisms; reliability, defect density, intrinsic impurities and defects.