Abdul Khalique , Gianluigi De Falco , Patrizia Minutolo , Mario Commodo , Andrea D'Anna
{"title":"气溶胶火焰合成碳- tio2纳米复合膜的电容耦合非挤压型I-V和II型记忆电阻行为","authors":"Abdul Khalique , Gianluigi De Falco , Patrizia Minutolo , Mario Commodo , Andrea D'Anna","doi":"10.1016/j.mssp.2025.110125","DOIUrl":null,"url":null,"abstract":"<div><div>Titanium dioxide (TiO<sub>2</sub>) is a long-established semiconductor material used in several electrical and electronical applications, including random-access memories, biohybrid interfaces, sensors, and neuromorphic computing. Nevertheless, such applications are still at an early development stage, constrained by fundamental gaps in understanding and technological limitations. Functional memristive characteristics of TiO<sub>2</sub> rely extensively on the processes, including synthesis techniques, fabrication, and physicochemical modifications. In this work, nanostructured composite films of Carbon (Soot) and TiO<sub>2</sub> are fabricated through a custom-made aerosol flame synthesis (AFS) reactor using a facile one-step synthesis technique with good control over nanostructure, crystallinity, defect chemistry and carbon component inclusions. Scanning mobility particle sizer (SMPS) was employed to analyze particle size distribution in the flame. Microstructures and composition of the C-TiO<sub>2</sub> film were characterized through Raman spectroscopy, UV–VIS spectrophotometry, atomic force microscopy (AFM), and current-voltage I-V measurements. The presence of carbon and TiO<sub>2</sub> across the film was confirmed by the Raman spectrum and quantified by light absorption. The electrical characterization demonstrated a capacitive-coupled non-zero crossing and type-II hysteresis behavior of the C-TiO<sub>2</sub> nanostructured film. Following carbon compositing, TiO<sub>2</sub> exhibited enhanced optical absorption in the visible spectral region and electrical conductivity. The improvement in the conduction pathways was evidenced by the I-V measurements of the TiO<sub>2</sub> film and the C-TiO<sub>2</sub> film. A phenomenon of disappearance and reappearance of the capacitive-coupled memresistive effect was observed after dark and sunlight exposure, most likely due to the photosensitive nature of TiO<sub>2</sub> in the nanocomposite film. This proof-of-concept study testifies that, due to such properties, C-TiO<sub>2</sub> nanocomposite films produced via AFS can be considered as promising future candidates for applications in the field of next-generation electronic devices.</div></div>","PeriodicalId":18240,"journal":{"name":"Materials Science in Semiconductor Processing","volume":"202 ","pages":"Article 110125"},"PeriodicalIF":4.6000,"publicationDate":"2025-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Capacitive-coupled non-pinched I–V and type II memristive behavior of carbon-TiO2 nanocomposite films fabricated through aerosol flame synthesis\",\"authors\":\"Abdul Khalique , Gianluigi De Falco , Patrizia Minutolo , Mario Commodo , Andrea D'Anna\",\"doi\":\"10.1016/j.mssp.2025.110125\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Titanium dioxide (TiO<sub>2</sub>) is a long-established semiconductor material used in several electrical and electronical applications, including random-access memories, biohybrid interfaces, sensors, and neuromorphic computing. Nevertheless, such applications are still at an early development stage, constrained by fundamental gaps in understanding and technological limitations. Functional memristive characteristics of TiO<sub>2</sub> rely extensively on the processes, including synthesis techniques, fabrication, and physicochemical modifications. In this work, nanostructured composite films of Carbon (Soot) and TiO<sub>2</sub> are fabricated through a custom-made aerosol flame synthesis (AFS) reactor using a facile one-step synthesis technique with good control over nanostructure, crystallinity, defect chemistry and carbon component inclusions. Scanning mobility particle sizer (SMPS) was employed to analyze particle size distribution in the flame. Microstructures and composition of the C-TiO<sub>2</sub> film were characterized through Raman spectroscopy, UV–VIS spectrophotometry, atomic force microscopy (AFM), and current-voltage I-V measurements. The presence of carbon and TiO<sub>2</sub> across the film was confirmed by the Raman spectrum and quantified by light absorption. The electrical characterization demonstrated a capacitive-coupled non-zero crossing and type-II hysteresis behavior of the C-TiO<sub>2</sub> nanostructured film. Following carbon compositing, TiO<sub>2</sub> exhibited enhanced optical absorption in the visible spectral region and electrical conductivity. The improvement in the conduction pathways was evidenced by the I-V measurements of the TiO<sub>2</sub> film and the C-TiO<sub>2</sub> film. A phenomenon of disappearance and reappearance of the capacitive-coupled memresistive effect was observed after dark and sunlight exposure, most likely due to the photosensitive nature of TiO<sub>2</sub> in the nanocomposite film. This proof-of-concept study testifies that, due to such properties, C-TiO<sub>2</sub> nanocomposite films produced via AFS can be considered as promising future candidates for applications in the field of next-generation electronic devices.</div></div>\",\"PeriodicalId\":18240,\"journal\":{\"name\":\"Materials Science in Semiconductor Processing\",\"volume\":\"202 \",\"pages\":\"Article 110125\"},\"PeriodicalIF\":4.6000,\"publicationDate\":\"2025-10-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Materials Science in Semiconductor Processing\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S1369800125008637\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Materials Science in Semiconductor Processing","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1369800125008637","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Capacitive-coupled non-pinched I–V and type II memristive behavior of carbon-TiO2 nanocomposite films fabricated through aerosol flame synthesis
Titanium dioxide (TiO2) is a long-established semiconductor material used in several electrical and electronical applications, including random-access memories, biohybrid interfaces, sensors, and neuromorphic computing. Nevertheless, such applications are still at an early development stage, constrained by fundamental gaps in understanding and technological limitations. Functional memristive characteristics of TiO2 rely extensively on the processes, including synthesis techniques, fabrication, and physicochemical modifications. In this work, nanostructured composite films of Carbon (Soot) and TiO2 are fabricated through a custom-made aerosol flame synthesis (AFS) reactor using a facile one-step synthesis technique with good control over nanostructure, crystallinity, defect chemistry and carbon component inclusions. Scanning mobility particle sizer (SMPS) was employed to analyze particle size distribution in the flame. Microstructures and composition of the C-TiO2 film were characterized through Raman spectroscopy, UV–VIS spectrophotometry, atomic force microscopy (AFM), and current-voltage I-V measurements. The presence of carbon and TiO2 across the film was confirmed by the Raman spectrum and quantified by light absorption. The electrical characterization demonstrated a capacitive-coupled non-zero crossing and type-II hysteresis behavior of the C-TiO2 nanostructured film. Following carbon compositing, TiO2 exhibited enhanced optical absorption in the visible spectral region and electrical conductivity. The improvement in the conduction pathways was evidenced by the I-V measurements of the TiO2 film and the C-TiO2 film. A phenomenon of disappearance and reappearance of the capacitive-coupled memresistive effect was observed after dark and sunlight exposure, most likely due to the photosensitive nature of TiO2 in the nanocomposite film. This proof-of-concept study testifies that, due to such properties, C-TiO2 nanocomposite films produced via AFS can be considered as promising future candidates for applications in the field of next-generation electronic devices.
期刊介绍:
Materials Science in Semiconductor Processing provides a unique forum for the discussion of novel processing, applications and theoretical studies of functional materials and devices for (opto)electronics, sensors, detectors, biotechnology and green energy.
Each issue will aim to provide a snapshot of current insights, new achievements, breakthroughs and future trends in such diverse fields as microelectronics, energy conversion and storage, communications, biotechnology, (photo)catalysis, nano- and thin-film technology, hybrid and composite materials, chemical processing, vapor-phase deposition, device fabrication, and modelling, which are the backbone of advanced semiconductor processing and applications.
Coverage will include: advanced lithography for submicron devices; etching and related topics; ion implantation; damage evolution and related issues; plasma and thermal CVD; rapid thermal processing; advanced metallization and interconnect schemes; thin dielectric layers, oxidation; sol-gel processing; chemical bath and (electro)chemical deposition; compound semiconductor processing; new non-oxide materials and their applications; (macro)molecular and hybrid materials; molecular dynamics, ab-initio methods, Monte Carlo, etc.; new materials and processes for discrete and integrated circuits; magnetic materials and spintronics; heterostructures and quantum devices; engineering of the electrical and optical properties of semiconductors; crystal growth mechanisms; reliability, defect density, intrinsic impurities and defects.