A cost-effective fault-tolerant EDAC solution for SRAM-based FPGAs and memory in space applications

The reliability of memory and Field Programmable Gate Array (FPGA) devices in space is significantly challenged by Single Event Upsets (SEUs) caused by radiation exposure. To mitigate this, traditional methods such as Hamming (12, 8) codes and Triple Modular Redundancy (TMR) are commonly used. TMR involves triplicating memory or FPGA devices and using a voting logic to detect and correct erroneous bits, offering defense against radiation-induced upsets. However, this approach comes at a high cost in terms of resource utilization and power consumption. This paper presents a novel Error Detection and Correction (EDAC) system that combines partial TMR and Quasi-cyclic (QC) codes to enhance the protection of memory and SRAM-based FPGAs. The system selectively applies partial TMR to critical design components, reducing overhead while ensuring robust SEU protection. QC codes further improve memory error correction capabilities while minimizing the overhead associated with TMR. Experimental results demonstrate that the proposed EDAC system outperforms traditional methods, offering notable reductions in delay, area, and power consumption. This approach provides a more efficient and cost-effective solution for space applications, ensuring better reliability of FPGA and memory devices in low-Earth polar orbits.