{"title":"一种采用16nm FinFET的四核VCO的19.5 ghz抗辐射次采样锁相环,实现了低于50秒的抖动","authors":"David Dolt;Samuel Palermo","doi":"10.1109/LSSC.2025.3610901","DOIUrl":null,"url":null,"abstract":"This letter presents a radiation-hardened (rad-hard) subsampled phase-locked loop (SS-PLL) that achieves state-of-the-art jitter performance while incorporating radiation-hardened techniques to mitigate single-event-upsets (SEUs) present in the space environment. Furthermore, rad-hard techniques are incorporated in each core PLL subblock which include a rad-hard charge-pump Gm cell, a pulser circuit with triple modular redundancy (TMR), and a quad-core voltage-controlled oscillator (VCO) with varactor hardening and LC tail filters. Implemented in a 16-nm FinFET process, the PLL consumes 36.5 mW of power and achieves a jitter of 45.82 fs at 19.5 GHz. Testing at a cyclotron facility verifies robust SEU performance up to an LET of 55 MeV<inline-formula> <tex-math>$\\cdot $ </tex-math></inline-formula>cm2/mg.","PeriodicalId":13032,"journal":{"name":"IEEE Solid-State Circuits Letters","volume":"8 ","pages":"285-288"},"PeriodicalIF":2.0000,"publicationDate":"2025-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A 19.5-GHz Radiation-Hardened Sub-Sampled PLL With Quad-Core VCO in 16-nm FinFET Achieving Sub-50 fs Jitter\",\"authors\":\"David Dolt;Samuel Palermo\",\"doi\":\"10.1109/LSSC.2025.3610901\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This letter presents a radiation-hardened (rad-hard) subsampled phase-locked loop (SS-PLL) that achieves state-of-the-art jitter performance while incorporating radiation-hardened techniques to mitigate single-event-upsets (SEUs) present in the space environment. Furthermore, rad-hard techniques are incorporated in each core PLL subblock which include a rad-hard charge-pump Gm cell, a pulser circuit with triple modular redundancy (TMR), and a quad-core voltage-controlled oscillator (VCO) with varactor hardening and LC tail filters. Implemented in a 16-nm FinFET process, the PLL consumes 36.5 mW of power and achieves a jitter of 45.82 fs at 19.5 GHz. Testing at a cyclotron facility verifies robust SEU performance up to an LET of 55 MeV<inline-formula> <tex-math>$\\\\cdot $ </tex-math></inline-formula>cm2/mg.\",\"PeriodicalId\":13032,\"journal\":{\"name\":\"IEEE Solid-State Circuits Letters\",\"volume\":\"8 \",\"pages\":\"285-288\"},\"PeriodicalIF\":2.0000,\"publicationDate\":\"2025-09-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Solid-State Circuits Letters\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/11168897/\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Solid-State Circuits Letters","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/11168897/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
A 19.5-GHz Radiation-Hardened Sub-Sampled PLL With Quad-Core VCO in 16-nm FinFET Achieving Sub-50 fs Jitter
This letter presents a radiation-hardened (rad-hard) subsampled phase-locked loop (SS-PLL) that achieves state-of-the-art jitter performance while incorporating radiation-hardened techniques to mitigate single-event-upsets (SEUs) present in the space environment. Furthermore, rad-hard techniques are incorporated in each core PLL subblock which include a rad-hard charge-pump Gm cell, a pulser circuit with triple modular redundancy (TMR), and a quad-core voltage-controlled oscillator (VCO) with varactor hardening and LC tail filters. Implemented in a 16-nm FinFET process, the PLL consumes 36.5 mW of power and achieves a jitter of 45.82 fs at 19.5 GHz. Testing at a cyclotron facility verifies robust SEU performance up to an LET of 55 MeV$\cdot $ cm2/mg.