Chunyang Shen , Yanju Ji , Jicheng Cui , Jiwei Zhu , Hongsong Miao
{"title":"充氩宽带梯队光栅光谱仪光谱缩减模型的建立与标定","authors":"Chunyang Shen , Yanju Ji , Jicheng Cui , Jiwei Zhu , Hongsong Miao","doi":"10.1016/j.optlastec.2025.114044","DOIUrl":null,"url":null,"abstract":"<div><div>A spectral reduction model (SRM) introducing the refractive index parameter of the light transmission medium is proposed for the argon-filled high-resolution broadband echelle grating spectrometer (EGS). This model is essentially established based on a mathematical modeling method, combining the optical design parameters and the structure of the broadband EGS, and considering a new factor accounting for the variation of the refractive index of the medium inside the instrument due to the argon filling. By employing geometric optics principles to evaluate the light transmission path and imaging position, a mapping relationship between the wavelength and the coordinate position of the detector pixel is constructed to achieve accurate spectral conversion. To enhance the accuracy of the model, the SRM is further calibrated, and the key parameters of the medium refractive index, the grating incidence angle, the prism vertex angle, the grating offset angle, and the system focal length are optimized in the SRM. The obtained results reveal that in the argon-filled broadband EGS, the SRM is capable of achieving accurate conversion of spectral information, and the position deviation of the calibrated SRM is within 2 pixels, which proves the accuracy and reliability of the model. This study presents a high-precision implementation approach for the EGS in broadband spectral detection and provides ideas and directions for the design and optimization of spectrometers in similar gas environments.</div></div>","PeriodicalId":19511,"journal":{"name":"Optics and Laser Technology","volume":"192 ","pages":"Article 114044"},"PeriodicalIF":5.0000,"publicationDate":"2025-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Establishment and calibration of a spectral reduction model for argon-filled broadband echelle grating spectrometer\",\"authors\":\"Chunyang Shen , Yanju Ji , Jicheng Cui , Jiwei Zhu , Hongsong Miao\",\"doi\":\"10.1016/j.optlastec.2025.114044\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>A spectral reduction model (SRM) introducing the refractive index parameter of the light transmission medium is proposed for the argon-filled high-resolution broadband echelle grating spectrometer (EGS). This model is essentially established based on a mathematical modeling method, combining the optical design parameters and the structure of the broadband EGS, and considering a new factor accounting for the variation of the refractive index of the medium inside the instrument due to the argon filling. By employing geometric optics principles to evaluate the light transmission path and imaging position, a mapping relationship between the wavelength and the coordinate position of the detector pixel is constructed to achieve accurate spectral conversion. To enhance the accuracy of the model, the SRM is further calibrated, and the key parameters of the medium refractive index, the grating incidence angle, the prism vertex angle, the grating offset angle, and the system focal length are optimized in the SRM. The obtained results reveal that in the argon-filled broadband EGS, the SRM is capable of achieving accurate conversion of spectral information, and the position deviation of the calibrated SRM is within 2 pixels, which proves the accuracy and reliability of the model. This study presents a high-precision implementation approach for the EGS in broadband spectral detection and provides ideas and directions for the design and optimization of spectrometers in similar gas environments.</div></div>\",\"PeriodicalId\":19511,\"journal\":{\"name\":\"Optics and Laser Technology\",\"volume\":\"192 \",\"pages\":\"Article 114044\"},\"PeriodicalIF\":5.0000,\"publicationDate\":\"2025-10-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optics and Laser Technology\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0030399225016354\",\"RegionNum\":2,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"OPTICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optics and Laser Technology","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0030399225016354","RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"OPTICS","Score":null,"Total":0}
Establishment and calibration of a spectral reduction model for argon-filled broadband echelle grating spectrometer
A spectral reduction model (SRM) introducing the refractive index parameter of the light transmission medium is proposed for the argon-filled high-resolution broadband echelle grating spectrometer (EGS). This model is essentially established based on a mathematical modeling method, combining the optical design parameters and the structure of the broadband EGS, and considering a new factor accounting for the variation of the refractive index of the medium inside the instrument due to the argon filling. By employing geometric optics principles to evaluate the light transmission path and imaging position, a mapping relationship between the wavelength and the coordinate position of the detector pixel is constructed to achieve accurate spectral conversion. To enhance the accuracy of the model, the SRM is further calibrated, and the key parameters of the medium refractive index, the grating incidence angle, the prism vertex angle, the grating offset angle, and the system focal length are optimized in the SRM. The obtained results reveal that in the argon-filled broadband EGS, the SRM is capable of achieving accurate conversion of spectral information, and the position deviation of the calibrated SRM is within 2 pixels, which proves the accuracy and reliability of the model. This study presents a high-precision implementation approach for the EGS in broadband spectral detection and provides ideas and directions for the design and optimization of spectrometers in similar gas environments.
期刊介绍:
Optics & Laser Technology aims to provide a vehicle for the publication of a broad range of high quality research and review papers in those fields of scientific and engineering research appertaining to the development and application of the technology of optics and lasers. Papers describing original work in these areas are submitted to rigorous refereeing prior to acceptance for publication.
The scope of Optics & Laser Technology encompasses, but is not restricted to, the following areas:
•development in all types of lasers
•developments in optoelectronic devices and photonics
•developments in new photonics and optical concepts
•developments in conventional optics, optical instruments and components
•techniques of optical metrology, including interferometry and optical fibre sensors
•LIDAR and other non-contact optical measurement techniques, including optical methods in heat and fluid flow
•applications of lasers to materials processing, optical NDT display (including holography) and optical communication
•research and development in the field of laser safety including studies of hazards resulting from the applications of lasers (laser safety, hazards of laser fume)
•developments in optical computing and optical information processing
•developments in new optical materials
•developments in new optical characterization methods and techniques
•developments in quantum optics
•developments in light assisted micro and nanofabrication methods and techniques
•developments in nanophotonics and biophotonics
•developments in imaging processing and systems