Qiulin Yu , Chinmay Nawghane , Zihan Zhang , Bart Vandevelde , Karl Fendt , Thomas Krivec , Dieter P. Gruber
{"title":"机器学习模型在热循环下焊点可靠性预测中的应用","authors":"Qiulin Yu , Chinmay Nawghane , Zihan Zhang , Bart Vandevelde , Karl Fendt , Thomas Krivec , Dieter P. Gruber","doi":"10.1016/j.microrel.2025.115900","DOIUrl":null,"url":null,"abstract":"<div><div>In this study, Machine Learning (ML) methods combined with Optuna hyperparameter optimization were investigated to predict creep strain in solder joints of multilayer chip capacitors. Material properties, geometry and thermal loading conditions were varied in simulations using Finite Element Modeling. Evaluated ML models included Random Forest, Gradient Boosting, Support Vector Regression (SVR) and Artificial Neural Network (ANN). The results demonstrated a prediction accuracy of 96%, particularly for SVR and ANN. The model performance significantly improved with increasing data size up to around 600 simulations. In the feature and hyperparameter importance analysis, solder stand-off height and component length most influenced ANN predictions, with learning rate being the key hyperparameter, while for SVR, the regularization parameter or kernel function was most critical.</div></div>","PeriodicalId":51131,"journal":{"name":"Microelectronics Reliability","volume":"174 ","pages":"Article 115900"},"PeriodicalIF":1.9000,"publicationDate":"2025-09-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Application of machine learning modeling for predicting the reliability of solder joints under thermal cycling\",\"authors\":\"Qiulin Yu , Chinmay Nawghane , Zihan Zhang , Bart Vandevelde , Karl Fendt , Thomas Krivec , Dieter P. Gruber\",\"doi\":\"10.1016/j.microrel.2025.115900\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>In this study, Machine Learning (ML) methods combined with Optuna hyperparameter optimization were investigated to predict creep strain in solder joints of multilayer chip capacitors. Material properties, geometry and thermal loading conditions were varied in simulations using Finite Element Modeling. Evaluated ML models included Random Forest, Gradient Boosting, Support Vector Regression (SVR) and Artificial Neural Network (ANN). The results demonstrated a prediction accuracy of 96%, particularly for SVR and ANN. The model performance significantly improved with increasing data size up to around 600 simulations. In the feature and hyperparameter importance analysis, solder stand-off height and component length most influenced ANN predictions, with learning rate being the key hyperparameter, while for SVR, the regularization parameter or kernel function was most critical.</div></div>\",\"PeriodicalId\":51131,\"journal\":{\"name\":\"Microelectronics Reliability\",\"volume\":\"174 \",\"pages\":\"Article 115900\"},\"PeriodicalIF\":1.9000,\"publicationDate\":\"2025-09-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microelectronics Reliability\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0026271425003130\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Reliability","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0026271425003130","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Application of machine learning modeling for predicting the reliability of solder joints under thermal cycling
In this study, Machine Learning (ML) methods combined with Optuna hyperparameter optimization were investigated to predict creep strain in solder joints of multilayer chip capacitors. Material properties, geometry and thermal loading conditions were varied in simulations using Finite Element Modeling. Evaluated ML models included Random Forest, Gradient Boosting, Support Vector Regression (SVR) and Artificial Neural Network (ANN). The results demonstrated a prediction accuracy of 96%, particularly for SVR and ANN. The model performance significantly improved with increasing data size up to around 600 simulations. In the feature and hyperparameter importance analysis, solder stand-off height and component length most influenced ANN predictions, with learning rate being the key hyperparameter, while for SVR, the regularization parameter or kernel function was most critical.
期刊介绍:
Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.
Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.