{"title":"利用自组织映射和模型平均估计固态硬盘的平均故障时间","authors":"Peng Li;Xun Xiao;Jiayu Chen","doi":"10.1109/TR.2025.3550380","DOIUrl":null,"url":null,"abstract":"In this article, a two-step approach is developed to estimate mean time to failure (MTTF) of solid-state drives (SSD) by first formulating a composite health indicator via multichannel signal fusion and further predicting the remaining useful life(RUL) under degradation model misspecification. Specifically, an unsupervised neural network based on self-organizing map is constructed to approximate the highly nonlinear relationship between multivariate monitoring attributes and a univariate SSD health indicator. For each SSD, the composite health indicator over time is further calibrated by smoothing techniques and formulated into a general path degradation model with a uniform failure threshold. By extrapolating each degradation path to hit the failure threshold, the RULs of SSDs are obtained as pseudofailure times, which are fitted by various lifetime distributions. Finally, a novel model averaging strategy is proposed to weigh the MTTFs estimated by multiple combinations of candidate degradation models and lifetime distributions to alleviate the impact of model misspecification. A real-world SSD dataset is used to demonstrate the feasibility of the proposed two-step approach. Numerical results suggest that the proposed approach better characterizes the underlying degradation process under different model assumptions and settings.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"74 3","pages":"4417-4425"},"PeriodicalIF":5.7000,"publicationDate":"2025-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Estimating Mean Time to Failure of Solid-State Drives via Self-Organizing Map and Model Averaging\",\"authors\":\"Peng Li;Xun Xiao;Jiayu Chen\",\"doi\":\"10.1109/TR.2025.3550380\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this article, a two-step approach is developed to estimate mean time to failure (MTTF) of solid-state drives (SSD) by first formulating a composite health indicator via multichannel signal fusion and further predicting the remaining useful life(RUL) under degradation model misspecification. Specifically, an unsupervised neural network based on self-organizing map is constructed to approximate the highly nonlinear relationship between multivariate monitoring attributes and a univariate SSD health indicator. For each SSD, the composite health indicator over time is further calibrated by smoothing techniques and formulated into a general path degradation model with a uniform failure threshold. By extrapolating each degradation path to hit the failure threshold, the RULs of SSDs are obtained as pseudofailure times, which are fitted by various lifetime distributions. Finally, a novel model averaging strategy is proposed to weigh the MTTFs estimated by multiple combinations of candidate degradation models and lifetime distributions to alleviate the impact of model misspecification. A real-world SSD dataset is used to demonstrate the feasibility of the proposed two-step approach. Numerical results suggest that the proposed approach better characterizes the underlying degradation process under different model assumptions and settings.\",\"PeriodicalId\":56305,\"journal\":{\"name\":\"IEEE Transactions on Reliability\",\"volume\":\"74 3\",\"pages\":\"4417-4425\"},\"PeriodicalIF\":5.7000,\"publicationDate\":\"2025-03-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Reliability\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10938984/\",\"RegionNum\":2,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Reliability","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10938984/","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
Estimating Mean Time to Failure of Solid-State Drives via Self-Organizing Map and Model Averaging
In this article, a two-step approach is developed to estimate mean time to failure (MTTF) of solid-state drives (SSD) by first formulating a composite health indicator via multichannel signal fusion and further predicting the remaining useful life(RUL) under degradation model misspecification. Specifically, an unsupervised neural network based on self-organizing map is constructed to approximate the highly nonlinear relationship between multivariate monitoring attributes and a univariate SSD health indicator. For each SSD, the composite health indicator over time is further calibrated by smoothing techniques and formulated into a general path degradation model with a uniform failure threshold. By extrapolating each degradation path to hit the failure threshold, the RULs of SSDs are obtained as pseudofailure times, which are fitted by various lifetime distributions. Finally, a novel model averaging strategy is proposed to weigh the MTTFs estimated by multiple combinations of candidate degradation models and lifetime distributions to alleviate the impact of model misspecification. A real-world SSD dataset is used to demonstrate the feasibility of the proposed two-step approach. Numerical results suggest that the proposed approach better characterizes the underlying degradation process under different model assumptions and settings.
期刊介绍:
IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to ways of predicting and measuring behavior in the field. As an engineering subject that supports new and existing technologies, we constantly expand into new areas of the assurance sciences.