{"title":"基于MetaRGBX-Net的CMOS图像传感器超表面路由器的贝叶斯设计","authors":"JangHyeon Lee;ByoungGyu Kim;Yongkeun Lee","doi":"10.1109/LED.2025.3584027","DOIUrl":null,"url":null,"abstract":"This letter presents a Bayesian optimization framework based on MetaRGBX-Net for tuning meta-atom diameters to achieve specific RGB sensitivity and interpixel crosstalk (XTALK) targets. MetaRGBX-Net—developed in prior work—is validated as an effective surrogate model within the optimization process and enables successful tuning of in-bound (IB) configurations, even near distribution boundaries. RGB sensitivity and XTALK errors were both maintained below 10% through balanced trade-offs. Experimental validation confirms these outcomes, emphasizing the impact of penalty weight adjustments—particularly for blue sensitivity, which was more responsive than red or green. In contrast, out-of-bound (OB) configurations resulted in notable performance degradation across all algorithms, with excessive XTALK and unmet RGB targets. These results underscore the framework’s potential and the importance of well-designed penalty functions and target selection for optimal performance.","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":"46 9","pages":"1569-1572"},"PeriodicalIF":4.5000,"publicationDate":"2025-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Bayesian Design of Metasurface Routers for CMOS Image Sensors via MetaRGBX-Net\",\"authors\":\"JangHyeon Lee;ByoungGyu Kim;Yongkeun Lee\",\"doi\":\"10.1109/LED.2025.3584027\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This letter presents a Bayesian optimization framework based on MetaRGBX-Net for tuning meta-atom diameters to achieve specific RGB sensitivity and interpixel crosstalk (XTALK) targets. MetaRGBX-Net—developed in prior work—is validated as an effective surrogate model within the optimization process and enables successful tuning of in-bound (IB) configurations, even near distribution boundaries. RGB sensitivity and XTALK errors were both maintained below 10% through balanced trade-offs. Experimental validation confirms these outcomes, emphasizing the impact of penalty weight adjustments—particularly for blue sensitivity, which was more responsive than red or green. In contrast, out-of-bound (OB) configurations resulted in notable performance degradation across all algorithms, with excessive XTALK and unmet RGB targets. These results underscore the framework’s potential and the importance of well-designed penalty functions and target selection for optimal performance.\",\"PeriodicalId\":13198,\"journal\":{\"name\":\"IEEE Electron Device Letters\",\"volume\":\"46 9\",\"pages\":\"1569-1572\"},\"PeriodicalIF\":4.5000,\"publicationDate\":\"2025-06-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Electron Device Letters\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/11053817/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11053817/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Bayesian Design of Metasurface Routers for CMOS Image Sensors via MetaRGBX-Net
This letter presents a Bayesian optimization framework based on MetaRGBX-Net for tuning meta-atom diameters to achieve specific RGB sensitivity and interpixel crosstalk (XTALK) targets. MetaRGBX-Net—developed in prior work—is validated as an effective surrogate model within the optimization process and enables successful tuning of in-bound (IB) configurations, even near distribution boundaries. RGB sensitivity and XTALK errors were both maintained below 10% through balanced trade-offs. Experimental validation confirms these outcomes, emphasizing the impact of penalty weight adjustments—particularly for blue sensitivity, which was more responsive than red or green. In contrast, out-of-bound (OB) configurations resulted in notable performance degradation across all algorithms, with excessive XTALK and unmet RGB targets. These results underscore the framework’s potential and the importance of well-designed penalty functions and target selection for optimal performance.
期刊介绍:
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.