协同抑制体积泄漏和周长泄漏的低Von β -Ga₂O₃肖特基二极管

IF 4.5 2区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Zhao Han;Weibing Hao;Qiuyan Li;Junpeng Wen;Lequan Wang;Xuanze Zhou;Guangwei Xu;Shu Yang;Shibing Long
{"title":"协同抑制体积泄漏和周长泄漏的低Von β -Ga₂O₃肖特基二极管","authors":"Zhao Han;Weibing Hao;Qiuyan Li;Junpeng Wen;Lequan Wang;Xuanze Zhou;Guangwei Xu;Shu Yang;Shibing Long","doi":"10.1109/LED.2025.3584109","DOIUrl":null,"url":null,"abstract":"This work first presents <inline-formula> <tex-math>$\\beta $ </tex-math></inline-formula>-Ga2O3 trench Schottky barrier controlled Schottky diodes (TSBSDs) with low turn-on voltage (<inline-formula> <tex-math>${V}_{\\text {on}}\\text {)}$ </tex-math></inline-formula> and substantially improved blocking performance. The high Schottky barrier formed by PtOx and <inline-formula> <tex-math>$\\beta $ </tex-math></inline-formula>-Ga2O3 in the trench region can pinch off and shield the tungsten (W) contact region with low barrier, thereby effectively suppressing reverse bulk leakage. In addition, the composite mesa and junction termination extension (MJTE) is used to alleviate the perimeter leakage caused by edge electric field crowding. The fitting and analysis of leakage current versus radius in logarithmic scale is demonstrated to identify the location that dominates leakage. As a result, the leakage is reduced by more than three orders of magnitude owing to the synergistic suppression of bulk and perimeter leakage. Meanwhile, the breakdown voltage increases from 458 V to 1466 V, with a low <inline-formula> <tex-math>${V}_{\\text {on}}$ </tex-math></inline-formula> maintained at 0.71 V. In additionally, the TSBSD featuring MJTE maintains the lowest power loss in most duty cycles benefiting from the low <inline-formula> <tex-math>${V}_{\\text {on}}$ </tex-math></inline-formula> and leakage current. This work paves the way to improve the operational efficiency of <inline-formula> <tex-math>$\\boldsymbol {\\beta }$ </tex-math></inline-formula>-Ga2O3 Schottky diodes.","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":"46 9","pages":"1497-1500"},"PeriodicalIF":4.5000,"publicationDate":"2025-06-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Low Von β -Ga₂O₃ Schottky Diodes With Synergistic Suppression of Bulk and Perimeter Leakage\",\"authors\":\"Zhao Han;Weibing Hao;Qiuyan Li;Junpeng Wen;Lequan Wang;Xuanze Zhou;Guangwei Xu;Shu Yang;Shibing Long\",\"doi\":\"10.1109/LED.2025.3584109\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work first presents <inline-formula> <tex-math>$\\\\beta $ </tex-math></inline-formula>-Ga2O3 trench Schottky barrier controlled Schottky diodes (TSBSDs) with low turn-on voltage (<inline-formula> <tex-math>${V}_{\\\\text {on}}\\\\text {)}$ </tex-math></inline-formula> and substantially improved blocking performance. The high Schottky barrier formed by PtOx and <inline-formula> <tex-math>$\\\\beta $ </tex-math></inline-formula>-Ga2O3 in the trench region can pinch off and shield the tungsten (W) contact region with low barrier, thereby effectively suppressing reverse bulk leakage. In addition, the composite mesa and junction termination extension (MJTE) is used to alleviate the perimeter leakage caused by edge electric field crowding. The fitting and analysis of leakage current versus radius in logarithmic scale is demonstrated to identify the location that dominates leakage. As a result, the leakage is reduced by more than three orders of magnitude owing to the synergistic suppression of bulk and perimeter leakage. Meanwhile, the breakdown voltage increases from 458 V to 1466 V, with a low <inline-formula> <tex-math>${V}_{\\\\text {on}}$ </tex-math></inline-formula> maintained at 0.71 V. In additionally, the TSBSD featuring MJTE maintains the lowest power loss in most duty cycles benefiting from the low <inline-formula> <tex-math>${V}_{\\\\text {on}}$ </tex-math></inline-formula> and leakage current. This work paves the way to improve the operational efficiency of <inline-formula> <tex-math>$\\\\boldsymbol {\\\\beta }$ </tex-math></inline-formula>-Ga2O3 Schottky diodes.\",\"PeriodicalId\":13198,\"journal\":{\"name\":\"IEEE Electron Device Letters\",\"volume\":\"46 9\",\"pages\":\"1497-1500\"},\"PeriodicalIF\":4.5000,\"publicationDate\":\"2025-06-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Electron Device Letters\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/11058956/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11058956/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

摘要

这项工作首先提出了具有低导通电压(${V}_{\text {on}}}\text{)}$的$\beta $ -Ga2O3沟槽肖特基势垒控制的肖特基二极管(tsbsd),并大大提高了阻塞性能。PtOx与$\beta $ -Ga2O3在沟槽区形成的高肖特基势垒可以掐断和屏蔽低势垒的钨(W)接触区,从而有效抑制反向体漏。此外,采用复合台面和结端延伸(MJTE)来缓解边缘电场拥挤引起的周界泄漏。在对数尺度上对泄漏电流与半径的拟合和分析证明了泄漏的主导位置。结果,由于体积泄漏和周长泄漏的协同抑制,泄漏减少了三个数量级以上。同时,击穿电压从458 V增加到1466 V,低电压${V}_{\text {on}}$维持在0.71 V。此外,由于低${V}_{\text {on}}$和漏电流,具有MJTE特性的TSBSD在大多数占空比中保持最低的功率损耗。这项工作为提高-Ga2O3肖特基二极管的工作效率铺平了道路。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Low Von β -Ga₂O₃ Schottky Diodes With Synergistic Suppression of Bulk and Perimeter Leakage
This work first presents $\beta $ -Ga2O3 trench Schottky barrier controlled Schottky diodes (TSBSDs) with low turn-on voltage ( ${V}_{\text {on}}\text {)}$ and substantially improved blocking performance. The high Schottky barrier formed by PtOx and $\beta $ -Ga2O3 in the trench region can pinch off and shield the tungsten (W) contact region with low barrier, thereby effectively suppressing reverse bulk leakage. In addition, the composite mesa and junction termination extension (MJTE) is used to alleviate the perimeter leakage caused by edge electric field crowding. The fitting and analysis of leakage current versus radius in logarithmic scale is demonstrated to identify the location that dominates leakage. As a result, the leakage is reduced by more than three orders of magnitude owing to the synergistic suppression of bulk and perimeter leakage. Meanwhile, the breakdown voltage increases from 458 V to 1466 V, with a low ${V}_{\text {on}}$ maintained at 0.71 V. In additionally, the TSBSD featuring MJTE maintains the lowest power loss in most duty cycles benefiting from the low ${V}_{\text {on}}$ and leakage current. This work paves the way to improve the operational efficiency of $\boldsymbol {\beta }$ -Ga2O3 Schottky diodes.
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来源期刊
IEEE Electron Device Letters
IEEE Electron Device Letters 工程技术-工程:电子与电气
CiteScore
8.20
自引率
10.20%
发文量
551
审稿时长
1.4 months
期刊介绍: IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.
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