Wanxiao Gao, Hui Chen, Aokun Shi, Jie Ding, Yaoyao Qi, Bingzheng Yan, Yifu Chen, Yulei Wang, Zhiwei Lu, Zhenxu Bai
{"title":"光学透明材料残余应力分析的偏振成像方法综述","authors":"Wanxiao Gao, Hui Chen, Aokun Shi, Jie Ding, Yaoyao Qi, Bingzheng Yan, Yifu Chen, Yulei Wang, Zhiwei Lu, Zhenxu Bai","doi":"10.1016/j.optlastec.2025.113642","DOIUrl":null,"url":null,"abstract":"<div><div>Stress birefringence measurements of optically transparent materials are key to evaluating optical performance, providing insight into the stress distribution and changes in the optical properties of optical elements, and are indispensable for optimizing system performance and enabling non-destructive testing. Based on polarization imaging technology, by capturing the polarization information of light, it is able to reveal the surface properties, structure and material information of the object that cannot be obtained by traditional intensity imaging. It plays a key role in stress birefringence measurement, and utilizes the characteristics of polarized light to improve the contrast and resolution of imaging, and enhances the detection ability of complex scenes and hidden features. This paper reviews recent advances in the application of polarization imaging techniques for measuring residual stress-induced birefringence in optically transparent materials. It outlines the underlying principles, major methodologies, and recent developments in the field, and discusses the significant role and future prospects of these techniques in materials science and optical engineering.</div></div>","PeriodicalId":19511,"journal":{"name":"Optics and Laser Technology","volume":"192 ","pages":"Article 113642"},"PeriodicalIF":5.0000,"publicationDate":"2025-08-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Polarization imaging for residual stress analysis in optically transparent materials: A review\",\"authors\":\"Wanxiao Gao, Hui Chen, Aokun Shi, Jie Ding, Yaoyao Qi, Bingzheng Yan, Yifu Chen, Yulei Wang, Zhiwei Lu, Zhenxu Bai\",\"doi\":\"10.1016/j.optlastec.2025.113642\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Stress birefringence measurements of optically transparent materials are key to evaluating optical performance, providing insight into the stress distribution and changes in the optical properties of optical elements, and are indispensable for optimizing system performance and enabling non-destructive testing. Based on polarization imaging technology, by capturing the polarization information of light, it is able to reveal the surface properties, structure and material information of the object that cannot be obtained by traditional intensity imaging. It plays a key role in stress birefringence measurement, and utilizes the characteristics of polarized light to improve the contrast and resolution of imaging, and enhances the detection ability of complex scenes and hidden features. This paper reviews recent advances in the application of polarization imaging techniques for measuring residual stress-induced birefringence in optically transparent materials. It outlines the underlying principles, major methodologies, and recent developments in the field, and discusses the significant role and future prospects of these techniques in materials science and optical engineering.</div></div>\",\"PeriodicalId\":19511,\"journal\":{\"name\":\"Optics and Laser Technology\",\"volume\":\"192 \",\"pages\":\"Article 113642\"},\"PeriodicalIF\":5.0000,\"publicationDate\":\"2025-08-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optics and Laser Technology\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0030399225012332\",\"RegionNum\":2,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"OPTICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optics and Laser Technology","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0030399225012332","RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"OPTICS","Score":null,"Total":0}
Polarization imaging for residual stress analysis in optically transparent materials: A review
Stress birefringence measurements of optically transparent materials are key to evaluating optical performance, providing insight into the stress distribution and changes in the optical properties of optical elements, and are indispensable for optimizing system performance and enabling non-destructive testing. Based on polarization imaging technology, by capturing the polarization information of light, it is able to reveal the surface properties, structure and material information of the object that cannot be obtained by traditional intensity imaging. It plays a key role in stress birefringence measurement, and utilizes the characteristics of polarized light to improve the contrast and resolution of imaging, and enhances the detection ability of complex scenes and hidden features. This paper reviews recent advances in the application of polarization imaging techniques for measuring residual stress-induced birefringence in optically transparent materials. It outlines the underlying principles, major methodologies, and recent developments in the field, and discusses the significant role and future prospects of these techniques in materials science and optical engineering.
期刊介绍:
Optics & Laser Technology aims to provide a vehicle for the publication of a broad range of high quality research and review papers in those fields of scientific and engineering research appertaining to the development and application of the technology of optics and lasers. Papers describing original work in these areas are submitted to rigorous refereeing prior to acceptance for publication.
The scope of Optics & Laser Technology encompasses, but is not restricted to, the following areas:
•development in all types of lasers
•developments in optoelectronic devices and photonics
•developments in new photonics and optical concepts
•developments in conventional optics, optical instruments and components
•techniques of optical metrology, including interferometry and optical fibre sensors
•LIDAR and other non-contact optical measurement techniques, including optical methods in heat and fluid flow
•applications of lasers to materials processing, optical NDT display (including holography) and optical communication
•research and development in the field of laser safety including studies of hazards resulting from the applications of lasers (laser safety, hazards of laser fume)
•developments in optical computing and optical information processing
•developments in new optical materials
•developments in new optical characterization methods and techniques
•developments in quantum optics
•developments in light assisted micro and nanofabrication methods and techniques
•developments in nanophotonics and biophotonics
•developments in imaging processing and systems