{"title":"Ni, Co, Mn对Sn-X (X= Bi, Ag, Zn, Cu)钎料合金最新进展的影响","authors":"Ajeet Mishra, Anju Kaushal, Mukesh Raushan Kumar","doi":"10.1016/j.microrel.2025.115878","DOIUrl":null,"url":null,"abstract":"<div><div>Advancements in microelectronics and electronic assemblies have accelerated the need for advanced Pb-free solder materials designed to fulfill specific industry needs. The sectors such as electronics, avionics, marine, aerospace, and automotive industries seek solder alloys with enhanced mechanical integrity, thermal stability, and electrical reliability. The continuous emergence of Lead-free solders compositions focuses on optimizing their microstructure and performance characteristics to fulfill the stringent demands of modern applications. This review comprehensively examines the influence of nickel (Ni), cobalt (Co), and manganese (Mn) alloying in Sn<img>Bi, Sn<img>Ag, Sn<img>Zn and Sn<img>Cu solder systems focusing on their impacts on microstructural refinement, mechanical reinforcement, wettability enhancement, melting behavior, electrical and thermal conductivity, electromigration resistance and corrosion mitigation. The added Ni has been observed to refine intermetallic compound (IMC) structure and reduce excessive IMC growth thereby improving joint durability and creep resistance, also regulating surface morphology. The Co contributes to microstructural stability and thermal stability optimizing the mechanical robustness of solder joints. The Mn known for their oxidation resistance property improves corrosion resistance reduces interfacial voiding and refines IMC morphology. This review highlights the potential of Ni, Co, and Mn as key additive elements in Lead-free solder development. Their controlled addition can considerably strengthen the thermal, electrical and mechanical characteristics of solder systems, making them better suited for next-generation electronic and electrical applications.</div></div>","PeriodicalId":51131,"journal":{"name":"Microelectronics Reliability","volume":"174 ","pages":"Article 115878"},"PeriodicalIF":1.9000,"publicationDate":"2025-08-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Effect of Ni, Co, and Mn for the recent advancements and progress of Sn-X (X= Bi, Ag, Zn & Cu) solder alloys: A review\",\"authors\":\"Ajeet Mishra, Anju Kaushal, Mukesh Raushan Kumar\",\"doi\":\"10.1016/j.microrel.2025.115878\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Advancements in microelectronics and electronic assemblies have accelerated the need for advanced Pb-free solder materials designed to fulfill specific industry needs. The sectors such as electronics, avionics, marine, aerospace, and automotive industries seek solder alloys with enhanced mechanical integrity, thermal stability, and electrical reliability. The continuous emergence of Lead-free solders compositions focuses on optimizing their microstructure and performance characteristics to fulfill the stringent demands of modern applications. This review comprehensively examines the influence of nickel (Ni), cobalt (Co), and manganese (Mn) alloying in Sn<img>Bi, Sn<img>Ag, Sn<img>Zn and Sn<img>Cu solder systems focusing on their impacts on microstructural refinement, mechanical reinforcement, wettability enhancement, melting behavior, electrical and thermal conductivity, electromigration resistance and corrosion mitigation. The added Ni has been observed to refine intermetallic compound (IMC) structure and reduce excessive IMC growth thereby improving joint durability and creep resistance, also regulating surface morphology. The Co contributes to microstructural stability and thermal stability optimizing the mechanical robustness of solder joints. The Mn known for their oxidation resistance property improves corrosion resistance reduces interfacial voiding and refines IMC morphology. This review highlights the potential of Ni, Co, and Mn as key additive elements in Lead-free solder development. Their controlled addition can considerably strengthen the thermal, electrical and mechanical characteristics of solder systems, making them better suited for next-generation electronic and electrical applications.</div></div>\",\"PeriodicalId\":51131,\"journal\":{\"name\":\"Microelectronics Reliability\",\"volume\":\"174 \",\"pages\":\"Article 115878\"},\"PeriodicalIF\":1.9000,\"publicationDate\":\"2025-08-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microelectronics Reliability\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0026271425002914\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Reliability","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0026271425002914","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Effect of Ni, Co, and Mn for the recent advancements and progress of Sn-X (X= Bi, Ag, Zn & Cu) solder alloys: A review
Advancements in microelectronics and electronic assemblies have accelerated the need for advanced Pb-free solder materials designed to fulfill specific industry needs. The sectors such as electronics, avionics, marine, aerospace, and automotive industries seek solder alloys with enhanced mechanical integrity, thermal stability, and electrical reliability. The continuous emergence of Lead-free solders compositions focuses on optimizing their microstructure and performance characteristics to fulfill the stringent demands of modern applications. This review comprehensively examines the influence of nickel (Ni), cobalt (Co), and manganese (Mn) alloying in SnBi, SnAg, SnZn and SnCu solder systems focusing on their impacts on microstructural refinement, mechanical reinforcement, wettability enhancement, melting behavior, electrical and thermal conductivity, electromigration resistance and corrosion mitigation. The added Ni has been observed to refine intermetallic compound (IMC) structure and reduce excessive IMC growth thereby improving joint durability and creep resistance, also regulating surface morphology. The Co contributes to microstructural stability and thermal stability optimizing the mechanical robustness of solder joints. The Mn known for their oxidation resistance property improves corrosion resistance reduces interfacial voiding and refines IMC morphology. This review highlights the potential of Ni, Co, and Mn as key additive elements in Lead-free solder development. Their controlled addition can considerably strengthen the thermal, electrical and mechanical characteristics of solder systems, making them better suited for next-generation electronic and electrical applications.
期刊介绍:
Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.
Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.