吸波材料质量标准研究

IF 5.3 2区 材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY
Shengyu Yang, Peng Wu, Yanfei Sheng, Yiwen Dong, Zhiwei Li, Tao Wang, Liang Qiao, Fashen Li
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引用次数: 0

摘要

已发表的评价微波吸收材料的研究大多侧重于计算反射率,认为反射率较低的材料具有“良好的吸收能力”。然而,Rozanov等人认为,反射最小深度作为质量标准是不够的,这一观点迄今为止在科学话语中仍未得到认可。本研究利用四分之一波长波长关系结合传输线理论来设计各种由铁磁性或介电材料组成的微波吸收器。结果表明,每一种吸收剂都能达到完美匹配(Zin/Z0 = 1),这表明在实际应用中,它们都能达到最佳的负无穷反射损耗(RL)值,从而证实了Rozanov的观点。为了更好地评价MA材料,确定了完美匹配时的平方折射率,记为(με)p,作为一个鲁棒的质量度量。实验结果表明,较高(με)p值的材料具有较好的吸收性能。此外,该指标为低频薄层吸收器的设计和识别更好的MA材料提供了有价值的见解。这些发现强调了MA器件性能和MA材料特性之间不可分离的联系。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

On the Quality Criteria for Microwave Absorbing Materials

On the Quality Criteria for Microwave Absorbing Materials

On the Quality Criteria for Microwave Absorbing Materials

On the Quality Criteria for Microwave Absorbing Materials

The majority of published studies evaluating microwave absorbing (MA) materials focus on calculating reflectivity, identifying materials with lower reflectivity as having “good absorption capability”. However, Rozanov et al. posited that reflection minimum depth is insufficient as the quality criteria—a viewpoint that remains under-recognized in scientific discourse so far. This study leverages the quarter-wavelength wavelength relationship in conjunction with transmission line theory to engineer various microwave absorbers composed of ferromagnetic or dielectric materials. The results indicate that each of these absorbers can achieves perfect matching (Zin/Z0 = 1), suggesting that, in practice, they can all achieve the best reflection loss (RL) value of negative infinity, thereby affirming Rozanov ′s perspective. In order to be able to better evaluate MA materials, it is identified that the squared refractive index at perfect matching, denoted as (με)p, serves as a robust quality metric. Experimental results indicate that materials with a higher (με)p value exhibit superior absorption performance. Furthermore, this metric offers valuable insights for the design of low-frequency thin-layer absorbers and for identifying better MA materials. These findings underscore an indissociable link between MA device performance and MA material characteristics.

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来源期刊
Advanced Electronic Materials
Advanced Electronic Materials NANOSCIENCE & NANOTECHNOLOGYMATERIALS SCIE-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
11.00
自引率
3.20%
发文量
433
期刊介绍: Advanced Electronic Materials is an interdisciplinary forum for peer-reviewed, high-quality, high-impact research in the fields of materials science, physics, and engineering of electronic and magnetic materials. It includes research on physics and physical properties of electronic and magnetic materials, spintronics, electronics, device physics and engineering, micro- and nano-electromechanical systems, and organic electronics, in addition to fundamental research.
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