基于CdS/ZnO压电异质结的紫外探测器

IF 2 4区材料科学 Q3 MATERIALS SCIENCE, COATINGS & FILMS

Thin Solid Films Pub Date : 2025-07-22 DOI:10.1016/j.tsf.2025.140752

Taiping Teng , Yuxin Chen , Yang Peng , Weiguang Cheng , Weidong Zhang , Maobo Fang , Zhongyu Hou , Yanfang Wang

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引用次数: 0

摘要

提出了一种基于CdS/ZnO压电异质结的紫外光检测装置，通过压电-光响应耦合机制实现智能环境监测。采用水热合成和连续离子层吸附反应（SILAR）相结合的方法在不锈钢衬底上制备了CdS/ZnO核壳纳米线阵列，形成了具有压电和紫外敏感性能的异质结。材料表征表明，该结构在紫外可见区具有高达506 nm的扩展吸收，带隙约为2.45 eV。光电测量表明，在395 nm紫外光照射下，电流密度显著增强。压电输出测试表明，CdS/ZnO异质结对紫外光具有较高的灵敏度（R = 53.7%）。利用STM32开发板实现信号采集和阈值识别，使设备能够区分光线和紫外线照射。本研究为开发集成化、低功耗的智能紫外传感系统提供了一条途径。

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Ultraviolet detector based on CdS/ZnO piezoelectric heterojunction

This paper proposes an ultraviolet (UV) light detection device based on a CdS/ZnO piezoelectric heterojunction, which realizes intelligent environmental monitoring through a piezoelectric-optical response coupling mechanism. The CdS/ZnO core-shell nanowire arrays were fabricated on a stainless steel substrate via a combination of hydrothermal synthesis and Successive Ionic Layer Adsorption and Reaction (SILAR) methods, forming a heterojunction with both piezoelectric and UV-sensitive properties. Material characterization revealed that the structure exhibits an extended absorption in the UV–visible region up to 506 nm and a bandgap of approximately 2.45 eV. Photoelectrical measurements demonstrated a significant enhancement in current density under 395 nm UV light irradiation. Piezoelectric output tests disclosed that the CdS/ZnO heterojunction possesses high sensitivity to UV light (R = 53.7 %). Signal acquisition and threshold discrimination were achieved using an STM32 development board, enabling the device to distinguish tress and UV irradiation. This study offers an approach for the development of integrated, low-power intelligent UV sensing systems.

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来源期刊

Thin Solid Films 工程技术-材料科学：膜

CiteScore

4.00

自引率

4.80%

发文量

381

审稿时长

7.5 months

期刊介绍： Thin Solid Films is an international journal which serves scientists and engineers working in the fields of thin-film synthesis, characterization, and applications. The field of thin films, which can be defined as the confluence of materials science, surface science, and applied physics, has become an identifiable unified discipline of scientific endeavor.