对三相逆变器老化功率Si-MOSFET进行了电磁干扰评估

IF 1.6 4区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

Microelectronics Reliability Pub Date : 2025-07-23 DOI:10.1016/j.microrel.2025.115872

Mohamed TLIG , Bassem ZITOUNA , Moncef KADI , Mahmoud HAMMOUDA , Jaleleddine BEN HADJ SLAMA

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引用次数: 0

摘要

在本文中，我们证明了电力电子元件（特别是在我们的案例中基于si的n - mosfet）的加速老化测试对用于驱动感应电机的三相逆变器的传导发射（共模和差模）有不利影响。为了实现这一目标，我们在操作功率晶体管的同时进行了电加速老化测试，以测量其老化前后的传导辐射。通过对时域和频域测量结果的比较，推导出老化对硅基n - mosfet的影响。实验结果表明，老化后，导电电磁干扰（EMI）幅度增大。此外，这种增加会导致电磁干扰测试中研究的电气参数退化。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Conducted EMI assessment of aging power Si-MOSFET in 3 phase inverter

In this paper, we demonstrate that accelerated aging tests of power electronic components (specifically Si-based N-MOSFETs in our case) have an adverse effect on the conducted emissions (common and differential mode) in a 3-phase inverter used to drive an induction motor. To achieve this, we conduct electric accelerated aging tests while operating the power transistors to measure their conducted emissions before and after aging. A comparison between measurements in the time and frequency domains is presented to deduce the effect of aging on the Si-based N-MOSFETs. Experimental results show that after aging, there is an increase in the amplitude of conducted electromagnetic interference (EMI). Furthermore, this increase leads to electrical parameter degradation that has been investigated in EMI tests.

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来源期刊

Microelectronics Reliability 工程技术-工程：电子与电气

CiteScore

3.30

自引率

12.50%

发文量

342

审稿时长

68 days

期刊介绍： Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged. Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.