Yannick Schellander , Fabian Munkes , Alexander Trachtmann , Florian Anschütz , Ettore Eder , Hanna Lippmann , Meriem Mavlutova , Marius Winter , Robert Löw , Patrick Schalberger , Tilman Pfau , Harald Kübler , Norbert Fruehauf
{"title":"使用有源矩阵跨阻放大器阵列的空间分辨电离电流测量","authors":"Yannick Schellander , Fabian Munkes , Alexander Trachtmann , Florian Anschütz , Ettore Eder , Hanna Lippmann , Meriem Mavlutova , Marius Winter , Robert Löw , Patrick Schalberger , Tilman Pfau , Harald Kübler , Norbert Fruehauf","doi":"10.1016/j.sse.2025.109186","DOIUrl":null,"url":null,"abstract":"<div><div>In a previous paper by our research group, high-resolution continuous wave (CW) laser spectroscopy was performed on Rydberg states in nitric oxide <span><span>[1]</span></span>. Special focus was on the behavior of these states in an electric field with variable strength. In contrast to theory, ionization current measurements show states with no frequency shift for high electric field strengths. Some states seem to split into a shifted and an unshifted line. The reason for this effect is most likely an inhomogeneous electric field distribution. This is caused by field attenuations near the cell walls resulting from charge carrier accumulations on these. Therefore, charge carriers generated near the cell walls experience a much lower electric field than expected. This permanent low-field contribution shows up as an unshifted state in the Stark spectra. To further investigate the charge carrier effects and prove the given explanation, spatially resolved measurements of the ionization currents are performed. These kinds of measurements are enabled by an electrode/transimpedance amplifier array based on thin-film technology. This work shows the realization and characterization of the required thin-film circuits. The focus is on the creation of current-to-voltage converting circuits using amorphous indium gallium zinc oxide as semiconductor. This on-glass electronics enabled spatially and time resolved charge measurements, giving insights into the charge carrier creation and the electric field distribution in the spectroscopy cell. Other thinkable applications of such a sensor array could be the determination of the dynamic density distribution by turbulent gas flow or in resonance-enhanced multiphoton ionization experiments.</div></div>","PeriodicalId":21909,"journal":{"name":"Solid-state Electronics","volume":"229 ","pages":"Article 109186"},"PeriodicalIF":1.4000,"publicationDate":"2025-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Spatially resolved ionization current measurements using an active-matrix transimpedance amplifier array\",\"authors\":\"Yannick Schellander , Fabian Munkes , Alexander Trachtmann , Florian Anschütz , Ettore Eder , Hanna Lippmann , Meriem Mavlutova , Marius Winter , Robert Löw , Patrick Schalberger , Tilman Pfau , Harald Kübler , Norbert Fruehauf\",\"doi\":\"10.1016/j.sse.2025.109186\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>In a previous paper by our research group, high-resolution continuous wave (CW) laser spectroscopy was performed on Rydberg states in nitric oxide <span><span>[1]</span></span>. Special focus was on the behavior of these states in an electric field with variable strength. In contrast to theory, ionization current measurements show states with no frequency shift for high electric field strengths. Some states seem to split into a shifted and an unshifted line. The reason for this effect is most likely an inhomogeneous electric field distribution. This is caused by field attenuations near the cell walls resulting from charge carrier accumulations on these. Therefore, charge carriers generated near the cell walls experience a much lower electric field than expected. This permanent low-field contribution shows up as an unshifted state in the Stark spectra. To further investigate the charge carrier effects and prove the given explanation, spatially resolved measurements of the ionization currents are performed. These kinds of measurements are enabled by an electrode/transimpedance amplifier array based on thin-film technology. This work shows the realization and characterization of the required thin-film circuits. The focus is on the creation of current-to-voltage converting circuits using amorphous indium gallium zinc oxide as semiconductor. This on-glass electronics enabled spatially and time resolved charge measurements, giving insights into the charge carrier creation and the electric field distribution in the spectroscopy cell. Other thinkable applications of such a sensor array could be the determination of the dynamic density distribution by turbulent gas flow or in resonance-enhanced multiphoton ionization experiments.</div></div>\",\"PeriodicalId\":21909,\"journal\":{\"name\":\"Solid-state Electronics\",\"volume\":\"229 \",\"pages\":\"Article 109186\"},\"PeriodicalIF\":1.4000,\"publicationDate\":\"2025-07-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Solid-state Electronics\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0038110125001315\",\"RegionNum\":4,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Solid-state Electronics","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0038110125001315","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Spatially resolved ionization current measurements using an active-matrix transimpedance amplifier array
In a previous paper by our research group, high-resolution continuous wave (CW) laser spectroscopy was performed on Rydberg states in nitric oxide [1]. Special focus was on the behavior of these states in an electric field with variable strength. In contrast to theory, ionization current measurements show states with no frequency shift for high electric field strengths. Some states seem to split into a shifted and an unshifted line. The reason for this effect is most likely an inhomogeneous electric field distribution. This is caused by field attenuations near the cell walls resulting from charge carrier accumulations on these. Therefore, charge carriers generated near the cell walls experience a much lower electric field than expected. This permanent low-field contribution shows up as an unshifted state in the Stark spectra. To further investigate the charge carrier effects and prove the given explanation, spatially resolved measurements of the ionization currents are performed. These kinds of measurements are enabled by an electrode/transimpedance amplifier array based on thin-film technology. This work shows the realization and characterization of the required thin-film circuits. The focus is on the creation of current-to-voltage converting circuits using amorphous indium gallium zinc oxide as semiconductor. This on-glass electronics enabled spatially and time resolved charge measurements, giving insights into the charge carrier creation and the electric field distribution in the spectroscopy cell. Other thinkable applications of such a sensor array could be the determination of the dynamic density distribution by turbulent gas flow or in resonance-enhanced multiphoton ionization experiments.
期刊介绍:
It is the aim of this journal to bring together in one publication outstanding papers reporting new and original work in the following areas: (1) applications of solid-state physics and technology to electronics and optoelectronics, including theory and device design; (2) optical, electrical, morphological characterization techniques and parameter extraction of devices; (3) fabrication of semiconductor devices, and also device-related materials growth, measurement and evaluation; (4) the physics and modeling of submicron and nanoscale microelectronic and optoelectronic devices, including processing, measurement, and performance evaluation; (5) applications of numerical methods to the modeling and simulation of solid-state devices and processes; and (6) nanoscale electronic and optoelectronic devices, photovoltaics, sensors, and MEMS based on semiconductor and alternative electronic materials; (7) synthesis and electrooptical properties of materials for novel devices.