{"title":"大功率微波脉冲作用下p-i-n限幅器失效机理的数值模拟与理论分析","authors":"Lan Li;Yang Zhang;Lishan Zhao;Yuwei Fan","doi":"10.1109/TPS.2025.3575433","DOIUrl":null,"url":null,"abstract":"Numerical simulation can present the real-time distribution of the multiphysic field of devices during the action of high-power microwave (HPM) pulse, which makes it become a highly efficient method to reveal the thermal failure of devices. The study focuses on the thermal failure of the cascaded p-i-n limiter under HPM pulses. Considering the multiphysical phenomena of p-i-n diodes and circuit elements within the limiter, the field-circuit model of the cascaded p-i-n limiter is established by transforming the transmission line into equivalent lumped circuit elements and modifying the thermal parameter models of the p-i-n diodes. Based on the model, the thermal failure effect of cascaded p-i-n limiters under HPM pulses is investigated, and the relationship between the failure power and pulsewidth is obtained, which is consistent with the results of Tasca-Wunsch law. Furthermore, the study reveals the failure mechanism of the cascaded p-i-n limiter under HPM pulses, and the thermal burnout location of the limiter is determined.","PeriodicalId":450,"journal":{"name":"IEEE Transactions on Plasma Science","volume":"53 7","pages":"1552-1562"},"PeriodicalIF":1.5000,"publicationDate":"2025-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Numerical Simulation and Theoretical Analysis on the Failure Mechanism of p-i-n Limiter Under High-Power Microwave Pulse\",\"authors\":\"Lan Li;Yang Zhang;Lishan Zhao;Yuwei Fan\",\"doi\":\"10.1109/TPS.2025.3575433\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Numerical simulation can present the real-time distribution of the multiphysic field of devices during the action of high-power microwave (HPM) pulse, which makes it become a highly efficient method to reveal the thermal failure of devices. The study focuses on the thermal failure of the cascaded p-i-n limiter under HPM pulses. Considering the multiphysical phenomena of p-i-n diodes and circuit elements within the limiter, the field-circuit model of the cascaded p-i-n limiter is established by transforming the transmission line into equivalent lumped circuit elements and modifying the thermal parameter models of the p-i-n diodes. Based on the model, the thermal failure effect of cascaded p-i-n limiters under HPM pulses is investigated, and the relationship between the failure power and pulsewidth is obtained, which is consistent with the results of Tasca-Wunsch law. Furthermore, the study reveals the failure mechanism of the cascaded p-i-n limiter under HPM pulses, and the thermal burnout location of the limiter is determined.\",\"PeriodicalId\":450,\"journal\":{\"name\":\"IEEE Transactions on Plasma Science\",\"volume\":\"53 7\",\"pages\":\"1552-1562\"},\"PeriodicalIF\":1.5000,\"publicationDate\":\"2025-06-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Plasma Science\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/11045725/\",\"RegionNum\":4,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"PHYSICS, FLUIDS & PLASMAS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Plasma Science","FirstCategoryId":"101","ListUrlMain":"https://ieeexplore.ieee.org/document/11045725/","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"PHYSICS, FLUIDS & PLASMAS","Score":null,"Total":0}
Numerical Simulation and Theoretical Analysis on the Failure Mechanism of p-i-n Limiter Under High-Power Microwave Pulse
Numerical simulation can present the real-time distribution of the multiphysic field of devices during the action of high-power microwave (HPM) pulse, which makes it become a highly efficient method to reveal the thermal failure of devices. The study focuses on the thermal failure of the cascaded p-i-n limiter under HPM pulses. Considering the multiphysical phenomena of p-i-n diodes and circuit elements within the limiter, the field-circuit model of the cascaded p-i-n limiter is established by transforming the transmission line into equivalent lumped circuit elements and modifying the thermal parameter models of the p-i-n diodes. Based on the model, the thermal failure effect of cascaded p-i-n limiters under HPM pulses is investigated, and the relationship between the failure power and pulsewidth is obtained, which is consistent with the results of Tasca-Wunsch law. Furthermore, the study reveals the failure mechanism of the cascaded p-i-n limiter under HPM pulses, and the thermal burnout location of the limiter is determined.
期刊介绍:
The scope covers all aspects of the theory and application of plasma science. It includes the following areas: magnetohydrodynamics; thermionics and plasma diodes; basic plasma phenomena; gaseous electronics; microwave/plasma interaction; electron, ion, and plasma sources; space plasmas; intense electron and ion beams; laser-plasma interactions; plasma diagnostics; plasma chemistry and processing; solid-state plasmas; plasma heating; plasma for controlled fusion research; high energy density plasmas; industrial/commercial applications of plasma physics; plasma waves and instabilities; and high power microwave and submillimeter wave generation.