{"title":"基于阶跃脊波导的InGaAlAs/InP MQW晶体管激光器","authors":"Yijia Liu;Lijun Qiao;Xin Tang;Song Liang;Mingjiang Zhang","doi":"10.1109/LED.2025.3563705","DOIUrl":null,"url":null,"abstract":"We propose and numerically investigate a new step-ridge-waveguide InGaAlAs/InP multi-quantum well (MQW) transistor laser (TL). The carrier nonradiative recombination centers caused by the exposed deep-ridge waveguide sidewall significantly degrade the optoelectronic performance of the TLs. The step-ridge-waveguide structure guides carriers through the center portion of the ridge waveguide, thereby effectively mitigating the effect of the nonradiative recombination defects. Simulation results show that the optoelectronic characteristics of the step-ridge TL are far better than those of the conventional deep-ridge TL, and the current amplification factor of the step-ridge TL is not affected by the laser excitation. This structure provides a new option for the simultaneous enhancement of the optoelectronic performance of TLs.","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":"46 7","pages":"1071-1074"},"PeriodicalIF":4.1000,"publicationDate":"2025-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"InGaAlAs/InP MQW Transistor Lasers Based on Step-Ridge Waveguides\",\"authors\":\"Yijia Liu;Lijun Qiao;Xin Tang;Song Liang;Mingjiang Zhang\",\"doi\":\"10.1109/LED.2025.3563705\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We propose and numerically investigate a new step-ridge-waveguide InGaAlAs/InP multi-quantum well (MQW) transistor laser (TL). The carrier nonradiative recombination centers caused by the exposed deep-ridge waveguide sidewall significantly degrade the optoelectronic performance of the TLs. The step-ridge-waveguide structure guides carriers through the center portion of the ridge waveguide, thereby effectively mitigating the effect of the nonradiative recombination defects. Simulation results show that the optoelectronic characteristics of the step-ridge TL are far better than those of the conventional deep-ridge TL, and the current amplification factor of the step-ridge TL is not affected by the laser excitation. This structure provides a new option for the simultaneous enhancement of the optoelectronic performance of TLs.\",\"PeriodicalId\":13198,\"journal\":{\"name\":\"IEEE Electron Device Letters\",\"volume\":\"46 7\",\"pages\":\"1071-1074\"},\"PeriodicalIF\":4.1000,\"publicationDate\":\"2025-04-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Electron Device Letters\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10974969/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10974969/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
InGaAlAs/InP MQW Transistor Lasers Based on Step-Ridge Waveguides
We propose and numerically investigate a new step-ridge-waveguide InGaAlAs/InP multi-quantum well (MQW) transistor laser (TL). The carrier nonradiative recombination centers caused by the exposed deep-ridge waveguide sidewall significantly degrade the optoelectronic performance of the TLs. The step-ridge-waveguide structure guides carriers through the center portion of the ridge waveguide, thereby effectively mitigating the effect of the nonradiative recombination defects. Simulation results show that the optoelectronic characteristics of the step-ridge TL are far better than those of the conventional deep-ridge TL, and the current amplification factor of the step-ridge TL is not affected by the laser excitation. This structure provides a new option for the simultaneous enhancement of the optoelectronic performance of TLs.
期刊介绍:
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.