反光镜辅助数字图像相关多视点测量的高精度标定方法

IF 5.2 2区 工程技术 Q1 ENGINEERING, MULTIDISCIPLINARY
Pengxiang Ge , Xizuo Dan , Haoyu Wang , Haoran Gao , Yonghong Wang , Guihua Li
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引用次数: 0

摘要

平面镜辅助数字图像相关(DIC)技术为多视点测量提供了便利,但平面镜利用率低、镜面污染、标定精度低等问题阻碍了该技术的发展。为了解决这些问题,提出了一种采用量块和荧光斑的高精度校准方法。该方法通过量块前后工作面上的荧光斑建立了关于平面镜的对称关系。此外,在坐标变换过程中,测量块还用于标定平面镜姿态的精度。为了验证该方法的性能,进行了复杂表面形貌重建实验、动态实验和对比分析。结果表明,标定后的平面镜(尺寸:150×150×1.5 mm)重建精度比直接重建的DIC精度提高了0.08 mm,动态和静态测量精度均有显著提高。该方法标定精度高,操作方便,在平面反射镜辅助光学测量中具有很大的应用潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High-precision calibration method for the multiview measurement of the mirror–assisted digital image correlation
The plane mirror-assisted digital image correlation (DIC) technique facilitates multiview measurement, but the technology is hindered by low utilization of the plane mirror, contamination of mirror surfaces, and low calibration accuracy. To address these issues, a high-precision calibration method that employs a gauge block and fluorescent speckles has been proposed. The method establishes a symmetric relationship about the plane mirror through the fluorescent speckles on the front and rear working surfaces of the gauge block. Additionally, the gauge block is also used to calibrate the accuracy of the posture of the plane mirror during the coordinate transformation process. To verify the performance of the method, morphology reconstruction experiments of complex surfaces, dynamic experiments, and comparative analysis are performed. The results show that the reconstruction accuracy of the plane mirror (size:150×150×1.5 mm) after calibration was improved by 0.08 mm over the direct reconstruction accuracy of the DIC, with significant improvements in both dynamic and static measurement accuracy. With high calibration accuracy and convenient operation, this method shows great potential for application in plane mirror-assisted optical measurements.
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来源期刊
Measurement
Measurement 工程技术-工程:综合
CiteScore
10.20
自引率
12.50%
发文量
1589
审稿时长
12.1 months
期刊介绍: Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.
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