利用多尺度建模探索后部电力输送网络(BSPDN)系统的高效热管理解决方案

IF 3 3区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Feifan Xie;Tiwei Wei
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引用次数: 0

摘要

后端供电网络(BSPDN)被视为下一代芯片设计的变革性技术。然而,与传统的前端电力输送网络(FSPDN)相比,它引入了显著的热挑战。对CPU热点区域的建模分析表明,BSPDN产生的温度比FSPDN高约45%。为了解决这些热挑战,我们系统地探索了传导和对流冷却解决方案。这些包括使用具有导热系数的先进键合界面[范围从0.2到1000 W/(m $\cdot $ K)],各种后端线(BEOL)层配置(堆叠,交错和隔离),先进的BEOL金属材料(如Cu, Ru和Co互连),以及在后端金属(BSM)区域内嵌入微通道冷却,以有效地将热量散发到底部基板。微通道设计的灵感来自于气隙beol结构和尖端的3-D歧管微通道冷却器之间的几何相似性。为了解决BSPDN系统中多尺度(从20 nm到100~ $100 μ $ m)和多物理场(热动力学和流体动力学)模拟所带来的建模挑战,我们采用了IMEC提出的集成建模框架。该框架作为研究工具,支持我们深入的热解决方案探索和分析。为了研究BEOL的有效性质,采用$1\ × 1~\mu\ mathm {m}^{2}$的小尺度模型提取了8层Mint-M8 BEOL的等效导热系数,并将其应用于不同BEOL互连结构下的热分析。材料矩阵研究采用$0.12\ × 0.12~\mu\ mathm {m}^{2}$模型,其中包含Mint-M3。为了进行热点分析,我们使用了一个更大的$10\ × 25~\mu\ mathm {m}^{2}$模型来生成温度分布图,并对不同的散热材料和嵌入的微通道冷却参数进行了研究。这些提出的解决方案有望显著提高BSPDN的热性能。最终,本文旨在为BSPDN架构提供一套全面的热设计指南,以提高先进技术节点的芯片功率、性能和面积(PPA)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Exploring Efficient Thermal Management Solutions for Backside Power Delivery Network (BSPDN) Systems Using Multiscale Modeling
The backside power delivery network (BSPDN) is seen as a transformative technology for the next generation of chip designs. However, it introduces significant thermal challenges compared to the conventional frontside power delivery network (FSPDN). Modeling analysis of CPU hotspot areas indicates that BSPDN results in temperatures approximately 45% higher than FSPDN. To address these thermal challenges, we have systematically explored both conduction and convection cooling solutions. These include the use of advanced bonding interfaces with thermal conductivity [ranging from 0.2 to 1000 W/(m $\cdot $ K)], various back end of line (BEOL) layer configurations (stacked, staggered, and isolated), advanced BEOL metal materials (such as Cu, Ru, and Co interconnects), and embedded microchannel cooling within the backside metal (BSM) region to effectively dissipate heat toward the bottom substrate. The microchannel design is inspired by the geometric similarities between the airgap-BEOL structure and cutting-edge 3-D manifold microchannel coolers. To address the modeling challenges posed by the multiscale (ranging from 20 nm to $100~\mu $ m) and multiphysics (thermal and fluid dynamics) simulations within the BSPDN system, we have adopted an integrated modeling framework proposed by IMEC. This framework serves as a research tool to support our in-depth thermal solution exploration and analysis. For studying the effective BEOL properties, a small-scale model of $1\times 1~\mu\mathrm{m}^{2}$ is used to extract the equivalent thermal conductivity of an eight-layer Mint-M8 BEOL, which is then applied for thermal analysis under different BEOL interconnect configurations. A $0.12\times 0.12~\mu\mathrm{m}^{2}$ model containing Mint-M3 is employed for material matrix studies. For hotspot analysis, a larger $10\times 25~\mu\mathrm{m}^{2}$ model is used to generate temperature distribution maps with various heat-spreading materials and embedded microchannel cooling parameter investigations. These proposed solutions are expected to significantly enhance the thermal performance of BSPDN. Ultimately, this article aims to provide a comprehensive set of thermal design guidelines for the BSPDN architecture, advancing chip power, performance, and area (PPA) in advanced technology nodes.
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来源期刊
IEEE Transactions on Components, Packaging and Manufacturing Technology
IEEE Transactions on Components, Packaging and Manufacturing Technology ENGINEERING, MANUFACTURING-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
4.70
自引率
13.60%
发文量
203
审稿时长
3 months
期刊介绍: IEEE Transactions on Components, Packaging, and Manufacturing Technology publishes research and application articles on modeling, design, building blocks, technical infrastructure, and analysis underpinning electronic, photonic and MEMS packaging, in addition to new developments in passive components, electrical contacts and connectors, thermal management, and device reliability; as well as the manufacture of electronics parts and assemblies, with broad coverage of design, factory modeling, assembly methods, quality, product robustness, and design-for-environment.
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