{"title":"用于13.5 nm辐射探测的硅雪崩光电二极管","authors":"P.N. Aruev , P.S. Butorin , V.V. Zabrodskii , A.V. Nikolaev , M.E. Sasin , A.S. Shashkina , E.V. Sherstnev","doi":"10.1016/j.measurement.2025.118162","DOIUrl":null,"url":null,"abstract":"<div><div>The characteristics of a silicon avalanche photodiode with a 340 μm active region diameter were studied by femtosecond laser pulses with wavelengths of 500, 600, 800 and 1000 nm and a nanosecond EUV source with a wavelength of 13.5 nm. It is shown that the dynamics of the avalanche photodiode photoresponse integral for a wavelength of 13.5 nm is similar to the dynamics for the 500 nm. Avalanche photodiode has a rise time within 135 ps and a fall time within 280 ps in the case of 500 nm wavelength, at a reverse bias voltage range between 240 V and 260 V. The presented avalanche photodiode matches subnanosecond time resolution limitations for studying radiation sources with a wavelength of 13.5 nm.</div></div>","PeriodicalId":18349,"journal":{"name":"Measurement","volume":"256 ","pages":"Article 118162"},"PeriodicalIF":5.2000,"publicationDate":"2025-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Silicon avalanche photodiode for 13.5 nm radiation detection\",\"authors\":\"P.N. Aruev , P.S. Butorin , V.V. Zabrodskii , A.V. Nikolaev , M.E. Sasin , A.S. Shashkina , E.V. Sherstnev\",\"doi\":\"10.1016/j.measurement.2025.118162\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>The characteristics of a silicon avalanche photodiode with a 340 μm active region diameter were studied by femtosecond laser pulses with wavelengths of 500, 600, 800 and 1000 nm and a nanosecond EUV source with a wavelength of 13.5 nm. It is shown that the dynamics of the avalanche photodiode photoresponse integral for a wavelength of 13.5 nm is similar to the dynamics for the 500 nm. Avalanche photodiode has a rise time within 135 ps and a fall time within 280 ps in the case of 500 nm wavelength, at a reverse bias voltage range between 240 V and 260 V. The presented avalanche photodiode matches subnanosecond time resolution limitations for studying radiation sources with a wavelength of 13.5 nm.</div></div>\",\"PeriodicalId\":18349,\"journal\":{\"name\":\"Measurement\",\"volume\":\"256 \",\"pages\":\"Article 118162\"},\"PeriodicalIF\":5.2000,\"publicationDate\":\"2025-06-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Measurement\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0263224125015210\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Measurement","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0263224125015210","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, MULTIDISCIPLINARY","Score":null,"Total":0}
Silicon avalanche photodiode for 13.5 nm radiation detection
The characteristics of a silicon avalanche photodiode with a 340 μm active region diameter were studied by femtosecond laser pulses with wavelengths of 500, 600, 800 and 1000 nm and a nanosecond EUV source with a wavelength of 13.5 nm. It is shown that the dynamics of the avalanche photodiode photoresponse integral for a wavelength of 13.5 nm is similar to the dynamics for the 500 nm. Avalanche photodiode has a rise time within 135 ps and a fall time within 280 ps in the case of 500 nm wavelength, at a reverse bias voltage range between 240 V and 260 V. The presented avalanche photodiode matches subnanosecond time resolution limitations for studying radiation sources with a wavelength of 13.5 nm.
期刊介绍:
Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.