S.D.M. de Jong , A.G. Ghezeljehmeidan , W.D. van Driel
{"title":"利用物理信息的机器学习进行焊点可靠性预测","authors":"S.D.M. de Jong , A.G. Ghezeljehmeidan , W.D. van Driel","doi":"10.1016/j.microrel.2025.115797","DOIUrl":null,"url":null,"abstract":"<div><div>The reliability of solder joints plays an increasingly important role in power electronics. The thermal fatigue experienced due to the temperature fluctuations cause catastrophic failures. However, the ability to predict the fatigue for different thermal cycles is lacking. Experimental or simulation based approaches are typically too expensive to be conducted for a wide range of thermal loading conditions. A physics informed Long Short-Term Memory (PI-LSTM) is proposed here for predicting the plastic strain and related fatigue lifetime in solder joints. The LSTM model is trained on data generated by FEM simulations, enhanced by incorporating the flow rule into the loss function. The PI-LSTM accurately predicts the plastic strain and the stress components, enabling efficient reliability predictions. Using different reliability models, the estimated cycles to failure are found to be in close agreement with those from conventional FEM simulations, demonstrating the PI-LSTM’s capability for reliability assessments.</div></div>","PeriodicalId":51131,"journal":{"name":"Microelectronics Reliability","volume":"172 ","pages":"Article 115797"},"PeriodicalIF":1.9000,"publicationDate":"2025-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Solder joint reliability predictions using physics-informed machine learning\",\"authors\":\"S.D.M. de Jong , A.G. Ghezeljehmeidan , W.D. van Driel\",\"doi\":\"10.1016/j.microrel.2025.115797\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>The reliability of solder joints plays an increasingly important role in power electronics. The thermal fatigue experienced due to the temperature fluctuations cause catastrophic failures. However, the ability to predict the fatigue for different thermal cycles is lacking. Experimental or simulation based approaches are typically too expensive to be conducted for a wide range of thermal loading conditions. A physics informed Long Short-Term Memory (PI-LSTM) is proposed here for predicting the plastic strain and related fatigue lifetime in solder joints. The LSTM model is trained on data generated by FEM simulations, enhanced by incorporating the flow rule into the loss function. The PI-LSTM accurately predicts the plastic strain and the stress components, enabling efficient reliability predictions. Using different reliability models, the estimated cycles to failure are found to be in close agreement with those from conventional FEM simulations, demonstrating the PI-LSTM’s capability for reliability assessments.</div></div>\",\"PeriodicalId\":51131,\"journal\":{\"name\":\"Microelectronics Reliability\",\"volume\":\"172 \",\"pages\":\"Article 115797\"},\"PeriodicalIF\":1.9000,\"publicationDate\":\"2025-06-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microelectronics Reliability\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0026271425002100\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Reliability","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0026271425002100","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Solder joint reliability predictions using physics-informed machine learning
The reliability of solder joints plays an increasingly important role in power electronics. The thermal fatigue experienced due to the temperature fluctuations cause catastrophic failures. However, the ability to predict the fatigue for different thermal cycles is lacking. Experimental or simulation based approaches are typically too expensive to be conducted for a wide range of thermal loading conditions. A physics informed Long Short-Term Memory (PI-LSTM) is proposed here for predicting the plastic strain and related fatigue lifetime in solder joints. The LSTM model is trained on data generated by FEM simulations, enhanced by incorporating the flow rule into the loss function. The PI-LSTM accurately predicts the plastic strain and the stress components, enabling efficient reliability predictions. Using different reliability models, the estimated cycles to failure are found to be in close agreement with those from conventional FEM simulations, demonstrating the PI-LSTM’s capability for reliability assessments.
期刊介绍:
Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.
Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.