基于纵横比的激光金属沉积过程中连续单层最优重叠率和最优重叠高度的广义预测模型

IF 4.6 2区 物理与天体物理 Q1 OPTICS
Enjie Dong , Tingyu Chang , Gan Li , Ze Liu , Liming Xia , Linjie Zhao , Junwen Lu , Jiaxuan Chen , Mingjun Chen , Jian Cheng
{"title":"基于纵横比的激光金属沉积过程中连续单层最优重叠率和最优重叠高度的广义预测模型","authors":"Enjie Dong ,&nbsp;Tingyu Chang ,&nbsp;Gan Li ,&nbsp;Ze Liu ,&nbsp;Liming Xia ,&nbsp;Linjie Zhao ,&nbsp;Junwen Lu ,&nbsp;Jiaxuan Chen ,&nbsp;Mingjun Chen ,&nbsp;Jian Cheng","doi":"10.1016/j.optlastec.2025.113364","DOIUrl":null,"url":null,"abstract":"<div><div>The surface flatness of single-layer islands deposition is essential for high-quality multi-layer component deposition and the stability of the Laser metal deposition (LMD) manufacturing process. The aspect ratio of single-track deposition and the overlap rate are critical factors influencing the flatness of single-layer island deposition. Existing methods for determining the optimal overlap rate, whether through experimental approaches or simplified recursive overlap models, still suffer from long development cycles and limited accuracy. In this study, a generalized, efficient and reliable model for predicting the optimal overlap rate only using the aspect ratio of the single-track deposition as the input parameter was developed after fully understanding the influence of the aspect ratio and overlap rate on the morphology, stacking effect and flatness of single-layer islands. Besides, a prediction model for the height of the single-layer island, based on the input parameters of the aspect ratio and the overlap rate has also been developed. Further, verification datasets from different experimental batches and materials were used to validate the accuracy and generalizability of the island height prediction model. The validation results indicated that the relative error between the predicted and actual values was less than 10%. The single-track aspect ratio can be directly used to guide the LMD multi-layer component deposition, regardless of the combination of powder and substrate materials, using these reliable and generalized prediction models for the optimal overlap rate and the island height developed in current study. The single-layer island deposition stage was completely eliminated, thereby significantly shorten the development cycle and reduce the cost of LMD process parameter development.</div></div>","PeriodicalId":19511,"journal":{"name":"Optics and Laser Technology","volume":"191 ","pages":"Article 113364"},"PeriodicalIF":4.6000,"publicationDate":"2025-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A generalized model for predicting the optimal overlap rate and height of successive single-layer involved in laser metal deposition process based on the aspect ratio\",\"authors\":\"Enjie Dong ,&nbsp;Tingyu Chang ,&nbsp;Gan Li ,&nbsp;Ze Liu ,&nbsp;Liming Xia ,&nbsp;Linjie Zhao ,&nbsp;Junwen Lu ,&nbsp;Jiaxuan Chen ,&nbsp;Mingjun Chen ,&nbsp;Jian Cheng\",\"doi\":\"10.1016/j.optlastec.2025.113364\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>The surface flatness of single-layer islands deposition is essential for high-quality multi-layer component deposition and the stability of the Laser metal deposition (LMD) manufacturing process. The aspect ratio of single-track deposition and the overlap rate are critical factors influencing the flatness of single-layer island deposition. Existing methods for determining the optimal overlap rate, whether through experimental approaches or simplified recursive overlap models, still suffer from long development cycles and limited accuracy. In this study, a generalized, efficient and reliable model for predicting the optimal overlap rate only using the aspect ratio of the single-track deposition as the input parameter was developed after fully understanding the influence of the aspect ratio and overlap rate on the morphology, stacking effect and flatness of single-layer islands. Besides, a prediction model for the height of the single-layer island, based on the input parameters of the aspect ratio and the overlap rate has also been developed. Further, verification datasets from different experimental batches and materials were used to validate the accuracy and generalizability of the island height prediction model. The validation results indicated that the relative error between the predicted and actual values was less than 10%. The single-track aspect ratio can be directly used to guide the LMD multi-layer component deposition, regardless of the combination of powder and substrate materials, using these reliable and generalized prediction models for the optimal overlap rate and the island height developed in current study. The single-layer island deposition stage was completely eliminated, thereby significantly shorten the development cycle and reduce the cost of LMD process parameter development.</div></div>\",\"PeriodicalId\":19511,\"journal\":{\"name\":\"Optics and Laser Technology\",\"volume\":\"191 \",\"pages\":\"Article 113364\"},\"PeriodicalIF\":4.6000,\"publicationDate\":\"2025-06-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optics and Laser Technology\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0030399225009557\",\"RegionNum\":2,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"OPTICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optics and Laser Technology","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0030399225009557","RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"OPTICS","Score":null,"Total":0}
引用次数: 0

摘要

单层岛状沉积的表面平整度对于高质量的多层构件沉积和激光金属沉积(LMD)制造工艺的稳定性至关重要。单道沉积的纵横比和重叠率是影响单层岛状沉积平整度的关键因素。现有的确定最优重叠率的方法,无论是通过实验方法还是简化的递归重叠模型,都存在开发周期长、精度有限的问题。本研究在充分了解长径比和重叠率对单层岛的形貌、叠加效果和平整度的影响后,建立了一种广义、高效、可靠的单道沉积长径比作为输入参数预测最佳重叠率的模型。此外,还建立了基于纵横比和重叠率输入参数的单层岛高度预测模型。利用不同实验批次和不同材料的验证数据,验证了岛屿高度预测模型的准确性和通用性。验证结果表明,预测值与实测值的相对误差小于10%。单径高比可以直接指导LMD多层组件的沉积,而不考虑粉末和衬底材料的组合,使用这些可靠的、广义的预测模型来预测当前研究中开发的最优重叠率和岛高。完全消除了单层岛状沉积阶段,从而大大缩短了开发周期,降低了LMD工艺参数开发成本。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A generalized model for predicting the optimal overlap rate and height of successive single-layer involved in laser metal deposition process based on the aspect ratio
The surface flatness of single-layer islands deposition is essential for high-quality multi-layer component deposition and the stability of the Laser metal deposition (LMD) manufacturing process. The aspect ratio of single-track deposition and the overlap rate are critical factors influencing the flatness of single-layer island deposition. Existing methods for determining the optimal overlap rate, whether through experimental approaches or simplified recursive overlap models, still suffer from long development cycles and limited accuracy. In this study, a generalized, efficient and reliable model for predicting the optimal overlap rate only using the aspect ratio of the single-track deposition as the input parameter was developed after fully understanding the influence of the aspect ratio and overlap rate on the morphology, stacking effect and flatness of single-layer islands. Besides, a prediction model for the height of the single-layer island, based on the input parameters of the aspect ratio and the overlap rate has also been developed. Further, verification datasets from different experimental batches and materials were used to validate the accuracy and generalizability of the island height prediction model. The validation results indicated that the relative error between the predicted and actual values was less than 10%. The single-track aspect ratio can be directly used to guide the LMD multi-layer component deposition, regardless of the combination of powder and substrate materials, using these reliable and generalized prediction models for the optimal overlap rate and the island height developed in current study. The single-layer island deposition stage was completely eliminated, thereby significantly shorten the development cycle and reduce the cost of LMD process parameter development.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
CiteScore
8.50
自引率
10.00%
发文量
1060
审稿时长
3.4 months
期刊介绍: Optics & Laser Technology aims to provide a vehicle for the publication of a broad range of high quality research and review papers in those fields of scientific and engineering research appertaining to the development and application of the technology of optics and lasers. Papers describing original work in these areas are submitted to rigorous refereeing prior to acceptance for publication. The scope of Optics & Laser Technology encompasses, but is not restricted to, the following areas: •development in all types of lasers •developments in optoelectronic devices and photonics •developments in new photonics and optical concepts •developments in conventional optics, optical instruments and components •techniques of optical metrology, including interferometry and optical fibre sensors •LIDAR and other non-contact optical measurement techniques, including optical methods in heat and fluid flow •applications of lasers to materials processing, optical NDT display (including holography) and optical communication •research and development in the field of laser safety including studies of hazards resulting from the applications of lasers (laser safety, hazards of laser fume) •developments in optical computing and optical information processing •developments in new optical materials •developments in new optical characterization methods and techniques •developments in quantum optics •developments in light assisted micro and nanofabrication methods and techniques •developments in nanophotonics and biophotonics •developments in imaging processing and systems
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信