磁耦合谐振无线输电系统：故障诊断方法综述

IF 2.3 3区工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Transactions on Device and Materials Reliability Pub Date : 2025-04-07 DOI:10.1109/TDMR.2025.3558283

Fengchuan Wang;Cheng Chen;Zhihao Ye;Qikai Fang;Gang Yang

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引用次数: 0

摘要

无线电力传输（WPT）技术发展迅速，前景广阔。然而，由于电力电子设备的老化和失效，其系统容易发生故障，因此研究有效的故障诊断和预测方法对系统的稳定运行至关重要。本文首先介绍了WPT系统中典型器件的外老化输出特性。其次，综述了WPT系统现有的故障诊断方法和可借鉴的典型电力电子故障诊断与预测方法，并对这些方法在WPT系统中的应用进行了评价。最后，展望了WPT故障诊断与预测技术的未来发展趋势。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Magnetically Coupled Resonant Wireless Power Transmission System: A Review of Fault Diagnosis Methods

Wireless power transmission (WPT) technology is rapidly evolving and promising. However, its system is prone to fault due to aging and failure of power electronic devices, so the study of effective fault diagnosis and prediction methods is crucial for stable operation of the system. In this paper, the external aging output characteristics of typical devices in WPT system are firstly introduced. Secondly, the existing fault diagnosis methods of WPT system and the typical power electronics fault diagnosis and prediction methods that can be learned from are reviewed, while the application of these methods in WPT system is evaluated. Finally, the future development trend of WPT fault diagnosis and prediction technology is outlooked.

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来源期刊

IEEE Transactions on Device and Materials Reliability 工程技术-工程：电子与电气

CiteScore

4.80

自引率

5.00%

发文量

审稿时长

6-12 weeks

期刊介绍： The scope of the publication includes, but is not limited to Reliability of: Devices, Materials, Processes, Interfaces, Integrated Microsystems (including MEMS & Sensors), Transistors, Technology (CMOS, BiCMOS, etc.), Integrated Circuits (IC, SSI, MSI, LSI, ULSI, ELSI, etc.), Thin Film Transistor Applications. The measurement and understanding of the reliability of such entities at each phase, from the concept stage through research and development and into manufacturing scale-up, provides the overall database on the reliability of the devices, materials, processes, package and other necessities for the successful introduction of a product to market. This reliability database is the foundation for a quality product, which meets customer expectation. A product so developed has high reliability. High quality will be achieved because product weaknesses will have been found (root cause analysis) and designed out of the final product. This process of ever increasing reliability and quality will result in a superior product. In the end, reliability and quality are not one thing; but in a sense everything, which can be or has to be done to guarantee that the product successfully performs in the field under customer conditions. Our goal is to capture these advances. An additional objective is to focus cross fertilized communication in the state of the art of reliability of electronic materials and devices and provide fundamental understanding of basic phenomena that affect reliability. In addition, the publication is a forum for interdisciplinary studies on reliability. An overall goal is to provide leading edge/state of the art information, which is critically relevant to the creation of reliable products.