{"title":"镀金属铝表面银烧结键合的热冲击可靠性","authors":"Lisheng Wang;Gert Rietveld;Raymond J. E. Hueting","doi":"10.1109/TDMR.2025.3554369","DOIUrl":null,"url":null,"abstract":"Silver (Ag) sintering is becoming more critical for future wide bandgap (WBG) power module substrate attachments. However, sintered Ag joints with plated aluminum (Al) heatsinks and directly bonded aluminum (DBA) substrates presently suffer from poor reliability. To resolve this problem, this work studies the reliability of plated (Nickel) Ni/Ag metallization on Al for sintered Ag joints and proposes a new plated Ni/Copper (Cu)/Ag metallization stack for improved reliability. The shear strength and thermal shock (TS) reliability of the sintered Ag joints for different metallization layers are studied, and microstructural and elemental analyses were performed to analyze the failure modes. The results show that the reliability of the sintered Ag joints by the traditional Ni/Ag metallization is rather limited because of poor adhesion between Ni and Ag. In contrast, the shear strength of the new Ni/Cu/Ag metallized sintered Ag joints is consistently above 40 MPa up to 500 TS cycles, with the dominant failure modes formed by Al/Ni delamination and cohesive failure. Preparing sintered Ag joints with the Ni/Cu/Ag metallization with longer sintering times removed the unwanted delamination failure mode and only left the preferred cohesive failure mode; moreover, the shear strength improved significantly, with values reaching 130 MPa. Furthermore, a new failure mode appears in the sintered Ag joint of the Ni/Cu/Ag stack, implying that the Al/Ni metallization weakness there is less of a limiting factor. This proves that our new metallization stack resolves present delamination issues in Ag sintered joints with Al heatsinks and DBA substrates and thereby supports exploiting the full potential of sintered Ag joints.","PeriodicalId":448,"journal":{"name":"IEEE Transactions on Device and Materials Reliability","volume":"25 2","pages":"203-211"},"PeriodicalIF":2.3000,"publicationDate":"2025-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Thermal Shock Reliability of Silver-Sintered Bonding of Metal-Plated Aluminum Surfaces\",\"authors\":\"Lisheng Wang;Gert Rietveld;Raymond J. E. Hueting\",\"doi\":\"10.1109/TDMR.2025.3554369\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Silver (Ag) sintering is becoming more critical for future wide bandgap (WBG) power module substrate attachments. However, sintered Ag joints with plated aluminum (Al) heatsinks and directly bonded aluminum (DBA) substrates presently suffer from poor reliability. To resolve this problem, this work studies the reliability of plated (Nickel) Ni/Ag metallization on Al for sintered Ag joints and proposes a new plated Ni/Copper (Cu)/Ag metallization stack for improved reliability. The shear strength and thermal shock (TS) reliability of the sintered Ag joints for different metallization layers are studied, and microstructural and elemental analyses were performed to analyze the failure modes. The results show that the reliability of the sintered Ag joints by the traditional Ni/Ag metallization is rather limited because of poor adhesion between Ni and Ag. In contrast, the shear strength of the new Ni/Cu/Ag metallized sintered Ag joints is consistently above 40 MPa up to 500 TS cycles, with the dominant failure modes formed by Al/Ni delamination and cohesive failure. Preparing sintered Ag joints with the Ni/Cu/Ag metallization with longer sintering times removed the unwanted delamination failure mode and only left the preferred cohesive failure mode; moreover, the shear strength improved significantly, with values reaching 130 MPa. Furthermore, a new failure mode appears in the sintered Ag joint of the Ni/Cu/Ag stack, implying that the Al/Ni metallization weakness there is less of a limiting factor. This proves that our new metallization stack resolves present delamination issues in Ag sintered joints with Al heatsinks and DBA substrates and thereby supports exploiting the full potential of sintered Ag joints.\",\"PeriodicalId\":448,\"journal\":{\"name\":\"IEEE Transactions on Device and Materials Reliability\",\"volume\":\"25 2\",\"pages\":\"203-211\"},\"PeriodicalIF\":2.3000,\"publicationDate\":\"2025-03-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Device and Materials Reliability\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10938272/\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Device and Materials Reliability","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10938272/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Thermal Shock Reliability of Silver-Sintered Bonding of Metal-Plated Aluminum Surfaces
Silver (Ag) sintering is becoming more critical for future wide bandgap (WBG) power module substrate attachments. However, sintered Ag joints with plated aluminum (Al) heatsinks and directly bonded aluminum (DBA) substrates presently suffer from poor reliability. To resolve this problem, this work studies the reliability of plated (Nickel) Ni/Ag metallization on Al for sintered Ag joints and proposes a new plated Ni/Copper (Cu)/Ag metallization stack for improved reliability. The shear strength and thermal shock (TS) reliability of the sintered Ag joints for different metallization layers are studied, and microstructural and elemental analyses were performed to analyze the failure modes. The results show that the reliability of the sintered Ag joints by the traditional Ni/Ag metallization is rather limited because of poor adhesion between Ni and Ag. In contrast, the shear strength of the new Ni/Cu/Ag metallized sintered Ag joints is consistently above 40 MPa up to 500 TS cycles, with the dominant failure modes formed by Al/Ni delamination and cohesive failure. Preparing sintered Ag joints with the Ni/Cu/Ag metallization with longer sintering times removed the unwanted delamination failure mode and only left the preferred cohesive failure mode; moreover, the shear strength improved significantly, with values reaching 130 MPa. Furthermore, a new failure mode appears in the sintered Ag joint of the Ni/Cu/Ag stack, implying that the Al/Ni metallization weakness there is less of a limiting factor. This proves that our new metallization stack resolves present delamination issues in Ag sintered joints with Al heatsinks and DBA substrates and thereby supports exploiting the full potential of sintered Ag joints.
期刊介绍:
The scope of the publication includes, but is not limited to Reliability of: Devices, Materials, Processes, Interfaces, Integrated Microsystems (including MEMS & Sensors), Transistors, Technology (CMOS, BiCMOS, etc.), Integrated Circuits (IC, SSI, MSI, LSI, ULSI, ELSI, etc.), Thin Film Transistor Applications. The measurement and understanding of the reliability of such entities at each phase, from the concept stage through research and development and into manufacturing scale-up, provides the overall database on the reliability of the devices, materials, processes, package and other necessities for the successful introduction of a product to market. This reliability database is the foundation for a quality product, which meets customer expectation. A product so developed has high reliability. High quality will be achieved because product weaknesses will have been found (root cause analysis) and designed out of the final product. This process of ever increasing reliability and quality will result in a superior product. In the end, reliability and quality are not one thing; but in a sense everything, which can be or has to be done to guarantee that the product successfully performs in the field under customer conditions. Our goal is to capture these advances. An additional objective is to focus cross fertilized communication in the state of the art of reliability of electronic materials and devices and provide fundamental understanding of basic phenomena that affect reliability. In addition, the publication is a forum for interdisciplinary studies on reliability. An overall goal is to provide leading edge/state of the art information, which is critically relevant to the creation of reliable products.