Manh The Nguyen , In-Kyu Park , Hyug-Gyo Rhee , Young-Sik Ghim
{"title":"基于深度学习的条纹穿透误差和噪声去除的动态移相干涉测量","authors":"Manh The Nguyen , In-Kyu Park , Hyug-Gyo Rhee , Young-Sik Ghim","doi":"10.1016/j.optlastec.2025.113313","DOIUrl":null,"url":null,"abstract":"<div><div>High-speed and precise surface measurement is crucial in manufacturing, particularly in the semiconductor industry. Dynamic phase-shifting interferometry is a highly efficient and widely recognized optical metrology technique, known for its exceptional accuracy and speed, making it ideal for industrial inspection and measurement tasks. However, incorrect phase-shift intervals between interferograms generated by this technique can lead to fringe-print-through (FPT) errors in the surface measurements. Additionally, additive Gaussian noise present in the interferograms complicates the accurate assessment of residual surface after measurements. Rapidly eliminating these FPT errors and noise is essential for achieving high-accuracy and high-speed measurement applications. In this paper, we propose a novel deep-learning method to simultaneously eliminate FPT errors and noise in dynamic phase-shifting interferometry. Our approach utilizes a UNet++ deep-learning network, which processes the surface phase containing errors as input and outputs the corresponding FPT errors and noise. Trained on simulated data, the model learns to directly predict these errors and noise from the surface phase with errors. Consequently, the corrected surface phase is obtained by subtracting the predicted FPT errors and noise from the initial surface phase. Simulation and experimental results demonstrate that our deep-learning method effectively removes FPT errors and noise, providing broad versatility, rapid processing, and robustness, thereby significantly enhancing measurement accuracy in dynamic measurement applications.</div></div>","PeriodicalId":19511,"journal":{"name":"Optics and Laser Technology","volume":"191 ","pages":"Article 113313"},"PeriodicalIF":4.6000,"publicationDate":"2025-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Deep-learning based fringe-print-through error and noise removal for dynamic phase-shifting interferometry\",\"authors\":\"Manh The Nguyen , In-Kyu Park , Hyug-Gyo Rhee , Young-Sik Ghim\",\"doi\":\"10.1016/j.optlastec.2025.113313\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>High-speed and precise surface measurement is crucial in manufacturing, particularly in the semiconductor industry. Dynamic phase-shifting interferometry is a highly efficient and widely recognized optical metrology technique, known for its exceptional accuracy and speed, making it ideal for industrial inspection and measurement tasks. However, incorrect phase-shift intervals between interferograms generated by this technique can lead to fringe-print-through (FPT) errors in the surface measurements. Additionally, additive Gaussian noise present in the interferograms complicates the accurate assessment of residual surface after measurements. Rapidly eliminating these FPT errors and noise is essential for achieving high-accuracy and high-speed measurement applications. In this paper, we propose a novel deep-learning method to simultaneously eliminate FPT errors and noise in dynamic phase-shifting interferometry. Our approach utilizes a UNet++ deep-learning network, which processes the surface phase containing errors as input and outputs the corresponding FPT errors and noise. Trained on simulated data, the model learns to directly predict these errors and noise from the surface phase with errors. Consequently, the corrected surface phase is obtained by subtracting the predicted FPT errors and noise from the initial surface phase. Simulation and experimental results demonstrate that our deep-learning method effectively removes FPT errors and noise, providing broad versatility, rapid processing, and robustness, thereby significantly enhancing measurement accuracy in dynamic measurement applications.</div></div>\",\"PeriodicalId\":19511,\"journal\":{\"name\":\"Optics and Laser Technology\",\"volume\":\"191 \",\"pages\":\"Article 113313\"},\"PeriodicalIF\":4.6000,\"publicationDate\":\"2025-06-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optics and Laser Technology\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0030399225009041\",\"RegionNum\":2,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"OPTICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optics and Laser Technology","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0030399225009041","RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"OPTICS","Score":null,"Total":0}
Deep-learning based fringe-print-through error and noise removal for dynamic phase-shifting interferometry
High-speed and precise surface measurement is crucial in manufacturing, particularly in the semiconductor industry. Dynamic phase-shifting interferometry is a highly efficient and widely recognized optical metrology technique, known for its exceptional accuracy and speed, making it ideal for industrial inspection and measurement tasks. However, incorrect phase-shift intervals between interferograms generated by this technique can lead to fringe-print-through (FPT) errors in the surface measurements. Additionally, additive Gaussian noise present in the interferograms complicates the accurate assessment of residual surface after measurements. Rapidly eliminating these FPT errors and noise is essential for achieving high-accuracy and high-speed measurement applications. In this paper, we propose a novel deep-learning method to simultaneously eliminate FPT errors and noise in dynamic phase-shifting interferometry. Our approach utilizes a UNet++ deep-learning network, which processes the surface phase containing errors as input and outputs the corresponding FPT errors and noise. Trained on simulated data, the model learns to directly predict these errors and noise from the surface phase with errors. Consequently, the corrected surface phase is obtained by subtracting the predicted FPT errors and noise from the initial surface phase. Simulation and experimental results demonstrate that our deep-learning method effectively removes FPT errors and noise, providing broad versatility, rapid processing, and robustness, thereby significantly enhancing measurement accuracy in dynamic measurement applications.
期刊介绍:
Optics & Laser Technology aims to provide a vehicle for the publication of a broad range of high quality research and review papers in those fields of scientific and engineering research appertaining to the development and application of the technology of optics and lasers. Papers describing original work in these areas are submitted to rigorous refereeing prior to acceptance for publication.
The scope of Optics & Laser Technology encompasses, but is not restricted to, the following areas:
•development in all types of lasers
•developments in optoelectronic devices and photonics
•developments in new photonics and optical concepts
•developments in conventional optics, optical instruments and components
•techniques of optical metrology, including interferometry and optical fibre sensors
•LIDAR and other non-contact optical measurement techniques, including optical methods in heat and fluid flow
•applications of lasers to materials processing, optical NDT display (including holography) and optical communication
•research and development in the field of laser safety including studies of hazards resulting from the applications of lasers (laser safety, hazards of laser fume)
•developments in optical computing and optical information processing
•developments in new optical materials
•developments in new optical characterization methods and techniques
•developments in quantum optics
•developments in light assisted micro and nanofabrication methods and techniques
•developments in nanophotonics and biophotonics
•developments in imaging processing and systems