Shailendra Kumar Gupta , Durgesh C. Tripathi , Amit Kumar , Neha Garg , Chinmay K. Gupta , Vandana Yadav , Sandeep Sharma , Sanjeev Kumar , Ashish Garg
{"title":"正反体异质结有机太阳能电池中空穴传输层的作用:光强相关的电容电压分析","authors":"Shailendra Kumar Gupta , Durgesh C. Tripathi , Amit Kumar , Neha Garg , Chinmay K. Gupta , Vandana Yadav , Sandeep Sharma , Sanjeev Kumar , Ashish Garg","doi":"10.1016/j.mssp.2025.109736","DOIUrl":null,"url":null,"abstract":"<div><div>In organic solar cells (OSC) hole transport layers (HTL) are essential for boosting the power conversion efficiency (PCE); therefore, it is crucial to determine the underlying mechanisms. In the present manuscript, we report a study that examines the effects of two HTL such as PEDOT:PSS and MoO<sub>3</sub>, on the electrical characteristics of P3HT:PC<sub>61</sub>BM (active layer) based bulk heterojunction (BHJ) in normal (ITO/PEDOT:PSS/P3HT:PCBM/Al) and inverted (ITO/ZnO/P3HT:PCBM/MoO<sub>3</sub>/Ag) configurations. Current density-voltage (<em>J-V</em>) and illumination intensity dependent capacitance-voltage (<em>C-V)</em> measurements have been performed and compared for with and without HTL (PEDOT:PSS in normal and MoO<sub>3</sub> in inverted) devices. Results suggest that the extracted photovoltaic parameters (short circuit current density (<em>J</em><sub><em>sc</em></sub>), open circuit voltage (<em>V</em><sub><em>oc</em></sub>) and fill factor (<em>FF</em>)) of HTL containing devices are superior to without HTL devices in both normal and inverted OSC, due to unfavourable charge carrier accumulation and band bending in HTL free devices. Such charge build-up at active layer/anode interface generates photovoltage contributing as loss factor to PCE and has been investigated in <em>C-V</em> characteristics measured under varied illumination intensities (0/dark, 50 and 100 mWcm<sup>−2</sup>). Parameters such as built-in-voltage (V<sub><em>bi</em></sub>), effective built-in-voltage (V<sub><em>bi, eff</em></sub>), accumulated carrier concentration and surface photovoltage (V<sub><em>spv</em></sub> = V<sub><em>bi, eff</em></sub> - V<sub><em>bi</em></sub>) are extracted as a function of illumination intensity. Our findings reveal that HTL free devices, in both conventional and inverted OSCs structures, marked with low J<sub>sc</sub>, V<sub>oc</sub> and FF values generate higher <em>SPV</em>. The <em>SPV</em> calculation method used here has been proven to be crucial in recommending a suitable HTL for OSC device architectures.</div></div>","PeriodicalId":18240,"journal":{"name":"Materials Science in Semiconductor Processing","volume":"198 ","pages":"Article 109736"},"PeriodicalIF":4.6000,"publicationDate":"2025-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Role of hole transport layers in normal and inverted bulk heterojunction organic solar cells: A light intensity dependent capacitance-voltage analysis\",\"authors\":\"Shailendra Kumar Gupta , Durgesh C. Tripathi , Amit Kumar , Neha Garg , Chinmay K. Gupta , Vandana Yadav , Sandeep Sharma , Sanjeev Kumar , Ashish Garg\",\"doi\":\"10.1016/j.mssp.2025.109736\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>In organic solar cells (OSC) hole transport layers (HTL) are essential for boosting the power conversion efficiency (PCE); therefore, it is crucial to determine the underlying mechanisms. In the present manuscript, we report a study that examines the effects of two HTL such as PEDOT:PSS and MoO<sub>3</sub>, on the electrical characteristics of P3HT:PC<sub>61</sub>BM (active layer) based bulk heterojunction (BHJ) in normal (ITO/PEDOT:PSS/P3HT:PCBM/Al) and inverted (ITO/ZnO/P3HT:PCBM/MoO<sub>3</sub>/Ag) configurations. Current density-voltage (<em>J-V</em>) and illumination intensity dependent capacitance-voltage (<em>C-V)</em> measurements have been performed and compared for with and without HTL (PEDOT:PSS in normal and MoO<sub>3</sub> in inverted) devices. Results suggest that the extracted photovoltaic parameters (short circuit current density (<em>J</em><sub><em>sc</em></sub>), open circuit voltage (<em>V</em><sub><em>oc</em></sub>) and fill factor (<em>FF</em>)) of HTL containing devices are superior to without HTL devices in both normal and inverted OSC, due to unfavourable charge carrier accumulation and band bending in HTL free devices. Such charge build-up at active layer/anode interface generates photovoltage contributing as loss factor to PCE and has been investigated in <em>C-V</em> characteristics measured under varied illumination intensities (0/dark, 50 and 100 mWcm<sup>−2</sup>). Parameters such as built-in-voltage (V<sub><em>bi</em></sub>), effective built-in-voltage (V<sub><em>bi, eff</em></sub>), accumulated carrier concentration and surface photovoltage (V<sub><em>spv</em></sub> = V<sub><em>bi, eff</em></sub> - V<sub><em>bi</em></sub>) are extracted as a function of illumination intensity. Our findings reveal that HTL free devices, in both conventional and inverted OSCs structures, marked with low J<sub>sc</sub>, V<sub>oc</sub> and FF values generate higher <em>SPV</em>. The <em>SPV</em> calculation method used here has been proven to be crucial in recommending a suitable HTL for OSC device architectures.</div></div>\",\"PeriodicalId\":18240,\"journal\":{\"name\":\"Materials Science in Semiconductor Processing\",\"volume\":\"198 \",\"pages\":\"Article 109736\"},\"PeriodicalIF\":4.6000,\"publicationDate\":\"2025-06-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Materials Science in Semiconductor Processing\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S1369800125004731\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Materials Science in Semiconductor Processing","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1369800125004731","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Role of hole transport layers in normal and inverted bulk heterojunction organic solar cells: A light intensity dependent capacitance-voltage analysis
In organic solar cells (OSC) hole transport layers (HTL) are essential for boosting the power conversion efficiency (PCE); therefore, it is crucial to determine the underlying mechanisms. In the present manuscript, we report a study that examines the effects of two HTL such as PEDOT:PSS and MoO3, on the electrical characteristics of P3HT:PC61BM (active layer) based bulk heterojunction (BHJ) in normal (ITO/PEDOT:PSS/P3HT:PCBM/Al) and inverted (ITO/ZnO/P3HT:PCBM/MoO3/Ag) configurations. Current density-voltage (J-V) and illumination intensity dependent capacitance-voltage (C-V) measurements have been performed and compared for with and without HTL (PEDOT:PSS in normal and MoO3 in inverted) devices. Results suggest that the extracted photovoltaic parameters (short circuit current density (Jsc), open circuit voltage (Voc) and fill factor (FF)) of HTL containing devices are superior to without HTL devices in both normal and inverted OSC, due to unfavourable charge carrier accumulation and band bending in HTL free devices. Such charge build-up at active layer/anode interface generates photovoltage contributing as loss factor to PCE and has been investigated in C-V characteristics measured under varied illumination intensities (0/dark, 50 and 100 mWcm−2). Parameters such as built-in-voltage (Vbi), effective built-in-voltage (Vbi, eff), accumulated carrier concentration and surface photovoltage (Vspv = Vbi, eff - Vbi) are extracted as a function of illumination intensity. Our findings reveal that HTL free devices, in both conventional and inverted OSCs structures, marked with low Jsc, Voc and FF values generate higher SPV. The SPV calculation method used here has been proven to be crucial in recommending a suitable HTL for OSC device architectures.
期刊介绍:
Materials Science in Semiconductor Processing provides a unique forum for the discussion of novel processing, applications and theoretical studies of functional materials and devices for (opto)electronics, sensors, detectors, biotechnology and green energy.
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Coverage will include: advanced lithography for submicron devices; etching and related topics; ion implantation; damage evolution and related issues; plasma and thermal CVD; rapid thermal processing; advanced metallization and interconnect schemes; thin dielectric layers, oxidation; sol-gel processing; chemical bath and (electro)chemical deposition; compound semiconductor processing; new non-oxide materials and their applications; (macro)molecular and hybrid materials; molecular dynamics, ab-initio methods, Monte Carlo, etc.; new materials and processes for discrete and integrated circuits; magnetic materials and spintronics; heterostructures and quantum devices; engineering of the electrical and optical properties of semiconductors; crystal growth mechanisms; reliability, defect density, intrinsic impurities and defects.