等离子体纳米粒子修饰CuxO薄膜的三阶非线性光学响应

IF 3.1 3区物理与天体物理 Q2 Engineering

Optik Pub Date : 2025-05-23 DOI:10.1016/j.ijleo.2025.172420

Md Rumon Shahrier , Sabah M. Mohammad , Mundzir Abdullah , Aijaz Ali Soomro , Abubakar A. Sifawa

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引用次数: 0

摘要

等离子体增强纳米结构材料由于其独特的电学和光学特性以及在各个科学领域的广泛适用性而受到了广泛的关注。在较大的光强下，非线性效应和其他光学现象将变得不可忽视。本研究利用连续波（CW）激光z扫描技术，在637 nm波长下研究了高等离子体Au和Ag纳米粒子（NPs）掺入自然氧化CuxO薄膜后的三阶非线性光学（NLO）响应。特别地，测定了自然氧化和等离子体增强CuxO薄膜的非线性吸收系数β和非线性折射率n2。表征技术，包括HRTEM， FESEM， EDX， AFM， XRD和UV-vis光谱，证实了等离子体增强CuxO薄膜的高质量和结构完整性。（Au+Ag）/CuxO薄膜显示出三阶NLO敏感性的显著增强，[χ(3)]估计为36.10x10−3esu。这些发现为非线性光学的研究以及光电和光子器件的潜在应用提供了新的途径

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Third order nonlinear optical (NLO) response of modified CuxO thin films via plasmonic noble nanoparticles

Plasmonic-enhanced nanostructured materials have gained significant attention due to their unique electrical and optical properties and broad applicability across various scientific fields. Nonlinear effects and other optical phenomena would become nontrivial at greater optical intensities. This study investigates the third-order nonlinear optical (NLO) response of naturally oxidized Cu_xO thin films enhanced by the incorporation of highly plasmonic Au and Ag nanoparticles (NPs) utilizing continuous-wave (CW) laser Z-scan techniques at 637 nm wavelength. In particular, the nonlinear absorption coefficient,

β

and nonlinear refractive index,

n_{2}

, of naturally oxidised and plasmonic-enhanced Cu_xO thin film were determined. Characterization techniques, including HRTEM, FESEM, EDX, AFM, XRD, and UV–vis spectroscopy, confirmed the high quality and structural integrity of the plasmonic-enhanced Cu_xO thin film. The (Au+Ag)/Cu_xO thin film exhibited a significant enhancement in third-order NLO susceptibility,

{[χ}^{(3)}]

estimated as

36.10 x 10^{- 3} esu

. These findings showcase new pathways for nonlinear optics research and potential applications in optoelectronic and photonic devices

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来源期刊

Optik 物理-光学

CiteScore

6.90

自引率

12.90%

发文量

1471

审稿时长

46 days

期刊介绍： Optik publishes articles on all subjects related to light and electron optics and offers a survey on the state of research and technical development within the following fields: Optics: -Optics design, geometrical and beam optics, wave optics- Optical and micro-optical components, diffractive optics, devices and systems- Photoelectric and optoelectronic devices- Optical properties of materials, nonlinear optics, wave propagation and transmission in homogeneous and inhomogeneous materials- Information optics, image formation and processing, holographic techniques, microscopes and spectrometer techniques, and image analysis- Optical testing and measuring techniques- Optical communication and computing- Physiological optics- As well as other related topics.