多激光干涉位移传感器探头的纳米级一致性测量与评价

IF 5.2 2区 工程技术 Q1 ENGINEERING, MULTIDISCIPLINARY
Qi Sang , Yumei Wen , Shaoliang Gong , Jianwu He , Ping Li , Yixin Ma
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引用次数: 0

摘要

在超精密位移测量中,采用激光干涉位移传感器(LIDS)的多个探头进行差分测量,可以显著抑制共模噪声,提高测量质量。差分测量的有效性取决于lid探针之间的一致性。因此,科学评价这一协议至关重要。在纳米尺度上,多个探针同时测量同一目标并评估其一致性是具有挑战性的。在Bland-Altman方法(B-A方法)的基础上,我们扩展了B-A方法,开发了一种利用单一位移参考测量并评估4个lid探针之间一致性的方法。该方法便于多探针一致性的纳米级定量。4个探针的一致性评价不一致误差在±1 nm以内,配对探针的差异测量验证了结果。此外,所提出的方法可以扩展到评估任意数量的lid探针的一致性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Nanometer-level agreement measurement and evaluation of multiple laser interferometric displacement sensor probes
In ultra-precision displacement measurement, employing multiple probes of a laser interferometric displacement sensor (LIDS) for differential measurement can significantly suppress the common-mode noises to improve the measurement quality. The efficacy of differential measurement is contingent upon the agreement among the LIDS probes. Therefore, it is crucial to scientifically evaluate this agreement. At the nanometer scale, it is challenging for multiple probes to simultaneously measure the same target and evaluate their agreement. Based on the Bland-Altman method (B-A method), we have extended the B-A method and developed a method that utilizing a single displacement reference measures and evaluates the agreement among the 4 LIDS probes. The proposed method facilitates nanometer-level quantification of multi-probe agreement. Besides, the inconsistency errors in agreement evaluation among the 4 probes were within ± 1 nm and the differential measurements with paired probes verified the results. Furthermore, the proposed method can be extended to evaluate the agreement of any number of LIDS probes.
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来源期刊
Measurement
Measurement 工程技术-工程:综合
CiteScore
10.20
自引率
12.50%
发文量
1589
审稿时长
12.1 months
期刊介绍: Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.
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