基于球面阵列的双远心成像系统全局像素尺寸标定方法

IF 5.2 2区 工程技术 Q1 ENGINEERING, MULTIDISCIPLINARY
Wenmeng Chen, Hongxi Wang, Huihui Tian, Jinkang Yang
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引用次数: 0

摘要

为了提高视觉测量精度,本文提出了一种专为双远心成像系统设计的精密钢球阵列校准板。校准板由一个球形目标阵列和一个底座组成,可以实现相机范围内的像素尺寸校准。基于该标定板,我们提出了一种综合像元尺寸标定方法,该方法首先通过亚像元检测和圆拟合来检测球形目标,确定中心位置和直径。然后使用标称直径计算每个圆中心的像素大小。随后,这些中心像素尺寸作为薄板样条插值的骨架点,产生平滑的相机范围像素尺寸校准结果。此外,我们开发了一种计算图像特征点之间距离的方法。在相机视场内不同位置测量塞子直径的实验中,最大平均绝对误差不超过0.021 mm -与传统测量方法相比减少了60%。该方法有效地减小了被测物体位置变化引起的测量误差。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The global pixel size calibration method for a dual telecentric imaging system based on a sphere array
To enhance visual measurement precision, this paper presents a precision steel ball array calibration board specifically designed for bi-telecentric imaging systems. The calibration board, consisting of a spherical target array and a base, enables camera-wide pixel size calibration. Based on this calibration board, we propose a comprehensive pixel size calibration method that first detects the spherical targets through sub-pixel detection and circle fitting to determine center positions and diameters. The pixel size at each circle center is then calculated using the nominal diameter. Subsequently, these center pixel sizes serve as skeleton points for thin-plate spline interpolation, yielding smooth camera-wide pixel size calibration results. Additionally, we develop a method for calculating distances between image feature points. In experimental measurements of gauge plug diameters at various positions within the camera field of view, the maximum mean absolute error did not exceed 0.021 mm—a 60 % reduction compared to conventional measurement methods. This approach effectively minimizes measurement errors caused by changes in the position of measured objects.
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来源期刊
Measurement
Measurement 工程技术-工程:综合
CiteScore
10.20
自引率
12.50%
发文量
1589
审稿时长
12.1 months
期刊介绍: Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.
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