基于深度聚集和多尺度融合的两阶段苹果叶片病斑分割方法

IF 5.2 2区 工程技术 Q1 ENGINEERING, MULTIDISCIPLINARY
Jixiang Cheng, Zujian Song, Yuan Wu, Jiayue Xu
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引用次数: 0

摘要

深度学习已成功应用于简单环境下的植物叶片病害分割。然而,复杂的环境带来了一些挑战,比如模糊的边界和小的疾病斑点。为了解决这些问题,本文提出了一种基于PBGNet的叶片分割和PDFNet的病斑提取两阶段方法ALDNet。PBGNet采用深度聚合(DA)模块生成丰富全局上下文信息的初始分割图,并将反向注意(RA)引导的特征融合到最浅层,以提高目标叶子边界精度。PDFNet结合残差路径和多尺度融合(MSF)增强特征表示,融合不同分支的语义和尺度特征,便于小点提取。ALDNet在复杂环境下的表现优于最先进的方法,叶片分割的IoU和PA分别达到94.53%和98.13%,疾病分割的mIoU和mPA分别达到77.41%和84.1%。ALDNet为苹果叶病的准确严重程度分级提供了可靠的解决方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
ALDNet: A two-stage method with deep aggregation and multi-scale fusion for apple leaf disease spot segmentation
Deep learning has been successfully applied in plant leaf disease segmentation in simple environments. However, complex environments pose challenges like blurred boundaries and small disease spots. To tackle these issues, this paper proposes ALDNet, a two-stage method utilizing PBGNet for leaf segmentation and PDFNet for disease spot extraction. PBGNet incorporates a deep aggregation (DA) module to generate an initial segmentation map enriched with global contextual information, and the features guided by the reverse attention (RA) are fused to the shallowest levels to enhance target leaf boundary precision. PDFNet combines residual path and multi-scale fusion (MSF) to enhance feature representation and fuse semantic and scale features from different branches, facilitating small spot extraction. ALDNet outperforms state-of-the-art methods in complex environments, achieving 94.53% IoU and 98.13% PA for leaf segmentation, and 77.41% mIoU and 84.1% mPA for disease segmentation. ALDNet provides a reliable solution for accurate severity grading of apple leaf diseases.
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来源期刊
Measurement
Measurement 工程技术-工程:综合
CiteScore
10.20
自引率
12.50%
发文量
1589
审稿时长
12.1 months
期刊介绍: Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.
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