梯度薄膜沉积的真空室:迈向高通量结构-性能相关研究。

IF 1.3 4区 工程技术 Q3 INSTRUMENTS & INSTRUMENTATION
Dmitry Lapkin, Roody Nasro, Jakub Hagara, Bernd Hofferberth, Alexander Hinderhofer, Alexander Gerlach, Frank Schreiber
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引用次数: 0

摘要

材料科学的进步及其在复杂多组分系统中的应用越来越依赖于能够有效探索材料广阔组成空间的高通量研究。然而,传统的样品制备方法往往难以跟上现代表征技术和数据分析能力的步伐。为了解决这一挑战,我们提出了一种设计用于生产梯度薄膜的真空沉积室。该腔室可以在一次实验中沉积具有厚度梯度的单组分薄膜或具有连续成分梯度的多组分薄膜。我们的方法采用定制设计的移动快门机制,可以精确控制沉积过程,并消除对具有离散成分的多个样品的需求。这大大减少了研究时间,并最大限度地减少了与几个单独样品生产相关的不一致。作为概念证明,我们沉积了在有机光电应用薄膜中广泛研究的并五苯和二烯的单组分梯度薄膜,以及相应的二元梯度薄膜。x射线反射率测量证实了前者样品的线性厚度梯度和后者样品的线性成分梯度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Vacuum chamber for deposition of gradient thin films: Toward high-throughput structure-property correlative studies.

The advancement of materials science and application in complex multi-component systems is increasingly dependent on high-throughput studies that can efficiently explore the vast compositional space of materials. However, traditional sample preparation methods often struggle to keep pace with modern characterization techniques and data analysis capabilities. To address this challenge, we present a vacuum deposition chamber designed to produce gradient thin films. This chamber enables the deposition of single-component films with thickness gradients or multi-component films with continuous compositional gradients in a single experimental run. Our approach features a custom-designed moving shutter mechanism, which allows precise control over the deposition process and eliminates the need for multiple samples with discrete compositions. This significantly reduces research time and minimizes inconsistencies associated with the production of several individual samples. As a proof of concept, we deposited single-component gradient films of pentacene and diindenoperylene, which are widely studied in thin films for organic optoelectronic applications, and their corresponding binary gradient film. X-ray reflectivity measurements confirm the linear thickness gradients in the former and the linear compositional gradient in the latter samples.

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来源期刊
Review of Scientific Instruments
Review of Scientific Instruments 工程技术-物理:应用
CiteScore
3.00
自引率
12.50%
发文量
758
审稿时长
2.6 months
期刊介绍: Review of Scientific Instruments, is committed to the publication of advances in scientific instruments, apparatuses, and techniques. RSI seeks to meet the needs of engineers and scientists in physics, chemistry, and the life sciences.
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