D. Bridarolli;C. Zucchelli;P. Mannocci;S. Ricci;M. Farronato;G. Pedretti;Z. Sun;D. Ielmini
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3-D Vertical Resistive Switching Random Access Memory (3D-VRRAM) With Multilevel Programming for High-Density, Energy-Efficient In-Memory Computing
Resistive random access memory (RRAM) devices offer a broad range of attractive properties for in-memory computing (IMC) applications, such as nonvolatile storage, low read current, and high scalability. IMC allows to overcome the memory bottleneck of data-intensive workloads, such as deep learning on the edge. In this context, 3-D vertical RRAM (3D-VRRAM) is a promising option to achieve high memory cell capacity with low fabrication cost. In this work, we present an HfOx-based 3D-VRRAM crossbar array (CBA) capable of IMC with precise multilevel programming. We show an extensive experimental demonstration of both matrix-vector multiplication (MVM) and inverse/pseudoinverse matrix calculation via IMC on 3D-VRRAM. To further support the parallel IMC application in real-life scenarios, the work also reports a demonstration of relatively large-size problems adopting 2D-RRAM and SRAM-based memory arrays. These results support 3D-VRRAM for high-density, energy-efficient IMC for edge computing applications.
期刊介绍:
IEEE Transactions on Electron Devices publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors. Tutorial and review papers on these subjects are also published and occasional special issues appear to present a collection of papers which treat particular areas in more depth and breadth.