一种用于信号分离的电容成像算法:缺陷与升空干扰

IF 5.2 2区 工程技术 Q1 ENGINEERING, MULTIDISCIPLINARY
Zhen Li , Jianqing Han , Renting Cao , Hongyuan Zhang , Yongbo Zhang , Yanzhe Wang , Cong Zhang , Lin Chang , Jianguo Wang
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引用次数: 0

摘要

电容成像(CI)技术广泛应用于航空航天、石油运输、汽车制造、建筑工程等各个行业,其重要性不断提高。在CI技术中,保证检测结果可靠性的一个关键因素是准确区分缺陷信号和起飞干扰信号。本文利用COMSOL软件建立了检测绝缘包层构件的CI传感器三维仿真模型,得到了不同升空高度对绝缘层表面缺陷、绝缘层隐藏缺陷、金属层表面缺陷的影响。利用测量灵敏度分布(MSD)图分析了不同类型缺陷的敏感区域的检测。利用CI系统对三种不同类型的缺陷进行了实验检测,揭示了单向和多向升空扰动对不同类型缺陷的影响规律。基于三种不同类型缺陷在升空扰动检测趋势上的差异,提出了一种归一化变化率-积分双阈值算法。实验结果验证了该算法的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A capacitive imaging algorithm for signal separation: Defects vs. lift-off disturbances
Capacitive imaging (CI) technology is extensively utilized in various industries, including aerospace, oil transportation, automobile manufacturing, and construction engineering, with its significance continually increasing. A critical factor in ensuring the reliability of detection results in CI technology is the accurate differentiation between defect signals and lift-off disturbance signals. This paper uses COMSOL to establish a three-dimensional simulation model of CI sensors detecting insulated cladding components and obtains the influence of different lift-off heights on the surface defects of the insulation layer, hidden defects of the insulation layer, and surface defects of the metal layer. The Measurement Sensitivity Distribution (MSD) diagram is used to analyze the detection of sensitive areas of different types of defects. Using a CI system to experimentally detect three different types of defects and reveal the impact patterns of unidirectional and multidirectional lift-off disturbances on different types of defects. Based on the differences in detection trends between lift-off disturbances and three different types of defects, a Normalized Variation Ratio (NVR)-integral double-threshold algorithm is proposed. The effectiveness of the algorithm is verified through experimental results.
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来源期刊
Measurement
Measurement 工程技术-工程:综合
CiteScore
10.20
自引率
12.50%
发文量
1589
审稿时长
12.1 months
期刊介绍: Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.
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