{"title":"基于键脚位置和高斯l2距离的刚性配准,实现球栅阵列芯片精确快速定位","authors":"Chao Xu , Yongxin Song , Xianqiang Yang","doi":"10.1016/j.measurement.2025.117793","DOIUrl":null,"url":null,"abstract":"<div><div>The large number and various arrangements of solder balls in a Ball Grid Array (BGA) of an electric chip poses significant challenges on its accurate and quick location to the Printed Circuit Board (PCB). To solve these problems, a key-pin-position and Gaussian L2 distance based rigid registration method was proposed. The key idea was to use the pins only at the corners (key positions) to build up data point which was used to obtain the offset and rotation angle of the BGA relative to the specified place by the Gaussian-L2-distance-based rigid registration method. Gaussian function was used to model the actual solder balls’ positions and the specified positions, the Expectation and Maximization algorithm was used to solve the iteration process of the rigid registration. It was experimentally found that the maximum positioning error in three directions (X, Y and rotation angle) is only 1/12 pixels, which significantly outperforms Samsung’s method with a positioning error of 0.68 pixels and the state-of-art method with 0.7 pixels. The location time for a BGA with more than 200 balls is no more than 200 ms which is less than half of that of a commercial device (Samsung SM482). Experimental results demonstrate the effectiveness of this method in handling BGA chips with varying numbers and arrangements of solder balls.</div></div>","PeriodicalId":18349,"journal":{"name":"Measurement","volume":"253 ","pages":"Article 117793"},"PeriodicalIF":5.2000,"publicationDate":"2025-05-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Key-pin-position and Gaussian-L2-distance based rigid registration for accurate and fast location of ball grid array chip\",\"authors\":\"Chao Xu , Yongxin Song , Xianqiang Yang\",\"doi\":\"10.1016/j.measurement.2025.117793\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>The large number and various arrangements of solder balls in a Ball Grid Array (BGA) of an electric chip poses significant challenges on its accurate and quick location to the Printed Circuit Board (PCB). To solve these problems, a key-pin-position and Gaussian L2 distance based rigid registration method was proposed. The key idea was to use the pins only at the corners (key positions) to build up data point which was used to obtain the offset and rotation angle of the BGA relative to the specified place by the Gaussian-L2-distance-based rigid registration method. Gaussian function was used to model the actual solder balls’ positions and the specified positions, the Expectation and Maximization algorithm was used to solve the iteration process of the rigid registration. It was experimentally found that the maximum positioning error in three directions (X, Y and rotation angle) is only 1/12 pixels, which significantly outperforms Samsung’s method with a positioning error of 0.68 pixels and the state-of-art method with 0.7 pixels. The location time for a BGA with more than 200 balls is no more than 200 ms which is less than half of that of a commercial device (Samsung SM482). Experimental results demonstrate the effectiveness of this method in handling BGA chips with varying numbers and arrangements of solder balls.</div></div>\",\"PeriodicalId\":18349,\"journal\":{\"name\":\"Measurement\",\"volume\":\"253 \",\"pages\":\"Article 117793\"},\"PeriodicalIF\":5.2000,\"publicationDate\":\"2025-05-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Measurement\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0263224125011522\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Measurement","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0263224125011522","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, MULTIDISCIPLINARY","Score":null,"Total":0}
Key-pin-position and Gaussian-L2-distance based rigid registration for accurate and fast location of ball grid array chip
The large number and various arrangements of solder balls in a Ball Grid Array (BGA) of an electric chip poses significant challenges on its accurate and quick location to the Printed Circuit Board (PCB). To solve these problems, a key-pin-position and Gaussian L2 distance based rigid registration method was proposed. The key idea was to use the pins only at the corners (key positions) to build up data point which was used to obtain the offset and rotation angle of the BGA relative to the specified place by the Gaussian-L2-distance-based rigid registration method. Gaussian function was used to model the actual solder balls’ positions and the specified positions, the Expectation and Maximization algorithm was used to solve the iteration process of the rigid registration. It was experimentally found that the maximum positioning error in three directions (X, Y and rotation angle) is only 1/12 pixels, which significantly outperforms Samsung’s method with a positioning error of 0.68 pixels and the state-of-art method with 0.7 pixels. The location time for a BGA with more than 200 balls is no more than 200 ms which is less than half of that of a commercial device (Samsung SM482). Experimental results demonstrate the effectiveness of this method in handling BGA chips with varying numbers and arrangements of solder balls.
期刊介绍:
Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.