{"title":"1.27 GW/cm²反向阻断e模GaN-Si(100)单片异构级联开关,超低导通电压和动态RON","authors":"Yutong Fan;Weihang Zhang;Yachao Zhang;Yinhe Wu;Xin Feng;Zhihong Liu;Yang Jiang;Pui In Mak;Yue Hao;Jincheng Zhang","doi":"10.1109/LED.2025.3545417","DOIUrl":null,"url":null,"abstract":"In this letter, an E-Mode GaN-Si(100) monolithic heterogeneous integration cascode switch (RBMHIC-switch) with reverse blocking compatibility on a SiC substrate with an AlN buffer layer is demonstrated. The RBMHIC-switch with LGD of <inline-formula> <tex-math>$22~\\mu $ </tex-math></inline-formula>m showed a threshold voltage (VTH) of 2.64 V, a large forward gate voltage swing of 16.27 V, a turn-on voltage (VON) of 0.3 V, and an extremely low reverse leakage current (IR) of <inline-formula> <tex-math>$3.5\\times 10^{-{4}}$ </tex-math></inline-formula> mA/mm at -2000 V. The forward breakdown voltage (VFBR) of 2264 V and reverse breakdown voltage (VRBR) of 2183 V with a specific on-resistance (<inline-formula> <tex-math>$R_{\\text {ON}, \\text {SP}}$ </tex-math></inline-formula>) of 3.74 m<inline-formula> <tex-math>$\\Omega \\cdot $ </tex-math></inline-formula> cm2 were achieved, resulting in a forward power figure of merit (PFOM = V<inline-formula> <tex-math>$_{\\text {BR}}^{{2}}$ </tex-math></inline-formula>/RON,SP) of 1.35 GW/cm2 and reverse PFOM of 1.27 GW/cm2. The ratio between dynamic-RON and static-RON was 1.104 and 1.127 after a 10 ms 1900 V drain stress voltage (V<inline-formula> <tex-math>$_{\\text {DS}-\\text {OFF}}$ </tex-math></inline-formula>) and a 10 ms -1900 V V<inline-formula> <tex-math>$_{\\text {DS}-\\text {OFF}}$ </tex-math></inline-formula> (delay time <inline-formula> <tex-math>$= 1~\\mu $ </tex-math></inline-formula>s) for the RBMHIC-switches, respectively, which were the best among all existing GaN power devices with reverse blocking capability. The thermal resistance at different temperatures was also extracted. The RBMHIC-switche shows decent overall characteristics as compared to the reported results.","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":"46 5","pages":"805-808"},"PeriodicalIF":4.1000,"publicationDate":"2025-02-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10902610","citationCount":"0","resultStr":"{\"title\":\"1.27 GW/cm² Reverse Blocking E-Mode GaN-Si(100) Monolithic Heterogeneous Integration Cascode Switch With Ultralow Turn-On Voltage and Dynamic RON\",\"authors\":\"Yutong Fan;Weihang Zhang;Yachao Zhang;Yinhe Wu;Xin Feng;Zhihong Liu;Yang Jiang;Pui In Mak;Yue Hao;Jincheng Zhang\",\"doi\":\"10.1109/LED.2025.3545417\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this letter, an E-Mode GaN-Si(100) monolithic heterogeneous integration cascode switch (RBMHIC-switch) with reverse blocking compatibility on a SiC substrate with an AlN buffer layer is demonstrated. The RBMHIC-switch with LGD of <inline-formula> <tex-math>$22~\\\\mu $ </tex-math></inline-formula>m showed a threshold voltage (VTH) of 2.64 V, a large forward gate voltage swing of 16.27 V, a turn-on voltage (VON) of 0.3 V, and an extremely low reverse leakage current (IR) of <inline-formula> <tex-math>$3.5\\\\times 10^{-{4}}$ </tex-math></inline-formula> mA/mm at -2000 V. The forward breakdown voltage (VFBR) of 2264 V and reverse breakdown voltage (VRBR) of 2183 V with a specific on-resistance (<inline-formula> <tex-math>$R_{\\\\text {ON}, \\\\text {SP}}$ </tex-math></inline-formula>) of 3.74 m<inline-formula> <tex-math>$\\\\Omega \\\\cdot $ </tex-math></inline-formula> cm2 were achieved, resulting in a forward power figure of merit (PFOM = V<inline-formula> <tex-math>$_{\\\\text {BR}}^{{2}}$ </tex-math></inline-formula>/RON,SP) of 1.35 GW/cm2 and reverse PFOM of 1.27 GW/cm2. The ratio between dynamic-RON and static-RON was 1.104 and 1.127 after a 10 ms 1900 V drain stress voltage (V<inline-formula> <tex-math>$_{\\\\text {DS}-\\\\text {OFF}}$ </tex-math></inline-formula>) and a 10 ms -1900 V V<inline-formula> <tex-math>$_{\\\\text {DS}-\\\\text {OFF}}$ </tex-math></inline-formula> (delay time <inline-formula> <tex-math>$= 1~\\\\mu $ </tex-math></inline-formula>s) for the RBMHIC-switches, respectively, which were the best among all existing GaN power devices with reverse blocking capability. The thermal resistance at different temperatures was also extracted. The RBMHIC-switche shows decent overall characteristics as compared to the reported results.\",\"PeriodicalId\":13198,\"journal\":{\"name\":\"IEEE Electron Device Letters\",\"volume\":\"46 5\",\"pages\":\"805-808\"},\"PeriodicalIF\":4.1000,\"publicationDate\":\"2025-02-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10902610\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Electron Device Letters\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10902610/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10902610/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
1.27 GW/cm² Reverse Blocking E-Mode GaN-Si(100) Monolithic Heterogeneous Integration Cascode Switch With Ultralow Turn-On Voltage and Dynamic RON
In this letter, an E-Mode GaN-Si(100) monolithic heterogeneous integration cascode switch (RBMHIC-switch) with reverse blocking compatibility on a SiC substrate with an AlN buffer layer is demonstrated. The RBMHIC-switch with LGD of $22~\mu $ m showed a threshold voltage (VTH) of 2.64 V, a large forward gate voltage swing of 16.27 V, a turn-on voltage (VON) of 0.3 V, and an extremely low reverse leakage current (IR) of $3.5\times 10^{-{4}}$ mA/mm at -2000 V. The forward breakdown voltage (VFBR) of 2264 V and reverse breakdown voltage (VRBR) of 2183 V with a specific on-resistance ($R_{\text {ON}, \text {SP}}$ ) of 3.74 m$\Omega \cdot $ cm2 were achieved, resulting in a forward power figure of merit (PFOM = V$_{\text {BR}}^{{2}}$ /RON,SP) of 1.35 GW/cm2 and reverse PFOM of 1.27 GW/cm2. The ratio between dynamic-RON and static-RON was 1.104 and 1.127 after a 10 ms 1900 V drain stress voltage (V$_{\text {DS}-\text {OFF}}$ ) and a 10 ms -1900 V V$_{\text {DS}-\text {OFF}}$ (delay time $= 1~\mu $ s) for the RBMHIC-switches, respectively, which were the best among all existing GaN power devices with reverse blocking capability. The thermal resistance at different temperatures was also extracted. The RBMHIC-switche shows decent overall characteristics as compared to the reported results.
期刊介绍:
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.