{"title":"基于Au-WS 2 -Ge异质结构的偏置可选双频雪崩探测器","authors":"Yuekai Hao;Ningning Zhang;Yichi Zhang;Zhao Han;Qiancui Zhang;Bu Zhang;Jiting Hu;Tian Miao;Huiyong Hu;Liming Wang;Zhangming Zhu","doi":"10.1109/LED.2025.3546631","DOIUrl":null,"url":null,"abstract":"Here, we report a bias-selectable visible and near-infrared photoresponses due to stacked back-to-back diodes structure in a mixed-dimensional Au-WS2-Ge avalanche photodetector. Controllable switching between Schottky (Au/WS2) and PN (WS2/Ge) junctions can be realized depending on the polarity of the bias voltage. Therefore, this device can provide bias-dependent single-band (visible) and fused-band (visible&near-infrared) avalanche detection modes. When the Schottky junction is reversed, ultra-high responsivity (over 2000 A/W) and gain (349) at 532 nm can be obtained when reaching the avalanche breakdown (single-band mode). Meanwhile, when the PN junction is reversed, the ultra-high gains around 354 and 519 can be realized at both 532 and 1550 nm, respectively (fused-band mode). The simulated I-V features agree well with the experimental results. This device provides a novel direction for the application of integrated dual-band avalanche devices in optoelectronic detection.","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":"46 5","pages":"793-796"},"PeriodicalIF":4.1000,"publicationDate":"2025-02-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Bias-Selectable Dual-Band Avalanche Detector Based on Au-WS₂-Ge Heterostructure\",\"authors\":\"Yuekai Hao;Ningning Zhang;Yichi Zhang;Zhao Han;Qiancui Zhang;Bu Zhang;Jiting Hu;Tian Miao;Huiyong Hu;Liming Wang;Zhangming Zhu\",\"doi\":\"10.1109/LED.2025.3546631\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Here, we report a bias-selectable visible and near-infrared photoresponses due to stacked back-to-back diodes structure in a mixed-dimensional Au-WS2-Ge avalanche photodetector. Controllable switching between Schottky (Au/WS2) and PN (WS2/Ge) junctions can be realized depending on the polarity of the bias voltage. Therefore, this device can provide bias-dependent single-band (visible) and fused-band (visible&near-infrared) avalanche detection modes. When the Schottky junction is reversed, ultra-high responsivity (over 2000 A/W) and gain (349) at 532 nm can be obtained when reaching the avalanche breakdown (single-band mode). Meanwhile, when the PN junction is reversed, the ultra-high gains around 354 and 519 can be realized at both 532 and 1550 nm, respectively (fused-band mode). The simulated I-V features agree well with the experimental results. This device provides a novel direction for the application of integrated dual-band avalanche devices in optoelectronic detection.\",\"PeriodicalId\":13198,\"journal\":{\"name\":\"IEEE Electron Device Letters\",\"volume\":\"46 5\",\"pages\":\"793-796\"},\"PeriodicalIF\":4.1000,\"publicationDate\":\"2025-02-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Electron Device Letters\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10908229/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10908229/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Bias-Selectable Dual-Band Avalanche Detector Based on Au-WS₂-Ge Heterostructure
Here, we report a bias-selectable visible and near-infrared photoresponses due to stacked back-to-back diodes structure in a mixed-dimensional Au-WS2-Ge avalanche photodetector. Controllable switching between Schottky (Au/WS2) and PN (WS2/Ge) junctions can be realized depending on the polarity of the bias voltage. Therefore, this device can provide bias-dependent single-band (visible) and fused-band (visible&near-infrared) avalanche detection modes. When the Schottky junction is reversed, ultra-high responsivity (over 2000 A/W) and gain (349) at 532 nm can be obtained when reaching the avalanche breakdown (single-band mode). Meanwhile, when the PN junction is reversed, the ultra-high gains around 354 and 519 can be realized at both 532 and 1550 nm, respectively (fused-band mode). The simulated I-V features agree well with the experimental results. This device provides a novel direction for the application of integrated dual-band avalanche devices in optoelectronic detection.
期刊介绍:
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.