Yang Zhou;Haoran Mu;Congwen Zhang;Renjing Xu;Guangyu Zhang;Shenghuang Lin
{"title":"基于动态选择光谱重建策略的SnS₂/WSe₂范德瓦尔斯单探测器光谱仪","authors":"Yang Zhou;Haoran Mu;Congwen Zhang;Renjing Xu;Guangyu Zhang;Shenghuang Lin","doi":"10.1109/LED.2025.3545960","DOIUrl":null,"url":null,"abstract":"The single-detector spectrometers based on 2D layer van der Waals (vdW) heterojunctions offer advantages in spectral reconstruction due to their high sensitivity, tunable optical properties, and the ability to cover a broad spectral range. There exist two principal algorithms dominating spectrum reconstruction for this kind spectrometer: the Tikhonov regularization method combined with the Least Squares Method (LSM) and neural network-based approaches, particularly Deep Learning (DL). However, both of the algorithms exhibit inherent limitations in spectral reconstruction, which constrain the versatility of computational spectrometers that rely solely on a single algorithm for reconstructing diverse spectral profiles. To overcome this limitation, we introduce an artificial neural network (ANN)-based classification model capable of dynamically selecting the optimal algorithm throughout the reconstruction process. This enables highly accurate spectral reconstruction within the 440-700 nm wavelength range, achieving a spectral resolution of 6 nm. By harnessing the complementary strengths of multiple algorithms, our approach proposes a novel strategy for combining techniques to enhance the precision of spectral reconstructions, laying the groundwork for more sophisticated methods in the future.","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":"46 5","pages":"801-804"},"PeriodicalIF":4.1000,"publicationDate":"2025-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"SnS₂/WSe₂ van der Waals Single-Detector Spectrometer With a Dynamically Selecting Spectral Reconstruction Strategy\",\"authors\":\"Yang Zhou;Haoran Mu;Congwen Zhang;Renjing Xu;Guangyu Zhang;Shenghuang Lin\",\"doi\":\"10.1109/LED.2025.3545960\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The single-detector spectrometers based on 2D layer van der Waals (vdW) heterojunctions offer advantages in spectral reconstruction due to their high sensitivity, tunable optical properties, and the ability to cover a broad spectral range. There exist two principal algorithms dominating spectrum reconstruction for this kind spectrometer: the Tikhonov regularization method combined with the Least Squares Method (LSM) and neural network-based approaches, particularly Deep Learning (DL). However, both of the algorithms exhibit inherent limitations in spectral reconstruction, which constrain the versatility of computational spectrometers that rely solely on a single algorithm for reconstructing diverse spectral profiles. To overcome this limitation, we introduce an artificial neural network (ANN)-based classification model capable of dynamically selecting the optimal algorithm throughout the reconstruction process. This enables highly accurate spectral reconstruction within the 440-700 nm wavelength range, achieving a spectral resolution of 6 nm. By harnessing the complementary strengths of multiple algorithms, our approach proposes a novel strategy for combining techniques to enhance the precision of spectral reconstructions, laying the groundwork for more sophisticated methods in the future.\",\"PeriodicalId\":13198,\"journal\":{\"name\":\"IEEE Electron Device Letters\",\"volume\":\"46 5\",\"pages\":\"801-804\"},\"PeriodicalIF\":4.1000,\"publicationDate\":\"2025-02-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Electron Device Letters\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10904467/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10904467/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
SnS₂/WSe₂ van der Waals Single-Detector Spectrometer With a Dynamically Selecting Spectral Reconstruction Strategy
The single-detector spectrometers based on 2D layer van der Waals (vdW) heterojunctions offer advantages in spectral reconstruction due to their high sensitivity, tunable optical properties, and the ability to cover a broad spectral range. There exist two principal algorithms dominating spectrum reconstruction for this kind spectrometer: the Tikhonov regularization method combined with the Least Squares Method (LSM) and neural network-based approaches, particularly Deep Learning (DL). However, both of the algorithms exhibit inherent limitations in spectral reconstruction, which constrain the versatility of computational spectrometers that rely solely on a single algorithm for reconstructing diverse spectral profiles. To overcome this limitation, we introduce an artificial neural network (ANN)-based classification model capable of dynamically selecting the optimal algorithm throughout the reconstruction process. This enables highly accurate spectral reconstruction within the 440-700 nm wavelength range, achieving a spectral resolution of 6 nm. By harnessing the complementary strengths of multiple algorithms, our approach proposes a novel strategy for combining techniques to enhance the precision of spectral reconstructions, laying the groundwork for more sophisticated methods in the future.
期刊介绍:
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.