{"title":"基于谱图和深度残差网络的串联交流电弧故障检测方法","authors":"Wenxin Dai, Xue Zhou, Zhigang Sun, Guofu Zhai","doi":"10.1016/j.microrel.2025.115756","DOIUrl":null,"url":null,"abstract":"<div><div>The extended and excessive use of power equipment can hasten the aging of circuit cables, resulting in arc faults. The generation of arc fault will not only affect the performance of power equipment, but also bring about safety hazards. Therefore, it is necessary to detect arcing in circuits. This paper presents a framework for detecting series arc faults based on spectrogram and deep residual network. The problem of current signal detection can be converted into the problem of image recognition by this framework. In this framework, the current signal is converted into a spectrogram, which enables the characterisation of the current signal from a multi-domain perspective. Then, a deep residual network model is used to recognize the spectrogram and determine the type of arc fault. Finally, the current data is used to demonstrate the effectiveness and accuracy of the proposed method. The results show that the proposed method is able to achieve accurate arc fault detection with an accuracy of 97.50 %.</div></div>","PeriodicalId":51131,"journal":{"name":"Microelectronics Reliability","volume":"170 ","pages":"Article 115756"},"PeriodicalIF":1.6000,"publicationDate":"2025-04-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Series AC arc fault detection method based on spectrogram and deep residual network\",\"authors\":\"Wenxin Dai, Xue Zhou, Zhigang Sun, Guofu Zhai\",\"doi\":\"10.1016/j.microrel.2025.115756\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>The extended and excessive use of power equipment can hasten the aging of circuit cables, resulting in arc faults. The generation of arc fault will not only affect the performance of power equipment, but also bring about safety hazards. Therefore, it is necessary to detect arcing in circuits. This paper presents a framework for detecting series arc faults based on spectrogram and deep residual network. The problem of current signal detection can be converted into the problem of image recognition by this framework. In this framework, the current signal is converted into a spectrogram, which enables the characterisation of the current signal from a multi-domain perspective. Then, a deep residual network model is used to recognize the spectrogram and determine the type of arc fault. Finally, the current data is used to demonstrate the effectiveness and accuracy of the proposed method. The results show that the proposed method is able to achieve accurate arc fault detection with an accuracy of 97.50 %.</div></div>\",\"PeriodicalId\":51131,\"journal\":{\"name\":\"Microelectronics Reliability\",\"volume\":\"170 \",\"pages\":\"Article 115756\"},\"PeriodicalIF\":1.6000,\"publicationDate\":\"2025-04-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microelectronics Reliability\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0026271425001696\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Reliability","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0026271425001696","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Series AC arc fault detection method based on spectrogram and deep residual network
The extended and excessive use of power equipment can hasten the aging of circuit cables, resulting in arc faults. The generation of arc fault will not only affect the performance of power equipment, but also bring about safety hazards. Therefore, it is necessary to detect arcing in circuits. This paper presents a framework for detecting series arc faults based on spectrogram and deep residual network. The problem of current signal detection can be converted into the problem of image recognition by this framework. In this framework, the current signal is converted into a spectrogram, which enables the characterisation of the current signal from a multi-domain perspective. Then, a deep residual network model is used to recognize the spectrogram and determine the type of arc fault. Finally, the current data is used to demonstrate the effectiveness and accuracy of the proposed method. The results show that the proposed method is able to achieve accurate arc fault detection with an accuracy of 97.50 %.
期刊介绍:
Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.
Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.