Experimental measurement of the near electric emission from LED driver as function of power variation and lighting mode

The production of static converters faces a major challenge known as electromagnetic interference (EMI), which can pose significant problems. Among the various sources of electromagnetic pollution, AC/DC energy conversions in LED lamps play an important role. This pollution is conducted through electrical cables and radiated into the air in the form of propagating electromagnetic fields. It is therefore essential to mitigate electromagnetic interference in LED lamp production to reduce the negative impact of electromagnetic pollution and ensure better electromagnetic compatibility across different systems. The objective of this paper is to examine how power variability and lighting modes influence the performance of LED spot lamps on the electric field measured by a TEKBOX electric probe, capturing the three components (E, E, E) in the spectrum domain using the near-field scanning (NFS) technique. The scanning step during the measurement process is fixed at 0.5 cm. The LED lamps in this setup are powered directly from the main, operating at 220 V and 50 Hz. Two types of lamps are used, one rated at 6 W and the other at 12 W, each offering three lighting modes: Mode 1 emits white light, Mode 2 emits colored light, and Mode 3 combines both white and colored light, providing a high degree of flexibility in terms of lighting options. During the measurement procedure, the electric field is measured above the center of the inductor. In addition, a scan is performed over the LED driver surface at specific coordinates (4 cm, 1.5 cm). This scan is used to collect data or assess specific parameters related to the performance or characteristics of the LED driver at that precise location.