基于场效应效应加速器的鲁棒硬件感知神经网络

IF 2.1 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Osama Yousuf;Andreu L. Glasmann;Alexander L. Mazzoni;Sina Najmaei;Gina C. Adam
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引用次数: 0

摘要

基于新兴设备技术的硬件加速器在推理工作负载方面越来越受欢迎,但是训练它们的有效方法仍然是一个开放的研究领域。我们提出了一种有效的硬件感知方法,用于训练具有可映射到新兴存储设备阵列的三元权重的神经网络。我们使用来自具有不同特性的铁电场效应晶体管(FeFET)器件的模拟和实验测量数据集,研究了各种场景下的器件-网络相互作用。我们通过调查设备级指标、网络级指标、损失情况以及参数优化轨迹,量化了设备非理想性对网络训练的影响。我们通过将硬件感知的解决方案映射到具有实验测量校准参数的仿真系统来验证我们的方法,并强调了几个权衡。基于feet的多层感知器网络、长短期记忆网络和深度卷积网络的硬件感知训练结果与现有方案相比,在较低的开销下表现出具有竞争力的性能,表明了架构和计算的可扩展性。研究发现,具有低可变性、非线性和高动态范围的设备表现出最接近软件基线的训练特性。我们提供的证据表明,设备非理想性在反向传播过程中会注入噪声,导致更清晰的损失景观和更高维度的优化轨迹,这使得设备网络比软件网络更难训练。我们还通过利用我们的硬件感知训练和推理方法来确定所研究设备的最佳工作电压。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Robust Hardware-Aware Neural Networks for FeFET-Based Accelerators
Hardware accelerators based on emerging device technologies are gaining traction for inference workloads, but effective methods for their training remain an open area of research. We propose an efficient hardware-aware methodology for training neural networks with ternary weights that are mappable to emerging memory device arrays. We study device-network interactions across a variety of scenarios using simulated and experimentally measured datasets from ferroelectric field-effect transistor (FeFET) devices with varying characteristics. We quantify the impact of device non-idealities on network training by investigating device-level metrics, network-level metrics, loss landscapes, as well as parameter optimization trajectories. We validate our approach by mapping a hardware-aware solution to an emulated system with parameters calibrated to experimental measurements, highlighting several trade-offs. Hardware-aware training results on FeFET-based multi-layer perceptron networks, long short-term memory networks, and deep convolutional networks demonstrate competitive performance at lower overheads compared to existing schemes, indicating architectural and computational scalability. It is found that devices with low variability, non-linearity, and high dynamic range exhibit training characteristics closest to a software baseline. We provide evidence that device non-idealities inject noise during backpropagation, leading to sharper loss landscapes and higher-dimensional optimization trajectories, which make device networks more difficult to train than software counterparts. We also identify optimal operating voltages for investigated devices by utilizing our hardware-aware training and inference methodologies.
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来源期刊
IEEE Transactions on Nanotechnology
IEEE Transactions on Nanotechnology 工程技术-材料科学:综合
CiteScore
4.80
自引率
8.30%
发文量
74
审稿时长
8.3 months
期刊介绍: The IEEE Transactions on Nanotechnology is devoted to the publication of manuscripts of archival value in the general area of nanotechnology, which is rapidly emerging as one of the fastest growing and most promising new technological developments for the next generation and beyond.
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