{"title":"锌掺杂FeOCl纳米片通过模拟阳光响应光- fenton催化加速四环素降解","authors":"Chenggong Lu , Chujie Jiao , Zhiqiang Wei","doi":"10.1016/j.mssp.2025.109542","DOIUrl":null,"url":null,"abstract":"<div><div>This study synthesized a novel Zn-doped FeOCl (Zn-FeOCl) photocatalyst using a one-step calcination method and utilized it for the photo-Fenton degradation of tetracycline (TC) under simulated sunlight. The structure, optical properties, and photocatalytic performance of Zn-FeOCl were systematically characterized and compared with those of undoped FeOCl. Among the variants, Zn-FeOCl-8 exhibited the highest catalytic efficiency, achieving a TC removal rate of 98.3 % within 60 min, with a degradation rate constant 6.4 times greater than that of pure FeOCl. Free radical trapping experiments and EPR results indicate that hydroxyl radicals (·OH) are the primary reactive species in the photo-Fenton process. Furthermore, density functional theory (DFT) calculations indicated that zinc doping reduced the band gap and improved charge transfer, significantly enhancing the photocatalytic activity of the catalyst. This study provides new insights into the modification of FeOCl and offers a possible approach for the efficient removal of antibiotic contaminants from water.</div></div>","PeriodicalId":18240,"journal":{"name":"Materials Science in Semiconductor Processing","volume":"194 ","pages":"Article 109542"},"PeriodicalIF":4.2000,"publicationDate":"2025-04-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Zn-doped FeOCl nanosheets enable accelerated tetracycline degradation via simulated sunlight-responsive photo-Fenton catalysis\",\"authors\":\"Chenggong Lu , Chujie Jiao , Zhiqiang Wei\",\"doi\":\"10.1016/j.mssp.2025.109542\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>This study synthesized a novel Zn-doped FeOCl (Zn-FeOCl) photocatalyst using a one-step calcination method and utilized it for the photo-Fenton degradation of tetracycline (TC) under simulated sunlight. The structure, optical properties, and photocatalytic performance of Zn-FeOCl were systematically characterized and compared with those of undoped FeOCl. Among the variants, Zn-FeOCl-8 exhibited the highest catalytic efficiency, achieving a TC removal rate of 98.3 % within 60 min, with a degradation rate constant 6.4 times greater than that of pure FeOCl. Free radical trapping experiments and EPR results indicate that hydroxyl radicals (·OH) are the primary reactive species in the photo-Fenton process. Furthermore, density functional theory (DFT) calculations indicated that zinc doping reduced the band gap and improved charge transfer, significantly enhancing the photocatalytic activity of the catalyst. This study provides new insights into the modification of FeOCl and offers a possible approach for the efficient removal of antibiotic contaminants from water.</div></div>\",\"PeriodicalId\":18240,\"journal\":{\"name\":\"Materials Science in Semiconductor Processing\",\"volume\":\"194 \",\"pages\":\"Article 109542\"},\"PeriodicalIF\":4.2000,\"publicationDate\":\"2025-04-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Materials Science in Semiconductor Processing\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S1369800125002793\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Materials Science in Semiconductor Processing","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1369800125002793","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
This study synthesized a novel Zn-doped FeOCl (Zn-FeOCl) photocatalyst using a one-step calcination method and utilized it for the photo-Fenton degradation of tetracycline (TC) under simulated sunlight. The structure, optical properties, and photocatalytic performance of Zn-FeOCl were systematically characterized and compared with those of undoped FeOCl. Among the variants, Zn-FeOCl-8 exhibited the highest catalytic efficiency, achieving a TC removal rate of 98.3 % within 60 min, with a degradation rate constant 6.4 times greater than that of pure FeOCl. Free radical trapping experiments and EPR results indicate that hydroxyl radicals (·OH) are the primary reactive species in the photo-Fenton process. Furthermore, density functional theory (DFT) calculations indicated that zinc doping reduced the band gap and improved charge transfer, significantly enhancing the photocatalytic activity of the catalyst. This study provides new insights into the modification of FeOCl and offers a possible approach for the efficient removal of antibiotic contaminants from water.
期刊介绍:
Materials Science in Semiconductor Processing provides a unique forum for the discussion of novel processing, applications and theoretical studies of functional materials and devices for (opto)electronics, sensors, detectors, biotechnology and green energy.
Each issue will aim to provide a snapshot of current insights, new achievements, breakthroughs and future trends in such diverse fields as microelectronics, energy conversion and storage, communications, biotechnology, (photo)catalysis, nano- and thin-film technology, hybrid and composite materials, chemical processing, vapor-phase deposition, device fabrication, and modelling, which are the backbone of advanced semiconductor processing and applications.
Coverage will include: advanced lithography for submicron devices; etching and related topics; ion implantation; damage evolution and related issues; plasma and thermal CVD; rapid thermal processing; advanced metallization and interconnect schemes; thin dielectric layers, oxidation; sol-gel processing; chemical bath and (electro)chemical deposition; compound semiconductor processing; new non-oxide materials and their applications; (macro)molecular and hybrid materials; molecular dynamics, ab-initio methods, Monte Carlo, etc.; new materials and processes for discrete and integrated circuits; magnetic materials and spintronics; heterostructures and quantum devices; engineering of the electrical and optical properties of semiconductors; crystal growth mechanisms; reliability, defect density, intrinsic impurities and defects.