Shu-Yuan Zhang , Ying-Hui Ni , Wei-Jie Deng , Ming-Jie Sun
{"title":"基于锐度统计的傅立叶显微成像自动对焦算法","authors":"Shu-Yuan Zhang , Ying-Hui Ni , Wei-Jie Deng , Ming-Jie Sun","doi":"10.1016/j.optlastec.2025.112855","DOIUrl":null,"url":null,"abstract":"<div><div>Fourier ptychographic microscopy is a computational imaging technique that achieves high-resolution imaging by combining phase retrieval algorithms with synthetic aperture methods. However, defocus errors due to the misalignment of the sample can significantly degrade the reconstruction quality, leading to increased background noise and blurred details. In this manuscript, we propose a novel sharpness-statistic based autofocus algorithm to address defocus errors in Fourier ptychographic microscopy. Unlike conventional methods that infer defocus errors indirectly, our method directly applies a sharpness detection strategy to the reconstruction results, enabling more accurate correction of defocus-induced blurring. We validate the effectiveness and robustness of the sharpness-statistic based autofocus algorithm through both simulations and optical experiments, demonstrating its superiority over existing methods such as the embedded optical pupil function recovery aberration correction algorithm and lateral shift correction method. Multiple sets of quantitative experiments show that the defocus distances estimated by the proposed method under different defocusing scenarios are at least 40% more accurate than the ones estimated by the commonly used method. Consequently, the contrast of the reconstructed images is more than twice that of the commonly used method. The image quality of biological specimen is also improved with sharper details. The results indicate that the sharpness-statistic autofocus algorithm can effectively correct defocus error and enhance the image quality.</div></div>","PeriodicalId":19511,"journal":{"name":"Optics and Laser Technology","volume":"188 ","pages":"Article 112855"},"PeriodicalIF":4.6000,"publicationDate":"2025-04-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Sharpness-statistic based autofocus algorithm for Fourier ptychographic microscopy\",\"authors\":\"Shu-Yuan Zhang , Ying-Hui Ni , Wei-Jie Deng , Ming-Jie Sun\",\"doi\":\"10.1016/j.optlastec.2025.112855\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Fourier ptychographic microscopy is a computational imaging technique that achieves high-resolution imaging by combining phase retrieval algorithms with synthetic aperture methods. However, defocus errors due to the misalignment of the sample can significantly degrade the reconstruction quality, leading to increased background noise and blurred details. In this manuscript, we propose a novel sharpness-statistic based autofocus algorithm to address defocus errors in Fourier ptychographic microscopy. Unlike conventional methods that infer defocus errors indirectly, our method directly applies a sharpness detection strategy to the reconstruction results, enabling more accurate correction of defocus-induced blurring. We validate the effectiveness and robustness of the sharpness-statistic based autofocus algorithm through both simulations and optical experiments, demonstrating its superiority over existing methods such as the embedded optical pupil function recovery aberration correction algorithm and lateral shift correction method. Multiple sets of quantitative experiments show that the defocus distances estimated by the proposed method under different defocusing scenarios are at least 40% more accurate than the ones estimated by the commonly used method. Consequently, the contrast of the reconstructed images is more than twice that of the commonly used method. The image quality of biological specimen is also improved with sharper details. The results indicate that the sharpness-statistic autofocus algorithm can effectively correct defocus error and enhance the image quality.</div></div>\",\"PeriodicalId\":19511,\"journal\":{\"name\":\"Optics and Laser Technology\",\"volume\":\"188 \",\"pages\":\"Article 112855\"},\"PeriodicalIF\":4.6000,\"publicationDate\":\"2025-04-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optics and Laser Technology\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0030399225004463\",\"RegionNum\":2,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"OPTICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optics and Laser Technology","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0030399225004463","RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"OPTICS","Score":null,"Total":0}
Sharpness-statistic based autofocus algorithm for Fourier ptychographic microscopy
Fourier ptychographic microscopy is a computational imaging technique that achieves high-resolution imaging by combining phase retrieval algorithms with synthetic aperture methods. However, defocus errors due to the misalignment of the sample can significantly degrade the reconstruction quality, leading to increased background noise and blurred details. In this manuscript, we propose a novel sharpness-statistic based autofocus algorithm to address defocus errors in Fourier ptychographic microscopy. Unlike conventional methods that infer defocus errors indirectly, our method directly applies a sharpness detection strategy to the reconstruction results, enabling more accurate correction of defocus-induced blurring. We validate the effectiveness and robustness of the sharpness-statistic based autofocus algorithm through both simulations and optical experiments, demonstrating its superiority over existing methods such as the embedded optical pupil function recovery aberration correction algorithm and lateral shift correction method. Multiple sets of quantitative experiments show that the defocus distances estimated by the proposed method under different defocusing scenarios are at least 40% more accurate than the ones estimated by the commonly used method. Consequently, the contrast of the reconstructed images is more than twice that of the commonly used method. The image quality of biological specimen is also improved with sharper details. The results indicate that the sharpness-statistic autofocus algorithm can effectively correct defocus error and enhance the image quality.
期刊介绍:
Optics & Laser Technology aims to provide a vehicle for the publication of a broad range of high quality research and review papers in those fields of scientific and engineering research appertaining to the development and application of the technology of optics and lasers. Papers describing original work in these areas are submitted to rigorous refereeing prior to acceptance for publication.
The scope of Optics & Laser Technology encompasses, but is not restricted to, the following areas:
•development in all types of lasers
•developments in optoelectronic devices and photonics
•developments in new photonics and optical concepts
•developments in conventional optics, optical instruments and components
•techniques of optical metrology, including interferometry and optical fibre sensors
•LIDAR and other non-contact optical measurement techniques, including optical methods in heat and fluid flow
•applications of lasers to materials processing, optical NDT display (including holography) and optical communication
•research and development in the field of laser safety including studies of hazards resulting from the applications of lasers (laser safety, hazards of laser fume)
•developments in optical computing and optical information processing
•developments in new optical materials
•developments in new optical characterization methods and techniques
•developments in quantum optics
•developments in light assisted micro and nanofabrication methods and techniques
•developments in nanophotonics and biophotonics
•developments in imaging processing and systems