基于硅纳米线阵列的肖特基势垒晶体管中载流子所经历的有效势垒高度的沟道长度依赖性

IF 2 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Dae-Young Jeon;So Jeong Park;Sebastian Pregl;Jens Trommer;André Heinzig;Thomas Mikolajick;Walter M. Weber
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引用次数: 0

摘要

肖特基势垒(SB)晶体管在满足功率、性能、面积和成本要求方面显示出巨大的潜力。在本研究中,研究了SB硅纳米线(NW)晶体管在通道长度方面的主要传输机制,以准确估计性能,并为实际应用提供关键见解。对SB Si-NW晶体管的温度相关漏极电流、跨导和活化能的评估表明,当初始SB高度相对较低时,SB主导的热电子效应与Si-NW通道限制的导通竞争。此外,Si-NW通道长度足以支配总电阻,克服了SB产生的电阻效应。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Channel Length Dependence of Effective Barrier Height Experienced by Charge Carriers in Schottky-Barrier Transistors Based on Si-Nanowire Arrays
Schottky-barrier (SB) transistors show great potential as advanced transistors for meeting power, performance, area, and cost requirements. In this study, the dominant transport mechanisms of SB Si-nanowire (NW) transistors were investigated with respect to channel length for accurate performance estimation and to provide key insights for practical applications. Evaluations of the temperature-dependent drain current, transconductance, and activation energy from SB Si-NW transistors revealed that the SB-dominant thermionic effect competes with Si-NW channel-limited conduction when the initial SB height is relatively low. Moreover, the Si-NW channel length was sufficiently long to dominate the total resistance, overcoming resistance effects arising from the SB.
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来源期刊
IEEE Journal of the Electron Devices Society
IEEE Journal of the Electron Devices Society Biochemistry, Genetics and Molecular Biology-Biotechnology
CiteScore
5.20
自引率
4.30%
发文量
124
审稿时长
9 weeks
期刊介绍: The IEEE Journal of the Electron Devices Society (J-EDS) is an open-access, fully electronic scientific journal publishing papers ranging from fundamental to applied research that are scientifically rigorous and relevant to electron devices. The J-EDS publishes original and significant contributions relating to the theory, modelling, design, performance, and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanodevices, optoelectronics, photovoltaics, power IC''s, and micro-sensors. Tutorial and review papers on these subjects are, also, published. And, occasionally special issues with a collection of papers on particular areas in more depth and breadth are, also, published. J-EDS publishes all papers that are judged to be technically valid and original.
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