{"title":"新颖的y函数方法参数估计由弱到强的反演运算","authors":"A. Tahiat , B. Cretu , A. Veloso , E. Simoen","doi":"10.1016/j.sse.2025.109071","DOIUrl":null,"url":null,"abstract":"<div><div>A new Y-function methodology approach for the inversion charge over the gate capacitance ratio estimation from weak to strong inversion operation has been developed. Based on the drain current expression in the linear operation regime and classical mobility law, it is demonstrated that the inversion charge over the gate capacitance ratio may be estimated from weak to strong inversion operation without any approximation by solving a second-degree equation. This latter equation depends notably on the Y-function and on three parameters which are needed to be extracted, two in strong inversion (the gain factor G<sub>M</sub> and the second order mobility attenuation factor θ<sub>2</sub>) and one in subthreshold zone (the subthreshold swing SS). This easy-to-use Y-function approach permits accurate and physical meaning electrical parameter extraction confirmed by the very good agreement between the experimental and the model of the drain current and of the transconductance behavior of advanced transistors from weak to strong inversion operation regime.</div></div>","PeriodicalId":21909,"journal":{"name":"Solid-state Electronics","volume":"225 ","pages":"Article 109071"},"PeriodicalIF":1.4000,"publicationDate":"2025-01-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Novel Y-function methodology parameter estimation from weak to strong inversion operation\",\"authors\":\"A. Tahiat , B. Cretu , A. Veloso , E. Simoen\",\"doi\":\"10.1016/j.sse.2025.109071\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>A new Y-function methodology approach for the inversion charge over the gate capacitance ratio estimation from weak to strong inversion operation has been developed. Based on the drain current expression in the linear operation regime and classical mobility law, it is demonstrated that the inversion charge over the gate capacitance ratio may be estimated from weak to strong inversion operation without any approximation by solving a second-degree equation. This latter equation depends notably on the Y-function and on three parameters which are needed to be extracted, two in strong inversion (the gain factor G<sub>M</sub> and the second order mobility attenuation factor θ<sub>2</sub>) and one in subthreshold zone (the subthreshold swing SS). This easy-to-use Y-function approach permits accurate and physical meaning electrical parameter extraction confirmed by the very good agreement between the experimental and the model of the drain current and of the transconductance behavior of advanced transistors from weak to strong inversion operation regime.</div></div>\",\"PeriodicalId\":21909,\"journal\":{\"name\":\"Solid-state Electronics\",\"volume\":\"225 \",\"pages\":\"Article 109071\"},\"PeriodicalIF\":1.4000,\"publicationDate\":\"2025-01-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Solid-state Electronics\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0038110125000164\",\"RegionNum\":4,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Solid-state Electronics","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0038110125000164","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Novel Y-function methodology parameter estimation from weak to strong inversion operation
A new Y-function methodology approach for the inversion charge over the gate capacitance ratio estimation from weak to strong inversion operation has been developed. Based on the drain current expression in the linear operation regime and classical mobility law, it is demonstrated that the inversion charge over the gate capacitance ratio may be estimated from weak to strong inversion operation without any approximation by solving a second-degree equation. This latter equation depends notably on the Y-function and on three parameters which are needed to be extracted, two in strong inversion (the gain factor GM and the second order mobility attenuation factor θ2) and one in subthreshold zone (the subthreshold swing SS). This easy-to-use Y-function approach permits accurate and physical meaning electrical parameter extraction confirmed by the very good agreement between the experimental and the model of the drain current and of the transconductance behavior of advanced transistors from weak to strong inversion operation regime.
期刊介绍:
It is the aim of this journal to bring together in one publication outstanding papers reporting new and original work in the following areas: (1) applications of solid-state physics and technology to electronics and optoelectronics, including theory and device design; (2) optical, electrical, morphological characterization techniques and parameter extraction of devices; (3) fabrication of semiconductor devices, and also device-related materials growth, measurement and evaluation; (4) the physics and modeling of submicron and nanoscale microelectronic and optoelectronic devices, including processing, measurement, and performance evaluation; (5) applications of numerical methods to the modeling and simulation of solid-state devices and processes; and (6) nanoscale electronic and optoelectronic devices, photovoltaics, sensors, and MEMS based on semiconductor and alternative electronic materials; (7) synthesis and electrooptical properties of materials for novel devices.