新颖的y函数方法参数估计由弱到强的反演运算

IF 1.4 4区 物理与天体物理 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
A. Tahiat , B. Cretu , A. Veloso , E. Simoen
{"title":"新颖的y函数方法参数估计由弱到强的反演运算","authors":"A. Tahiat ,&nbsp;B. Cretu ,&nbsp;A. Veloso ,&nbsp;E. Simoen","doi":"10.1016/j.sse.2025.109071","DOIUrl":null,"url":null,"abstract":"<div><div>A new Y-function methodology approach for the inversion charge over the gate capacitance ratio estimation from weak to strong inversion operation has been developed. Based on the drain current expression in the linear operation regime and classical mobility law, it is demonstrated that the inversion charge over the gate capacitance ratio may be estimated from weak to strong inversion operation without any approximation by solving a second-degree equation. This latter equation depends notably on the Y-function and on three parameters which are needed to be extracted, two in strong inversion (the gain factor G<sub>M</sub> and the second order mobility attenuation factor θ<sub>2</sub>) and one in subthreshold zone (the subthreshold swing SS). This easy-to-use Y-function approach permits accurate and physical meaning electrical parameter extraction confirmed by the very good agreement between the experimental and the model of the drain current and of the transconductance behavior of advanced transistors from weak to strong inversion operation regime.</div></div>","PeriodicalId":21909,"journal":{"name":"Solid-state Electronics","volume":"225 ","pages":"Article 109071"},"PeriodicalIF":1.4000,"publicationDate":"2025-01-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Novel Y-function methodology parameter estimation from weak to strong inversion operation\",\"authors\":\"A. Tahiat ,&nbsp;B. Cretu ,&nbsp;A. Veloso ,&nbsp;E. Simoen\",\"doi\":\"10.1016/j.sse.2025.109071\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>A new Y-function methodology approach for the inversion charge over the gate capacitance ratio estimation from weak to strong inversion operation has been developed. Based on the drain current expression in the linear operation regime and classical mobility law, it is demonstrated that the inversion charge over the gate capacitance ratio may be estimated from weak to strong inversion operation without any approximation by solving a second-degree equation. This latter equation depends notably on the Y-function and on three parameters which are needed to be extracted, two in strong inversion (the gain factor G<sub>M</sub> and the second order mobility attenuation factor θ<sub>2</sub>) and one in subthreshold zone (the subthreshold swing SS). This easy-to-use Y-function approach permits accurate and physical meaning electrical parameter extraction confirmed by the very good agreement between the experimental and the model of the drain current and of the transconductance behavior of advanced transistors from weak to strong inversion operation regime.</div></div>\",\"PeriodicalId\":21909,\"journal\":{\"name\":\"Solid-state Electronics\",\"volume\":\"225 \",\"pages\":\"Article 109071\"},\"PeriodicalIF\":1.4000,\"publicationDate\":\"2025-01-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Solid-state Electronics\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0038110125000164\",\"RegionNum\":4,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Solid-state Electronics","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0038110125000164","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

摘要

提出了一种新的y函数方法,用于从弱反转到强反转的栅极电容比估计。根据漏极电流在线性工作状态下的表达式和经典迁移率定律,通过求解二阶方程,证明了从弱反转到强反转时栅极电容比上的反转电荷无需任何近似即可估计。后一个方程主要取决于y函数和需要提取的三个参数,两个在强反演中(增益因子GM和二阶迁移率衰减因子θ2),一个在亚阈值区(亚阈值摆动SS)。这种易于使用的y函数方法可以精确地提取物理意义上的电参数,并通过实验和漏极电流模型以及先进晶体管从弱到强反转工作状态的跨导行为之间的非常好的一致性来证实。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Novel Y-function methodology parameter estimation from weak to strong inversion operation
A new Y-function methodology approach for the inversion charge over the gate capacitance ratio estimation from weak to strong inversion operation has been developed. Based on the drain current expression in the linear operation regime and classical mobility law, it is demonstrated that the inversion charge over the gate capacitance ratio may be estimated from weak to strong inversion operation without any approximation by solving a second-degree equation. This latter equation depends notably on the Y-function and on three parameters which are needed to be extracted, two in strong inversion (the gain factor GM and the second order mobility attenuation factor θ2) and one in subthreshold zone (the subthreshold swing SS). This easy-to-use Y-function approach permits accurate and physical meaning electrical parameter extraction confirmed by the very good agreement between the experimental and the model of the drain current and of the transconductance behavior of advanced transistors from weak to strong inversion operation regime.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Solid-state Electronics
Solid-state Electronics 物理-工程:电子与电气
CiteScore
3.00
自引率
5.90%
发文量
212
审稿时长
3 months
期刊介绍: It is the aim of this journal to bring together in one publication outstanding papers reporting new and original work in the following areas: (1) applications of solid-state physics and technology to electronics and optoelectronics, including theory and device design; (2) optical, electrical, morphological characterization techniques and parameter extraction of devices; (3) fabrication of semiconductor devices, and also device-related materials growth, measurement and evaluation; (4) the physics and modeling of submicron and nanoscale microelectronic and optoelectronic devices, including processing, measurement, and performance evaluation; (5) applications of numerical methods to the modeling and simulation of solid-state devices and processes; and (6) nanoscale electronic and optoelectronic devices, photovoltaics, sensors, and MEMS based on semiconductor and alternative electronic materials; (7) synthesis and electrooptical properties of materials for novel devices.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信