Ting He;Muyu Yi;Xinyue Niu;Jinmei Yao;Tao Xun;Langning Wang;Ting Shu
{"title":"基于载波寿命的SiC光导开关微波频率与输出功率的权衡","authors":"Ting He;Muyu Yi;Xinyue Niu;Jinmei Yao;Tao Xun;Langning Wang;Ting Shu","doi":"10.1109/TED.2024.3499936","DOIUrl":null,"url":null,"abstract":"The trade-off between microwave frequency and output power in VCSI 4H-silicon carbide (SiC) photoconductive semiconductor switch (PCSSs), based on carrier lifetime is investigated. PCSSs with two different vanadium doping concentrations are fabricated and tested across a frequency range of 0.5–2 GHz. The output power and modulation depth ratio trends with microwave frequency indicate a trade-off between microwave frequency and output power. The two devices exhibit output powers of approximately 40 W (@0.5 GHz) and 160 W (@0.5 GHz), respectively. Employing transient absorption (TA) techniques, the carrier lifetime of the two devices is determined to be 30 and 460 ps, revealing a relationship between longer carrier lifetime and increased output power. Nevertheless, the longer carrier lifetime also leads to a lower modulation depth ratio. Furthermore, when carrier lifetime ceases to be the primary constraining factor for the device’s frequency response, the upper cut-off frequency is constrained by the interstage capacitance.","PeriodicalId":13092,"journal":{"name":"IEEE Transactions on Electron Devices","volume":"72 1","pages":"169-174"},"PeriodicalIF":2.9000,"publicationDate":"2024-11-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The Trade-Off Between Microwave Frequency and Output Power in SiC Photoconductive Switches Based on Carrier Lifetime\",\"authors\":\"Ting He;Muyu Yi;Xinyue Niu;Jinmei Yao;Tao Xun;Langning Wang;Ting Shu\",\"doi\":\"10.1109/TED.2024.3499936\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The trade-off between microwave frequency and output power in VCSI 4H-silicon carbide (SiC) photoconductive semiconductor switch (PCSSs), based on carrier lifetime is investigated. PCSSs with two different vanadium doping concentrations are fabricated and tested across a frequency range of 0.5–2 GHz. The output power and modulation depth ratio trends with microwave frequency indicate a trade-off between microwave frequency and output power. The two devices exhibit output powers of approximately 40 W (@0.5 GHz) and 160 W (@0.5 GHz), respectively. Employing transient absorption (TA) techniques, the carrier lifetime of the two devices is determined to be 30 and 460 ps, revealing a relationship between longer carrier lifetime and increased output power. Nevertheless, the longer carrier lifetime also leads to a lower modulation depth ratio. Furthermore, when carrier lifetime ceases to be the primary constraining factor for the device’s frequency response, the upper cut-off frequency is constrained by the interstage capacitance.\",\"PeriodicalId\":13092,\"journal\":{\"name\":\"IEEE Transactions on Electron Devices\",\"volume\":\"72 1\",\"pages\":\"169-174\"},\"PeriodicalIF\":2.9000,\"publicationDate\":\"2024-11-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Electron Devices\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10766622/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electron Devices","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10766622/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
The Trade-Off Between Microwave Frequency and Output Power in SiC Photoconductive Switches Based on Carrier Lifetime
The trade-off between microwave frequency and output power in VCSI 4H-silicon carbide (SiC) photoconductive semiconductor switch (PCSSs), based on carrier lifetime is investigated. PCSSs with two different vanadium doping concentrations are fabricated and tested across a frequency range of 0.5–2 GHz. The output power and modulation depth ratio trends with microwave frequency indicate a trade-off between microwave frequency and output power. The two devices exhibit output powers of approximately 40 W (@0.5 GHz) and 160 W (@0.5 GHz), respectively. Employing transient absorption (TA) techniques, the carrier lifetime of the two devices is determined to be 30 and 460 ps, revealing a relationship between longer carrier lifetime and increased output power. Nevertheless, the longer carrier lifetime also leads to a lower modulation depth ratio. Furthermore, when carrier lifetime ceases to be the primary constraining factor for the device’s frequency response, the upper cut-off frequency is constrained by the interstage capacitance.
期刊介绍:
IEEE Transactions on Electron Devices publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors. Tutorial and review papers on these subjects are also published and occasional special issues appear to present a collection of papers which treat particular areas in more depth and breadth.