Guangxi Fan;Tianliang Ma;Xuguang Sun;Leilai Shao;Kain Lu Low
{"title":"基于图注意网络的统一TCAD建模,通过迁移学习实现快速设计技术协同优化","authors":"Guangxi Fan;Tianliang Ma;Xuguang Sun;Leilai Shao;Kain Lu Low","doi":"10.1109/TED.2024.3493854","DOIUrl":null,"url":null,"abstract":"An innovative framework that leverages artificial intelligence (AI) and graph representation for semiconductor device encoding in TCAD device simulation is proposed. A graph-based universal encoding scheme is presented that incorporates material-level and device-level embeddings, along with a novel spatial relationship embedding inspired by finite element meshing interpolation operations. This encoding approach seamlessly accommodates the unstructured mesh features of TCAD simulator, providing a standardized method for device representation, akin to modeling transistor as a graph, reminiscent of the unified representations commonly used in computer vision (CV) and natural language processing (NLP). The framework enables comprehensive data-driven modeling by employing a novel graph attention network with skip connections, referred to as RelGAT. This network is used to construct an end-to-end surrogate model, performing node-level potential emulation and graph-level current-voltage (I–V) prediction. Furthermore, this framework is effectively integrated into a design technology co-optimization (DTCO) flow for carbon nanotube (CNT)-based emerging technology through transfer learning, facilitating early-stage evaluations of new processes and reducing the computational cost. Comprehensive technical details based on the device simulator Sentaurus TCAD are presented, empowering researchers to adopt the proposed AI-driven electronic design automation (EDA) solution at the device level.","PeriodicalId":13092,"journal":{"name":"IEEE Transactions on Electron Devices","volume":"72 1","pages":"474-481"},"PeriodicalIF":2.9000,"publicationDate":"2024-11-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Graph Attention Network-Based Unified TCAD Modeling Enabling Fast Design Technology Co-Optimization Through Transfer Learning\",\"authors\":\"Guangxi Fan;Tianliang Ma;Xuguang Sun;Leilai Shao;Kain Lu Low\",\"doi\":\"10.1109/TED.2024.3493854\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An innovative framework that leverages artificial intelligence (AI) and graph representation for semiconductor device encoding in TCAD device simulation is proposed. A graph-based universal encoding scheme is presented that incorporates material-level and device-level embeddings, along with a novel spatial relationship embedding inspired by finite element meshing interpolation operations. This encoding approach seamlessly accommodates the unstructured mesh features of TCAD simulator, providing a standardized method for device representation, akin to modeling transistor as a graph, reminiscent of the unified representations commonly used in computer vision (CV) and natural language processing (NLP). The framework enables comprehensive data-driven modeling by employing a novel graph attention network with skip connections, referred to as RelGAT. This network is used to construct an end-to-end surrogate model, performing node-level potential emulation and graph-level current-voltage (I–V) prediction. Furthermore, this framework is effectively integrated into a design technology co-optimization (DTCO) flow for carbon nanotube (CNT)-based emerging technology through transfer learning, facilitating early-stage evaluations of new processes and reducing the computational cost. Comprehensive technical details based on the device simulator Sentaurus TCAD are presented, empowering researchers to adopt the proposed AI-driven electronic design automation (EDA) solution at the device level.\",\"PeriodicalId\":13092,\"journal\":{\"name\":\"IEEE Transactions on Electron Devices\",\"volume\":\"72 1\",\"pages\":\"474-481\"},\"PeriodicalIF\":2.9000,\"publicationDate\":\"2024-11-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Electron Devices\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10753273/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electron Devices","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10753273/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Graph Attention Network-Based Unified TCAD Modeling Enabling Fast Design Technology Co-Optimization Through Transfer Learning
An innovative framework that leverages artificial intelligence (AI) and graph representation for semiconductor device encoding in TCAD device simulation is proposed. A graph-based universal encoding scheme is presented that incorporates material-level and device-level embeddings, along with a novel spatial relationship embedding inspired by finite element meshing interpolation operations. This encoding approach seamlessly accommodates the unstructured mesh features of TCAD simulator, providing a standardized method for device representation, akin to modeling transistor as a graph, reminiscent of the unified representations commonly used in computer vision (CV) and natural language processing (NLP). The framework enables comprehensive data-driven modeling by employing a novel graph attention network with skip connections, referred to as RelGAT. This network is used to construct an end-to-end surrogate model, performing node-level potential emulation and graph-level current-voltage (I–V) prediction. Furthermore, this framework is effectively integrated into a design technology co-optimization (DTCO) flow for carbon nanotube (CNT)-based emerging technology through transfer learning, facilitating early-stage evaluations of new processes and reducing the computational cost. Comprehensive technical details based on the device simulator Sentaurus TCAD are presented, empowering researchers to adopt the proposed AI-driven electronic design automation (EDA) solution at the device level.
期刊介绍:
IEEE Transactions on Electron Devices publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors. Tutorial and review papers on these subjects are also published and occasional special issues appear to present a collection of papers which treat particular areas in more depth and breadth.