{"title":"基于 AlScN 的铁电隧道结的计算研究","authors":"Ning Yang, Guoting Cheng, Jing Guo","doi":"10.1016/j.sse.2024.109026","DOIUrl":null,"url":null,"abstract":"<div><div>Ferroelectric (FE) AlScN materials have been experimentally explored for memory and neuromorphic computing device applications. Here a computational study is performed to simulate the device characteristics and assess the performance potential of a ferroelectric tunnel junction (FTJ) based on AlScN. We parameterize an efficient k<span><math><mi>⋅</mi></math></span>p Hamiltonian from the complex band structure of AlScN from <em>ab initio</em> density-functional theory calculations to enable efficient quantum transport simulations of the FTJ device. Using a metal–FE–graphene structure enhances the barrier height modulation and the tunneling electroresistance (TER) ratio, compared to a metal–FE–semiconductor FTJ device structure. The barrier height modulation between ON and OFF states can reach <span><math><mo>∼</mo></math></span> 0.7eV with a FE polarization of 25 <span><math><mi>μ</mi></math></span>C/cm<sup>2</sup>. Reducing the AlScN tunnel layer thickness is important for increasing the device ON current and reducing the read latency. The results indicate the importance of contact designs and FE layer thickness in the design of AlScN-based FTJ devices, and highlight the potential of AlScN FTJ for future memory device technology applications.</div></div>","PeriodicalId":21909,"journal":{"name":"Solid-state Electronics","volume":"223 ","pages":"Article 109026"},"PeriodicalIF":1.4000,"publicationDate":"2024-11-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A computational study of AlScN-based ferroelectric tunnel junction\",\"authors\":\"Ning Yang, Guoting Cheng, Jing Guo\",\"doi\":\"10.1016/j.sse.2024.109026\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Ferroelectric (FE) AlScN materials have been experimentally explored for memory and neuromorphic computing device applications. Here a computational study is performed to simulate the device characteristics and assess the performance potential of a ferroelectric tunnel junction (FTJ) based on AlScN. We parameterize an efficient k<span><math><mi>⋅</mi></math></span>p Hamiltonian from the complex band structure of AlScN from <em>ab initio</em> density-functional theory calculations to enable efficient quantum transport simulations of the FTJ device. Using a metal–FE–graphene structure enhances the barrier height modulation and the tunneling electroresistance (TER) ratio, compared to a metal–FE–semiconductor FTJ device structure. The barrier height modulation between ON and OFF states can reach <span><math><mo>∼</mo></math></span> 0.7eV with a FE polarization of 25 <span><math><mi>μ</mi></math></span>C/cm<sup>2</sup>. Reducing the AlScN tunnel layer thickness is important for increasing the device ON current and reducing the read latency. The results indicate the importance of contact designs and FE layer thickness in the design of AlScN-based FTJ devices, and highlight the potential of AlScN FTJ for future memory device technology applications.</div></div>\",\"PeriodicalId\":21909,\"journal\":{\"name\":\"Solid-state Electronics\",\"volume\":\"223 \",\"pages\":\"Article 109026\"},\"PeriodicalIF\":1.4000,\"publicationDate\":\"2024-11-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Solid-state Electronics\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0038110124001758\",\"RegionNum\":4,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Solid-state Electronics","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0038110124001758","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
A computational study of AlScN-based ferroelectric tunnel junction
Ferroelectric (FE) AlScN materials have been experimentally explored for memory and neuromorphic computing device applications. Here a computational study is performed to simulate the device characteristics and assess the performance potential of a ferroelectric tunnel junction (FTJ) based on AlScN. We parameterize an efficient kp Hamiltonian from the complex band structure of AlScN from ab initio density-functional theory calculations to enable efficient quantum transport simulations of the FTJ device. Using a metal–FE–graphene structure enhances the barrier height modulation and the tunneling electroresistance (TER) ratio, compared to a metal–FE–semiconductor FTJ device structure. The barrier height modulation between ON and OFF states can reach 0.7eV with a FE polarization of 25 C/cm2. Reducing the AlScN tunnel layer thickness is important for increasing the device ON current and reducing the read latency. The results indicate the importance of contact designs and FE layer thickness in the design of AlScN-based FTJ devices, and highlight the potential of AlScN FTJ for future memory device technology applications.
期刊介绍:
It is the aim of this journal to bring together in one publication outstanding papers reporting new and original work in the following areas: (1) applications of solid-state physics and technology to electronics and optoelectronics, including theory and device design; (2) optical, electrical, morphological characterization techniques and parameter extraction of devices; (3) fabrication of semiconductor devices, and also device-related materials growth, measurement and evaluation; (4) the physics and modeling of submicron and nanoscale microelectronic and optoelectronic devices, including processing, measurement, and performance evaluation; (5) applications of numerical methods to the modeling and simulation of solid-state devices and processes; and (6) nanoscale electronic and optoelectronic devices, photovoltaics, sensors, and MEMS based on semiconductor and alternative electronic materials; (7) synthesis and electrooptical properties of materials for novel devices.