利用调制光热辐射测量法确定平面金属夹杂物的深度和厚度

IF 5.2 2区 工程技术 Q1 ENGINEERING, MULTIDISCIPLINARY
Agustín Salazar , Jorge Gil , Jon Pérez-Arbulu , Arantza Mendioroz
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引用次数: 0

摘要

光热辐射测量法(PTR)的原理是对样品表面进行光学激发,并通过红外探测器记录由此产生的温升。它已被广泛用于检测和测量平行于样品表面的平面埋藏缺陷的深度。大多数研究都是针对空气填充的水平裂缝分层。然而,处理相反结构(即隔热样品内部的扁平金属夹层)的工作却很少。在这项工作中,我们展示了 PTR 定量评估嵌入绝缘体的扁平水平金属夹杂物深度和厚度的能力。该方法包括将计算出的随频率变化的表面温度与实验振幅和相位频谱进行拟合。我们检查了这两个几何特性是否相关,前提是已知夹杂物的热特性。在带有校准金属夹杂物的聚合物样品上进行的实验证实了该方法的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Sizing the depth and thickness of flat metallic inclusions using modulated photothermal radiometry
Photothermal radiometry (PTR) is based on exciting the sample surface optically and recording the resulting temperature rise by means of an infrared detector. It has been extensively used to detect and size the depth of flat buried defects parallel to the sample surface. Most of the works have dealt with delaminations, horizontal cracks filled by air. However, works dealing with the opposite configuration, i.e. a flat metallic inclusion inside a thermal insulating sample, are scarce. In this work we show the ability of PTR to evaluate quantitatively the depth and thickness of flat horizontal metallic inclusions embedded in insulators. The methodology involves fitting the calculated frequency dependent surface temperature to experimental amplitude and phase spectra. We have checked that both geometrical properties are not correlated, provided the thermal properties of the inclusion are known. Experiments on polymeric samples with calibrated metallic inclusions confirm the validity of the method.
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来源期刊
Measurement
Measurement 工程技术-工程:综合
CiteScore
10.20
自引率
12.50%
发文量
1589
审稿时长
12.1 months
期刊介绍: Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.
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